Using digital imagers to characterize the dependence of energy and area distributions of SEUs on elevation - Glenn H. Chapman; Rohan Thomas; Klinsmann J. Coelho Silva Meneses; Ruoyi Zhao; Israel Koren; Zahava Koren (IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, 2020)

Detecting SEUs in Noisy Digital Imagers with small pixels - Glenn H. Chapman; Rohan Thomas; Klinsmann J. Coelho Silva Meneses; Bifei Huang; Hao Yang; Israel Koren; Zahava Koren (2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, 2019)

Image degradation from hot pixel defects with pixel size shrinkage - Glenn H. Chapman; Rohan Thomas; Klinsmann J. Coelho Silva Meneses; Israel Koren; Zahava Koren (Image Sensors and Imaging Systems 2019, IMSE 2019, Burlingame, CA, USA, January 13-17, 2019, 2019)

Analysis of Single Event Upsets Based on Digital Cameras with Very Small Pixels - Glenn H. Chapman; Rohan Thomas; Klinsmann J. Coelho Silva Meneses; Israel Koren; Zahava Koren (2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, 2018)

Exploring Hot Pixel Characteristics for 7 to 1.3 micron Pixels - Glenn H. Chapman; Rohan Thomas; Klinsmann J. Coelho Silva Meneses; Parham Purbakht; Israel Koren; Zahava Koren (Image Sensors and Imaging Systems 2018, IMSE 2018, Burlingame, CA, USA, January 28 - February 1, 2018, 2018)

Experimental study and analysis of soft and permanent errors in digital cameras - Glenn H. Chapman; Rahul Thomas; Rohan Thomas; Israel Koren; Zahava Koren (2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016, 2016)

Increases in Hot Pixel Development Rates for Small Digital Pixel Sizes - Glenn H. Chapman; Rahul Thomas; Rohan Thomas; Klinsmann J. Coelho Silva Meneses; Tommy Q. Yang; Israel Koren; Zahava Koren (Image Sensors and Imaging Systems 2016, IMSE 2016, San Francisco, CA, USA, February 14-18, 2016, 2016)

Single Event Upsets and Hot Pixels in digital imagers - Glenn H. Chapman; Rahul Thomas; Rohan Thomas; Klinsmann J. Coelho Silva Meneses; Tommy Q. Yang; Israel Koren; Zahava Koren (2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015, Amherst, MA, USA, October 12-14, 2015, 2015)