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ORCIDJoão Paulo Teixeira 0001
João Paulo Cacho Teixeira
Person information
- affiliation: INESC-ID, Lisbon, Portugal
Other persons with the same name
- João Paulo Teixeira 0002
![[0000-0002-6679-5702]](https://dblp.org/img/orcid-mark.12x12.png "0000-0002-6679-5702")
(aka: João Paulo Ramos Teixeira) — Polytechnic Institute of Bragança, Portugal
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2020 – today
- 2020
[p1]Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Internet of Things and Artificial Intelligence - A Wining Partnership? Convergence of Artificial Intelligence and the Internet of Things 2020: 369-390
2010 – 2019
- 2018
- [c82]Jorge Semião, Ruben Cabral, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Performance Sensor for Reliable Operation. HCI (8) 2018: 347-365 - 2015
- [j24]Carlos Leong, Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Fault-Tolerance in Field Programmable Gate Array with Dynamic Voltage and Frequency Scaling. J. Low Power Electron. 11(4): 517-527 (2015) - [c81]Carlos Leong, Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Fault-tolerance in FPGA focusing power reduction or performance enhancement. LATS 2015: 1-6 - 2014
- [c80]Jorge Semião, David Saraiva, Carlos Leong, André Romão, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Performance sensor for tolerance and predictive detection of delay-faults. DFT 2014: 110-115 - 2013
- [j23]Julio César Vázquez, Víctor H. Champac, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira:
Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion. J. Electron. Test. 29(3): 289-299 (2013) - [c79]Carlos Leong, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira, María Dolores Valdés, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas:
Aging monitoring with local sensors in FPGA-based designs. FPL 2013: 1-4 - 2012
- [j22]Jackson Pachito, Celestino V. Martins, Bruno Jacinto, Jorge Semião, Julio César Vázquez, Víctor H. Champac, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Aging-Aware Power or Frequency Tuning With Predictive Fault Detection. IEEE Des. Test Comput. 29(5): 27-36 (2012) - [j21]Judit Freijedo, Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira:
Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits. J. Electron. Test. 28(4): 421-434 (2012) - [c78]Jackson Pachito, Celestino V. Martins, Jorge Semião, Marcelino Bicho Dos Santos, Isabel C. Teixeira, João Paulo Teixeira:
The influence of clock-gating on NBTI-induced delay degradation. IOLTS 2012: 61-66 - 2011
- [j20]Judit Freijedo, María Dolores Valdés, Lucía Costas, María José Moure, Juan J. Rodríguez-Andina, Jorge Semião, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira:
Lower VDD Operation of FPGA-Based Digital Circuits Through Delay Modeling and Time Borrowing. J. Low Power Electron. 7(2): 185-198 (2011) - [j19]R. S. Oliveira, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira:
On-Line BIST for Performance Failure Prediction Under NBTI-Induced Aging in Safety-Critical Applications. J. Low Power Electron. 7(4): 562-572 (2011) - [c77]Vasco Bexiga, Carlos Leong, Jorge Semião, Isabel C. Teixeira, João Paulo Teixeira, María Dolores Valdés, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas:
Performance Failure Prediction Using Built-In Delay Sensors in FPGAs. FPL 2011: 301-304 - [c76]Judit Freijedo, Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira:
Modeling the effect of process variations on the timing response of nanometer digital circuits. LATW 2011: 1-5 - [c75]R. S. Oliveira, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira:
On-line BIST for performance failure prediction under aging effects in automotive safety-critical applications. LATW 2011: 1-6 - [c74]María Dolores Valdés, Judit Freijedo, María José Moure, Juan J. Rodríguez-Andina, Jorge Semião, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira:
Programmable sensor for on-line checking of signal integrity in FPGA-based systems subject to aging effects. LATW 2011: 1-7 - [c73]Celestino V. Martins, Jorge Semião, Julio César Vázquez, Víctor H. Champac, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors. VTS 2011: 203-208 - 2010
- [j18]Judit Freijedo, Lucía Costas, Jorge Semião, Juan J. Rodríguez-Andina, María José Moure, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira:
Impact of Power Supply Voltage Variations on FPGA-Based Digital Systems Performance. J. Low Power Electron. 6(2): 339-349 (2010) - [c72]Julio César Vázquez, Víctor H. Champac, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira:
Programmable aging sensor for automotive safety-critical applications. DATE 2010: 618-621 - [c71]Carlos Leong, Pedro Machado, Vasco Bexiga, João Paulo Teixeira, Isabel C. Teixeira, José C. Silva, Pedro Lousã, João Varela:
Built-in Clock Domain Crossing (CDC) test and diagnosis in GALS systems. DDECS 2010: 72-77 - [c70]Julio César Vázquez, Víctor H. Champac, Adriel Ziesemer, Ricardo Reis, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira:
Predictive error detection by on-line aging monitoring. IOLTS 2010: 9-14 - [c69]Raul Chipana, Letícia Maria Veiras Bolzani, Fabian Vargas, Jorge Semião, Juan J. Rodríguez-Andina, Isabel C. Teixeira, João Paulo Teixeira:
Investigating the Use of BICS to detect resistive-open defects in SRAMs. IOLTS 2010: 200-201 - [c68]Carlos Leong, João Paulo Teixeira, Isabel C. Teixeira, Ricardo Bugalho, Manuel Ferreira, Pedro Miguel Rodrigues, José C. Silva, Pedro Lousã, João Varela:
Automatic Configuration of a Medical Imaging System to Unknown Delays in Synchronous Input Data Channels. ISCAS 2010: 1185-1188 - [c67]Julio César Vázquez, Víctor H. Champac, Adriel Ziesemer, Ricardo Reis, Isabel Maria Cacho Teixeira, Marcelino B. Santos, João Paulo Teixeira:
Low-sensitivity to process variations aging sensor for automotive safety-critical applications. VTS 2010: 238-243
2000 – 2009
- 2009
- [c66]Carlos Leong, Pedro Machado, Vasco Bexiga, João Paulo Teixeira, Isabel C. Teixeira, Joel Rego, Pedro Neves, Fernando Piedade, Pedro Lousã, Pedro Miguel Rodrigues, Andreia Trindade, Ricardo Bugalho, João F. Pinheiro, Manuel Ferreira, João Varela:
Data Acquisition Electronics for PET Mammography Imaging. BIODEVICES 2009: 192-197 - [c65]Edgar F. M. Albuquerque, Vasco Bexiga, Ricardo Bugalho, Bruno Carriço, Cláudia S. Ferreira, Miguel Ferreira, Joaquim Godinho, Fernando M. Gonçalves, Carlos Leong, Pedro Lousã, Pedro Machado, Rui Moura, Pedro Neves, Catarina Ortigão, Fernando Piedade, João F. Pinheiro, P. Relvas, Angelo Rivetti, Pedro Miguel Rodrigues, José C. Silva, Manuel M. Silva, Isabel C. Teixeira, João Paulo Teixeira, Andreia Trindade, João Varela:
On-Detector Electronics of the Clear PEM Scanner. BIODEVICES 2009: 355-358 - [c64]Julio César Vázquez, Víctor H. Champac, Adriel Ziesemer, Ricardo Reis, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira:
Built-in aging monitoring for safety-critical applications. IOLTS 2009: 9-14 - [c63]José F. da Rocha, Nuno Dias, Angelo Monteiro, Alexandre Neves, Gabriel Santos, Marcelino B. Santos, João Paulo Teixeira:
Controllability and observability in mixed signal cores. IOLTS 2009: 198-200 - [c62]Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Delay-fault tolerance to power supply Voltage disturbances analysis in nanometer technologies. IOLTS 2009: 223-228 - [c61]Jorge Semião, Judit Freijedo, Marlon Moraes, M. Mallmann, Carlos Lemos Antunes, Juliano Benfica, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Juan J. Rodríguez-Andina, João Paulo Teixeira, Daniel Lupi, Edmundo Gatti, Luis Garcia, Fernando Hernandez:
Measuring clock-signal modulation efficiency for Systems-on-Chip in electromagnetic interference environment. LATW 2009: 1-6 - 2008
- [j17]Jorge Semião, Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Leonardo Bisch Piccoli, Fabian Vargas, Marcelino Bicho Dos Santos, Isabel Maria Cacho Teixeira, João Paulo Teixeira:
Signal Integrity Enhancement in Digital Circuits. IEEE Des. Test Comput. 25(5): 452-461 (2008) - [j16]Alex Bystrov, João Paulo Teixeira:
Selected Peer-Reviewed Articles from the LPonTR 2008 Workshop. J. Low Power Electron. 4(3): 372-373 (2008) - [j15]Judit Freijedo, Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira:
Delay Modeling for Power Noise and Temperature-Aware Design and Test of Digital Systems. J. Low Power Electron. 4(3): 385-391 (2008) - [j14]Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Time Management for Low-Power Design of Digital Systems. J. Low Power Electron. 4(3): 410-419 (2008) - [c60]Jorge Semião, João Varela, Judit Freijedo, Juan J. Rodríguez-Andina, Carlos Leong, João Paulo Teixeira, Isabel C. Teixeira:
Robust solution for synchronous communication among multi clock domains. APCCAS 2008: 1107-1110 - [c59]Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits. DDECS 2008: 34-37 - [c58]Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Exploiting Parametric Power Supply and/or Temperature Variations to Improve Fault Tolerance in Digital Circuits. IOLTS 2008: 227-232 - 2007
- [j13]Marcelino B. Santos, João Paulo Teixeira:
Functional-oriented mask-based built-in self-test. IET Comput. Digit. Tech. 1(5): 491-498 (2007) - [c57]Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Improving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits. DDECS 2007: 295-300 - [c56]Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino Bicho Dos Santos, Isabel C. Teixeira, João Paulo Teixeira:
Improving the Tolerance of Pipeline Based Circuits to Power Supply or Temperature Variations. DFT 2007: 303-311 - [c55]Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
On-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous Circuits. IOLTS 2007: 167-172 - [c54]Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Enhancing the Tolerance to Power-Supply Instability in Digital Circuits. ISVLSI 2007: 207-212 - 2006
- [c53]José M. Fernandes, Marcelino B. Santos, Arlindo L. Oliveira, João Paulo Teixeira:
Probabilistic Testability Analysis and DFT Methods at RTL. DDECS 2006: 216-217 - [c52]F. Guerreiro, Jorge Semião, A. Pierce, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Functional-Oriented BIST of Sequential Circuits Aiming at Dynamic Faults Coverage. DDECS 2006: 279-284 - [c51]José M. Fernandes, Marcelino B. Santos, Arlindo L. Oliveira, João Paulo Cacho Teixeira:
DFT and Probabilistic Testability Analysis at RTL. HLDVT 2006: 41-47 - [c50]Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Jorge Semião, Isabel C. Teixeira, João Paulo Teixeira:
Dynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes. IOLTS 2006: 257-262 - [c49]Abilio Parreira, Marcelino B. Santos, João Paulo Teixeira:
BIST Architectures and Fault Emulation. LATW 2006: 55-60 - [c48]Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira:
Using Multiple Clock Schemes and Multi-Temperature Test for Dynamic Fault Detection in Digital Systems. LATW 2006: 103-107 - 2005
- [j12]D. Barros Júnior, Marcial Jesús Rodríguez-Irago, Marcelino B. Santos, Isabel C. Teixeira, Fabian Vargas, João Paulo Teixeira:
Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip. J. Electron. Test. 21(4): 349-363 (2005) - [c47]Carlos Leong, P. Bento, Pedro Miguel Rodrigues, Andreia Trindade, José C. Silva, Pedro Lousã, Joel Rego, J. Nobre, João Varela, João Paulo Teixeira, Isabel C. Teixeira:
Design and Test Methodology for a Reconfigurable PEM Data Acquisition Electronics System. FPL 2005: 523-526 - [c46]Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Dynamic Fault Test and Diagnosis in Digital Systems Using Multiple Clock Schemes and Multi-VDD Test. IOLTS 2005: 281-286 - 2004
- [j11]Abilio Parreira, João Paulo Teixeira, Marcelino B. Santos:
Built-In Self-Test Quality Assessment Using Hardware Fault Emulation In FPGAs. Comput. Artif. Intell. 23(5): 537-556 (2004) - [j10]Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Luz Balado, Joan Figueras:
On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level. J. Electron. Test. 20(4): 345-355 (2004) - [c45]José M. Fernandes, Marcelino B. Santos, Arlindo L. Oliveira, João Paulo Teixeira:
A Probabilistic Method for the Computation of Testability of RTL Constructs. DATE 2004: 176-181 - [c44]Abilio Parreira, João Paulo Teixeira, Marcelino B. Santos:
FPGAs BIST Evaluation. FPL 2004: 333-343 - [c43]Daniel Barros Jr., Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Modeling and Simulation of Time Domain Faults in Digital Systems. IOLTS 2004: 5-10 - 2003
- [c42]Marcelino B. Santos, José M. Fernandes, Isabel C. Teixeira, João Paulo Teixeira:
RTL Test Pattern Generation for High Quality Loosely Deterministic BIST. DATE 2003: 10994-10999 - [c41]Rui Ribeiro, Octávio Páscoa Dias, João Paulo Teixeira, Isabel C. Teixeira:
Hardware/software solution for the automation and real-time control of a wine bottling production line. ETFA (1) 2003: 110-115 - [c40]Abilio Parreira, João Paulo Teixeira, A. Pantelimon, Marcelino B. Santos, José T. de Sousa:
Fault Simulation Using Partially Reconfigurable Hardware. FPL 2003: 839-848 - [c39]Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Property Coverage for Quality Assessment of Fault Tolerant or Fail Safe Systems. IOLTS 2003: 164-165 - 2002
- [j9]Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira:
RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage. J. Electron. Test. 18(2): 179-187 (2002) - [j8]Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Design and Test of a Certifiable ASIC for a Safety-Critical Gas Burner Control System. J. Electron. Test. 18(3): 285-294 (2002) - [c38]Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Self-Checking and Fault Tolerance Quality Assessment Using Fault Sampling. DFT 2002: 216-224 - [c37]Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Rosa Rodríguez-Montañés, Joan Figueras:
RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST. ITC 2002: 814-823 - [c36]Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Luz Balado, Joan Figueras:
On High-Quality, Low Energy BIST Preparation at RT-Level. LATW 2002: 52-57 - 2001
- [j7]Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira:
RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems. J. Electron. Test. 17(3-4): 311-319 (2001) - [c35]Yervant Zorian, Paolo Prinetto, João Paulo Teixeira, Isabel C. Teixeira, Carlos Eduardo Pereira, Octávio Páscoa Dias, Jorge Semião, Peter Muhmenthaler, W. Radermacher:
Embedded tutorial: TRP: integrating embedded test and ATE. DATE 2001: 34-37 - [c34]Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira:
RTL design validation, DFT and test pattern generation for high defects coverage. ETW 2001: 99-105 - [c33]Hugo Lérias, João Luz, Pedro Moura, Ana Mendes, Isabel C. Teixeira, João Paulo Teixeira:
Towards E-Management as Enabler for Accelerated Change. ICEIS (2) 2001: 807-814 - [c32]Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Design and Test of Certifiable ASICs for Safety-Critical Gas Burners Contro. IOLTW 2001: 197-201 - [c31]Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Implicit functionality and multiple branch coverage (IFMB): a testability metric for RT-level. ITC 2001: 377-385 - 2000
- [j6]Salvador Manich, A. Gabarró, M. Lopez, Joan Figueras, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, João Paulo Teixeira, Marcelino B. Santos:
Low Power BIST by Filtering Non-Detecting Vectors. J. Electron. Test. 16(3): 193-202 (2000) - [c30]Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira:
RTL-based functional test generation for high defects coverage in digital SOCs. ETW 2000: 99-104 - [c29]Octávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira, Leandro Buss Becker, Carlos Eduardo Pereira:
Optimizing Functional distribution in Complex System Design. DIPES 2000: 75-86 - [c28]Leandro Buss Becker, Carlos Eduardo Pereira, Octávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira:
MOSYS A Methodology for Automatic Object Identification from System Specification. ISORC 2000: 198-201 - [c27]Octávio Páscoa Dias, Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Quality of Electronic Design: From Architectural Level to Test Coverage. ISQED 2000: 197- - [c26]Marcelino B. Santos, João Paulo Teixeira:
Experiments on RTL ATPG and Fault Simulation for High Defect Coverage in Digital Systems-on-a-Chip. LATW 2000: 66-71
1990 – 1999
- 1999
- [j5]Octávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira:
Metrics and Criteria for Quality Assessment of Testable Hw/Sw Systems Architectures. J. Electron. Test. 14(1-2): 149-158 (1999) - [j4]Fernando M. Gonçalves, João Paulo Teixeira:
Defect-Oriented Sampling of Non-Equally Probable Faults in VLSI Systems. J. Electron. Test. 15(1-2): 41-52 (1999) - [c25]Marcelino B. Santos, João Paulo Teixeira:
Defect-Oriented Mixed-Level Fault Simulation of Digital Systems-on-a-Chip Using HDL. DATE 1999: 549- - [c24]Octávio Páscoa Dias, Jorge Semião, Marcelino B. Santos, Isabel Maria Cacho Teixeira, João Paulo Teixeira:
From system level to defect-oriented test: a case study. ETW 1999: 136-141 - [c23]Salvador Manich, A. Gabarró, M. Lopez, Joan Figueras, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, João Paulo Teixeira, Marcelino B. Santos:
Low power BIST by filtering non-detecting vectors. ETW 1999: 165-170 - [c22]Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Joan Figueras, Salvador Manich, João Paulo Teixeira, Marcelino B. Santos:
Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity. ISCAS (1) 1999: 110-113 - [c21]Fernando M. Gonçalves, João Paulo Teixeira:
Teaching Microelectronic-Based Integrated Systems Design and Test. MSE 1999: 65-66 - [c20]Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira:
Defect-Oriented Verilog Fault Simulation of SoC Macros using a Stratified Fault Sampling Technique. VTS 1999: 326-332 - 1998
- [c19]Marcelino B. Santos, Fernando M. Gonçalves, Michael J. Ohletz, João Paulo Teixeira:
Defect-oriented testing of analogue and mixed signal ICs. ICECS 1998: 419-424 - [c18]Octávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira, Carlos Eduardo Pereira:
An OO Based Methodology for Real-Time HW/SW Systems Modeling. DIPES 1998: 213-222 - [c17]Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Defect-oriented test quality assessment using fault sampling and simulation. ITC 1998: 35-42 - [c16]Fernando M. Gonçalves, João Paulo Teixeira:
Sampling Techniques of Non-Equally Probable Faults in VLSI System. VTS 1998: 283-288 - 1997
- [c15]Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira:
Realistic Fault Extraction for High-Quality Design and Test of VLSI Systems. DFT 1997: 29-37 - 1996
- [j3]José T. de Sousa, Fernando M. Gonçalves, João Paulo Teixeira, Cristoforo Marzocca, Francesco Corsi, Thomas W. Williams:
Defect level evaluation in an IC design environment. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 15(10): 1286-1293 (1996) - [c14]Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira:
Integrated Approach for Circuit and Fault Extraction of VLSI Circuits. DFT 1996: 96-104 - [c13]João Paulo Teixeira, F. Celeiro, L. Dias, J. Ferreira, Marcelino B. Santos:
VHDL fault simulation for defect-oriented test and diagnosis of digital ICs. EURO-DAC 1996: 450-455 - [c12]F. Celeiro, L. Dias, J. Ferreira, Marcelino B. Santos, João Paulo Teixeira:
Defect-Oriented IC Test and Diagnosis Using VHDL Fault Simulation. ITC 1996: 620-628 - [c11]Mario Calha, João Paulo Teixeira, Isabel C. Teixeira:
HW/SW specification using OOM techniques. RSP 1996: 96-101 - 1995
- [c10]Marcelino B. Santos, M. Simões, Isabel C. Teixeira, João Paulo Teixeira:
Test preparation methodology for high coverage of physical defects in CMOS digital ICs. ED&TC 1995: 604 - [c9]Marcelino B. Santos, M. Simões, Isabel C. Teixeira, João Paulo Teixeira:
Test preparation for high coverage of physical defects in CMOS digital ICs. VTS 1995: 330-337 - 1994
- [c8]A. P. Casimiro, Fernando M. Gonçalves, João Paulo Teixeira, Marcelino B. Santos:
On the Analysis of Routing Cells and Adjacency Faults in CMOS Digital Circuits. DFT 1994: 263-270 - [c7]José T. de Sousa, Fernando M. Gonçalves, João Paulo Teixeira, Thomas W. Williams:
Fault Modeling and Defect Level Projections in Digital ICs. EDAC-ETC-EUROASIC 1994: 436-442 - [c6]Mario Calha, Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira:
Back Annotation of Physical Defects into Gate-Level, Realistic Faults in Digital ICs. ITC 1994: 720-728 - 1993
- [c5]A. P. Casimiro, M. Simões, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Experiments on Bridging Fault Analysis and Layout-Level DFT for CMOS Designs. DFT 1993: 109-116 - [c4]P. Nicolau, J. Barbosa, M. Saraiva, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Realistic Fault Analysis of CMOS Analog Building Blocks. DFT 1993: 311-318 - 1992
- [j2]M. Saraiva, Marcelino B. Santos, A. P. Casimiro, Isabel Maria Cacho Teixeira, João Paulo Teixeira:
On the design of a highly testable cell library. Microprocess. Microprogramming 35(1-5): 383-389 (1992) - [c3]M. Saraiva, P. Casimiro, Marcelino B. Santos, José T. de Sousa, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira:
Physical DFT for High Coverage of Realistic Faults. ITC 1992: 642-651 - 1991
- [j1]João Paulo Teixeira, Isabel C. Teixeira, Carlos F. Beltrán Almeida, Fernando M. Gonçalves, Júlio Gonçalves:
A methodology for testability enhancement at layout level. J. Electron. Test. 1(4): 287-299 (1991) - [c2]José T. de Sousa, Fernando M. Gonçalves, João Paulo Teixeira:
IC Defects-Based Testability Analysis. ITC 1991: 500-509 - 1990
- [c1]João Paulo Teixeira, Isabel C. Teixeira, Carlos F. Beltrán Almeida, Fernando M. Gonçalves, Júlio Gonçalves, R. Crespo:
A strategy for testability enhancement at layout level. EURO-DAC 1990: 413-417
Coauthor Index
Marcelino B. Santos
aka: Marcelino Bicho Dos Santos
aka: Marcelino Bicho Dos Santos
[p1] [c82] [j24] [c81] [c80] [j23] [c79] [j22] [c78] [j19] [c75] [c73] [c72] [c70] [c67] [c64] [c63] [c62] [c61] [j17] [j14] [c59] [c58] [j13] [c57] [c56] [c55] [c54] [c53] [c52] [c51] [c49] [j12] [c46] [j11] [j10] [c45] [c44] [c43] [c42] [c40] [c39] [j9] [j8] [c38] [c37] [c36] [j7] [c34] [c32] [c31] [j6] [c30] [c27] [c26] [c25] [c24] [c23] [c22] [c20] [c19] [c17] [c13] [c12] [c10] [c9] [c8] [c6] [c5] [c4] [j2] [c3]
Isabel C. Teixeira
aka: Isabel Maria Cacho Teixeira
aka: Isabel Maria Cacho Teixeira
[p1] [c82] [j24] [c81] [c80] [j23] [c79] [j22] [j21] [c78] [j20] [j19] [c77] [c76] [c75] [c74] [c73] [j18] [c72] [c71] [c70] [c69] [c68] [c67] [c66] [c65] [c64] [c62] [c61] [j17] [j15] [j14] [c60] [c59] [c58] [c57] [c56] [c55] [c54] [c52] [c50] [c48] [j12] [c47] [c46] [j10] [c43] [c42] [c41] [c39] [j9] [j8] [c38] [c37] [c36] [j7] [c35] [c34] [c33] [c32] [c31] [c30] [c29] [c28] [c27] [j5] [c24] [c20] [c18] [c17] [c15] [c14] [c11] [c10] [c9] [c6] [c5] [c4] [j2] [c3] [j1] [c1]
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