BibTeX records: Sidi Ahmed Benhassain

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@inproceedings{DBLP:conf/iolts/MhiraHBCNJPB17,
  author       = {Souhir Mhira and
                  Vincent Huard and
                  Ahmed Benhassain and
                  Florian Cacho and
                  Sylvie Naudet and
                  Abhishek Jain and
                  C. R. Parthasarathy and
                  Alain Bravaix},
  title        = {Dynamic aging compensation and Safety measures in Automotive environment},
  booktitle    = {23rd {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2017, Thessaloniki, Greece, July 3-5, 2017},
  pages        = {106--112},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/IOLTS.2017.8046204},
  doi          = {10.1109/IOLTS.2017.8046204},
  timestamp    = {Fri, 06 Oct 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/MhiraHBCNJPB17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/iolts/CachoBSMHA17,
  author       = {Florian Cacho and
                  Ahmed Benhassain and
                  Riddhi Jitendrakumar Shah and
                  Souhir Mhira and
                  Vincent Huard and
                  Lorena Anghel},
  title        = {Investigation of critical path selection for in-situ monitors insertion},
  booktitle    = {23rd {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2017, Thessaloniki, Greece, July 3-5, 2017},
  pages        = {247--252},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/IOLTS.2017.8046229},
  doi          = {10.1109/IOLTS.2017.8046229},
  timestamp    = {Tue, 12 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/CachoBSMHA17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/MhiraHBCMNJPB17,
  author       = {Souhir Mhira and
                  Vincent Huard and
                  Ahmed Benhassain and
                  Florian Cacho and
                  David Meyer and
                  Sylvie Naudet and
                  Abhishek Jain and
                  C. R. Parthasarathy and
                  Alain Bravaix},
  title        = {Cognitive approach to support dynamic aging compensation},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
                  USA, October 31 - Nov. 2, 2017},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/TEST.2017.8242042},
  doi          = {10.1109/TEST.2017.8242042},
  timestamp    = {Fri, 06 Oct 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/MhiraHBCMNJPB17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/BenhassainCHA16,
  author       = {Ahmed Benhassain and
                  Florian Cacho and
                  Vincent Huard and
                  Lorena Anghel},
  editor       = {Adrian Evans and
                  Stefano Di Carlo and
                  Praveen Raghavan and
                  Dimitris Gizopoulos},
  title        = {Early failure prediction by using in-situ monitors: Implementation
                  and application results},
  booktitle    = {Proceedings of the Workshop on Early Reliability Modeling for Aging
                  and Variability in Silicon Systems, {ERMAVSS} 2016, co-located with
                  {IEEE/ACM} Design, Automation and Test in Europe Conference {(DATE}
                  2016), Dresden, Germany, March 18, 2016},
  series       = {{CEUR} Workshop Proceedings},
  volume       = {1566},
  pages        = {21--24},
  publisher    = {CEUR-WS.org},
  year         = {2016},
  url          = {https://ceur-ws.org/Vol-1566/Paper6.pdf},
  timestamp    = {Fri, 10 Mar 2023 16:22:47 +0100},
  biburl       = {https://dblp.org/rec/conf/date/BenhassainCHA16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/SivadasanCBHA16a,
  author       = {Ajith Sivadasan and
                  Florian Cacho and
                  Sidi Ahmed Benhassain and
                  Vincent Huard and
                  Lorena Anghel},
  editor       = {Adrian Evans and
                  Stefano Di Carlo and
                  Praveen Raghavan and
                  Dimitris Gizopoulos},
  title        = {Workload Impact on {BTI} {HCI} Induced Aging of Digital Circuits:
                  {A} System level Analysis},
  booktitle    = {Proceedings of the Workshop on Early Reliability Modeling for Aging
                  and Variability in Silicon Systems, {ERMAVSS} 2016, co-located with
                  {IEEE/ACM} Design, Automation and Test in Europe Conference {(DATE}
                  2016), Dresden, Germany, March 18, 2016},
  series       = {{CEUR} Workshop Proceedings},
  volume       = {1566},
  pages        = {38--40},
  publisher    = {CEUR-WS.org},
  year         = {2016},
  url          = {https://ceur-ws.org/Vol-1566/Paper10.pdf},
  timestamp    = {Fri, 10 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/date/SivadasanCBHA16a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/SivadasanCBHA16,
  author       = {Ajith Sivadasan and
                  Florian Cacho and
                  Sidi Ahmed Benhassain and
                  Vincent Huard and
                  Lorena Anghel},
  editor       = {Luca Fanucci and
                  J{\"{u}}rgen Teich},
  title        = {Study of workload impact on {BTI} {HCI} induced aging of digital circuits},
  booktitle    = {2016 Design, Automation {\&} Test in Europe Conference {\&}
                  Exhibition, {DATE} 2016, Dresden, Germany, March 14-18, 2016},
  pages        = {1020--1021},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://ieeexplore.ieee.org/document/7459456/},
  timestamp    = {Mon, 09 Aug 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/date/SivadasanCBHA16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/iolts/CachoBMSHCKJPA16,
  author       = {Florian Cacho and
                  Ahmed Benhassain and
                  Souhir Mhira and
                  Ajith Sivadasan and
                  Vincent Huard and
                  P. Cathelin and
                  Vincent Knopik and
                  Abhishek Jain and
                  C. R. Parthasarathy and
                  Lorena Anghel},
  title        = {Activity profiling: Review of different solutions to develop reliable
                  and performant design},
  booktitle    = {22nd {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2016, Sant Feliu de Guixols, Spain, July 4-6,
                  2016},
  pages        = {47--50},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/IOLTS.2016.7604670},
  doi          = {10.1109/IOLTS.2016.7604670},
  timestamp    = {Fri, 06 Oct 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/CachoBMSHCKJPA16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ivsw/BenhassainMCHA16,
  author       = {Ahmed Benhassain and
                  Souhir Mhira and
                  Florian Cacho and
                  Vincent Huard and
                  Lorena Anghel},
  title        = {In-situ slack monitors: taking up the challenge of on-die monitoring
                  of variability and reliability},
  booktitle    = {1st {IEEE} International Verification and Security Workshop, {IVSW}
                  2016, Sant Feliu de Guixols, Spain, July 4-6, 2016},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/IVSW.2016.7566606},
  doi          = {10.1109/IVSW.2016.7566606},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/ivsw/BenhassainMCHA16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/AnghelBSCH16,
  author       = {Lorena Anghel and
                  Ahmed Benhassain and
                  Ajith Sivadasan and
                  Florian Cacho and
                  Vincent Huard},
  title        = {Early system failure prediction by using aging in situ monitors: Methodology
                  of implementation and application results},
  booktitle    = {34th {IEEE} {VLSI} Test Symposium, {VTS} 2016, Las Vegas, NV, USA,
                  April 25-27, 2016},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2016},
  url          = {https://doi.org/10.1109/VTS.2016.7477316},
  doi          = {10.1109/VTS.2016.7477316},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/AnghelBSCH16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/cicc/BenhassainCHSAP15,
  author       = {Ahmed Benhassain and
                  Florian Cacho and
                  Vincent Huard and
                  M. Saliva and
                  Lorena Anghel and
                  C. R. Parthasarathy and
                  Abhishek Jain and
                  Fabien Giner},
  title        = {Timing in-situ monitors: Implementation strategy and applications
                  results},
  booktitle    = {2015 {IEEE} Custom Integrated Circuits Conference, {CICC} 2015, San
                  Jose, CA, USA, September 28-30, 2015},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/CICC.2015.7338418},
  doi          = {10.1109/CICC.2015.7338418},
  timestamp    = {Fri, 06 Oct 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/cicc/BenhassainCHSAP15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/SalivaCHFABBA15,
  author       = {M. Saliva and
                  Florian Cacho and
                  Vincent Huard and
                  X. Federspiel and
                  D. Angot and
                  Ahmed Benhassain and
                  Alain Bravaix and
                  Lorena Anghel},
  editor       = {Wolfgang Nebel and
                  David Atienza},
  title        = {Digital circuits reliability with in-situ monitors in 28nm fully depleted
                  {SOI}},
  booktitle    = {Proceedings of the 2015 Design, Automation {\&} Test in Europe
                  Conference {\&} Exhibition, {DATE} 2015, Grenoble, France, March
                  9-13, 2015},
  pages        = {441--446},
  publisher    = {{ACM}},
  year         = {2015},
  url          = {http://dl.acm.org/citation.cfm?id=2755854},
  timestamp    = {Mon, 09 Aug 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/date/SalivaCHFABBA15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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