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ORCIDSalvatore Lombardo
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2010 – 2019
- 2018
[j15]Fabio Ricco Galluzzo, A. Scuto, Cosimo Gerardi, A. Battaglia, Andrea Canino, Salvatore Lombardo
:
Performance increase of tandem amorphous/microcrystalline Si PV devices under variable illumination and temperature conditions. Microelectron. Reliab. 88-90: 1025-1029 (2018)- 2017
- [c7]Antonio Maria Chiarelli, Filippo Zappasodi, Francesco di Pompeo, Arcangelo Merla, Massimo Mazzillo, Giorgio Fallica, Sebania Libertino, Salvatore Lombardo:
Flexible CW-fNIRS system based on Silicon Photomultipliers: In-vivo characterization of sensorimotor response. IEEE SENSORS 2017: 1-3 - [c6]Massimo Mazzillo, Domenico Mello, Pietro Paolo Barbarino, Vincenzo Vinciguerra, Giorgio Fallica, Sebania Libertino, Antonella Sciuto, Salvatore Lombardo, Yuri Musienko:
Silicon photomultipliers with embedded optical filters for wearable healthcare applications. IEEE SENSORS 2017: 1-3 - [c5]Davide Patti, Salvatore Pennisi, Salvatore Lombardo, Giuseppe Nicotra:
Towards a nanofabricated vacuum cold-emitting triode. SMACD 2017: 1-4 - 2016
- [j14]Felix Palumbo, Salvatore Lombardo, Moshe Eizenberg:
Influence of gate oxides with high thermal conductivity on the failure distribution of InGaAs-based MOS stacks. Microelectron. Reliab. 56: 22-28 (2016) - 2015
- [c4]Felix Palumbo, Moshe Eizenberg, Salvatore Lombardo:
General features of progressive breakdown in gate oxides: A compact model. IRPS 2015: 5 - 2014
- [c3]Maria Francesca Santangelo, S. La Cono, P. Vasquez, Giorgio Fallica, Sabrina Conoci, A. C. Busacca, R. Pagano, Emanuele L. Sciuto, Salvatore Lombardo, Sebania Libertino:
CY5 fluorescence measured with silicon photomultipliers. BioCAS 2014: 284-287 - [c2]Salvatore Lombardo, Marisa Ciarlo, Nunzio Casalino:
VIRGO: An Innovative Virtual Registry of Underground Infrastructure on Cloud. EMTC 2014: 1-6 - [c1]Nunzio Casalino, Marisa Ciarlo, Salvatore Lombardo:
Designing a Public Smart Registry for an Innovative and Transparent Governance of European Ground Infrastructures. IDT/IIMSS/STET 2014: 758-767 - 2010
- [j13]Sebania Libertino, Domenico Corso, G. Murè, A. Marino, Felix Palumbo, Fabio Principato, G. Cannella, T. Schillaci, S. Giarusso, F. Celi, Michael Lisiansky, Yakov Roizin, Salvatore Lombardo:
Radiation effects in nitride read-only memories. Microelectron. Reliab. 50(9-11): 1857-1860 (2010)
2000 – 2009
- 2009
- [j12]Sebania Libertino, Venera Aiello, Antonino Scandurra, Marcella Renis, Fulvia Sinatra, Salvatore Lombardo:
Feasibility Studies on Si-Based Biosensors. Sensors 9(5): 3469-3490 (2009) - 2008
- [j11]R. Pagano, Salvatore Lombardo, Felix Palumbo, Paul Kirsch, S. A. Krishnan, Chadwin D. Young, Rino Choi, Gennadi Bersuker, James H. Stathis:
A novel approach to characterization of progressive breakdown in high-k/metal gate stacks. Microelectron. Reliab. 48(11-12): 1759-1764 (2008) - [j10]Calogero Pace, Gino Giusi, Felice Crupi, Salvatore Lombardo:
Detection and Classification of Single-Electron Jumps in Si Nanocrystal Memories. IEEE Trans. Instrum. Meas. 57(2): 364-368 (2008) - 2007
- [j9]Salvatore Lombardo:
Guest Editorial. Microelectron. Reliab. 47(4-5): 477-478 (2007) - [j8]Cosimo Gerardi, Salvatore Lombardo, Giuseppe Ammendola, Giovanni Costa, Valentina Ancarani, Domenico Mello, Stella Giuffrida, Maria Cristina Plantamura:
Study of nanocrystal memory integration in a Flash-like NOR device. Microelectron. Reliab. 47(4-5): 593-597 (2007) - [j7]Patrick Fiorenza, Raffaella Lo Nigro, Vito Raineri, Salvatore Lombardo, Roberta G. Toro, Graziella Malandrino, Ignazio L. Fragalà:
Defects induced anomalous breakdown kinetics in Pr2O3 by micro- and nano-characterization. Microelectron. Reliab. 47(4-5): 640-644 (2007) - [j6]Domenico Corso, S. Aurite, E. Sciacca, D. Naso, Salvatore Lombardo, A. Santangelo, M. C. Nicotra, S. Cascino:
Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage. Microelectron. Reliab. 47(4-5): 806-809 (2007) - 2005
- [j5]Felix Palumbo, G. Condorelli, Salvatore Lombardo, Kin Leong Pey, C. H. Tung, L. J. Tang:
Structure of the oxide damage under progressive breakdown. Microelectron. Reliab. 45(5-6): 845-848 (2005) - [j4]Ester Spitale, D. Corso, Isodiana Crupi, Salvatore Lombardo, Cosimo Gerardi:
Improvement of the P/E window in nanocrystal memories by the use of high-k materials in the control dielectric. Microelectron. Reliab. 45(5-6): 895-898 (2005) - 2003
- [j3]James H. Stathis, Barry P. Linder, Rosana Rodríguez, Salvatore Lombardo:
Reliability of ultra-thin oxides in CMOS circuits. Microelectron. Reliab. 43(9-11): 1353-1360 (2003) - 2002
- [j2]Rosana Rodríguez, James H. Stathis, Barry P. Linder, Steven P. Kowalczyk, Ching-Te Chuang, Rajiv V. Joshi, Gregory A. Northrop, Kerry Bernstein, Azeez J. Bhavnagarwala, Salvatore Lombardo:
Analysis of the effect of the gate oxide breakdown on SRAM stability. Microelectron. Reliab. 42(9-11): 1445-1448 (2002) - [j1]Salvatore Lombardo, James H. Stathis, Barry P. Linder:
Dependence of Post-Breakdown Conduction on Gate Oxide Thickness. Microelectron. Reliab. 42(9-11): 1481-1484 (2002)
Coauthor Index
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