A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests. - Wieland, D.; Ofner, S.; Stabentheiner, Manuel; Butej, Boris; Koller, Christian; Sun, J.; Minetto, Andrea; Reiser, Korbinian; Häberlen, Oliver; Nelhiebel, Michael; Glavanovics, Michael; Pogany, Dionyz; et al. (2023)

System-level evaluation of dynamic effects in a GaN-based class-E power amplifier. - Minetto, Andrea; Deutschmann, Bernd; Häberlen, Oliver; Curatola, Gilberto (Integr., 2020)

System-Level Assessment of Dynamic Effects in GaN-based Power Converters. - Minetto, Andrea; Deutschmann, Bernd; Häberlen, Oliver; Curatola, Gilberto (2019)

Charge Injection in Normally-Off p-GaN Gate AlGaN/GaN-on-Si HFETs. - Sayadi, Luca; Iannaccone, Giuseppe; Sicre, Sebastien; Lavanga, Simone; Fiori, Gianluca; Haeberlen, Oliver; Curatola, Gilberto (2018)

Scanning Microwave Microscopy for Electronic Device Analysis on Nanometre Scale. - Hommel, Sören; Killat, Nicole; Altes, Andreas; Schweinböck, Thomas; Schmitt-Landsiedel, Doris; Silvestri, Marco; Haeberlen, Oliver (Microelectron. Reliab., 2016)

GaN virtual prototyping: From traps modeling to system-level cascode optimization. - Curatola, Gilberto; Kassmanhuber, Andreas; Yuferev, Sergey; Franke, Jörg; Pozzovivo, Gianmauro; Lavanga, Simone; Prechtl, Gerhard; Detzel, Thomas; Haeberlen, Oliver (2014)