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2010 – 2019
- 2019
[c4]Raffaele Aaron Giampaolo
, Andrea Di Salvo, Lucio Pancheri, Tommaso Croci, Jonhatan Olave, Angelo Rivetti, Manuel Da Rocha Rolo, Serena Mattiazzo, Piero Giubilato:
Depleted MAPS on a 110 nm CMOS CIS Technology. ICECS 2019: 514-517- 2018
- [j4]Federica Resta, Simone Gerardin, S. Mattiazzo, Alessandro Paccagnella, Marcello De Matteis, Christian C. Enz, Andrea Baschirotto:
1GigaRad TID impact on 28 nm HEP analog circuits. Integr. 63: 306-314 (2018) - [j3]Carmine Abbate, Giovanni Busatto, S. Mattiazzo, Annunziata Sanseverino, L. Silvestrin, D. Tedesco, Francesco Velardi:
Progressive drain damage in SiC power MOSFETs exposed to ionizing radiation. Microelectron. Reliab. 88-90: 941-945 (2018) - 2017
- [c3]C.-M. Zhang, Farzan Jazaeri, Alessandro Pezzotta, Claudio Bruschini, Giulio Borghello, S. Mattiazzo, Andrea Baschirotto, Christian C. Enz:
Total ionizing dose effects on analog performance of 28 nm bulk MOSFETs. ESSDERC 2017: 30-33 - 2016
- [c2]Alessandro Pezzotta, C.-M. Zhang, Farzan Jazaeri, Claudio Bruschini, Giulio Borghello, Federico Faccio, S. Mattiazzo, Andrea Baschirotto, Christian C. Enz:
Impact of GigaRad Ionizing Dose on 28 nm bulk MOSFETs for future HL-LHC. ESSDERC 2016: 146-149 - 2015
- [j2]Carmine Abbate, Giovanni Busatto, Francesco Iannuzzo, S. Mattiazzo, Annunziata Sanseverino, L. Silvestrin, D. Tedesco, Francesco Velardi:
Experimental study of Single Event Effects induced by heavy ion irradiation in enhancement mode GaN power HEMT. Microelectron. Reliab. 55(9-10): 1496-1500 (2015) - [c1]N. Demaria, G. Dellacasa, G. Mazza, Angelo Rivetti, Manuel D. Da Rocha Rolo, E. Monteil, L. Pacher, Fabio Ciciriello, Francesco Corsi, Cristoforo Marzocca, G. De Roberts, F. Loddo, C. Tamma, Marta Bagatin, D. Bisello, Simone Gerardin, S. Mattiazzo, L. Ding, Piero Giubilato, Alessandro Paccagnella, Francesco De Canio, Luigi Gaioni, Massimo Manghisoni, Valerio Re, Gianluca Traversi, Elisa Riceputi, Lodovico Ratti, Carla Vacchi, Roberto Beccherle, Guido Magazzù, M. Minuti, Fabio Morsani, Fabrizio Palla, Valentino Liberali, Seyedruhollah Shojaii, Alberto Stabile, Gian Mario Bilei, Mauro Menichelli, Elia Conti, Sara Marconi, D. Passen, Pisana Placidi:
CHIPIX65: Developments on a new generation pixel readout ASIC in CMOS 65 nm for HEP experiments. IWASI 2015: 49-54 - 2011
- [j1]Giovanni Busatto, D. Bisello, Giuseppe Currò, Piero Giubilato, Francesco Iannuzzo, S. Mattiazzo, D. Pantano, Annunziata Sanseverino, L. Silvestrin, M. Tessaro, Francesco Velardi, Jeffery Wyss:
A new test methodology for an exhaustive study of single-event-effects on power MOSFETs. Microelectron. Reliab. 51(9-11): 1995-1998 (2011)
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