Exploring technology for neonatal resuscitation training - Kenny Hong; Yumiko Sakamoto; Ganesh Srinivasan; Pourang Irani (AH '20: 11th Augmented Human International Conference, Winnipeg, Manitoba, Canada, May 27-28, 2020, 2020)

Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones - Vishwanath Natarajan; Hyun Woo Choi; Aritra Banerjee; Shreyas Sen; Abhijit Chatterjee; Ganesh Srinivasan; Friedrich Taenzler; Soumendu Bhattacharya (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme - Sukeshwar Kannan; Bruce C. Kim; Ganesh Srinivasan; Friedrich Taenzler; Richard Antley; Craig Force (J. Electron. Test., 2011)

Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation - Aritra Banerjee; Vishwanath Natarajan; Shreyas Sen; Abhijit Chatterjee; Ganesh Srinivasan; Soumendu Bhattacharya (VLSI Design 2011: 24th International Conference on VLSI Design, IIT Madras, Chennai, India, 2-7 January 2011, 2011)

Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems - Vishwanath Natarajan; Shreyas Sen; Aritra Banerjee; Abhijit Chatterjee; Ganesh Srinivasan; Friedrich Taenzler (IEEE Des. Test Comput., 2010)

Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices - Ganesh Srinivasan; Abhijit Chatterjee; Sasikumar Cherubal; Pramodchandran N. Variyam (J. Electron. Test., 2010)

Digitally Assisted Concurrent Built-In Tuning of RF Systems Using Hamming Distance Proportional Signatures - Shyam Kumar Devarakond; Shreyas Sen; Vishwanath Natarajan; Aritra Banerjee; Hyun Woo Choi; Ganesh Srinivasan; Abhijit Chatterjee (Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China, 2010)

RADPro: Automatic RF analyzer and diagnostic program generation tool - Sukeshwar Kannan; Bruce C. Kim; Ganesh Srinivasan; Friedrich Taenzlar; Richard Antley; Craig Force; Falah Mohammed (2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010, 2010)

Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers - Ganesh Srinivasan; Friedrich Taenzler; Abhijit Chatterjee (IEEE Des. Test Comput., 2008)

Optimized EVM Testing for IEEE 802.11a/n RF ICs - Erkan Acar; Sule Ozev; Ganesh Srinivasan; Friedrich Taenzler (2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008, 2008)

Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms - Ganesh Srinivasan; Hui-Chuan Chao; Friedrich Taenzler (2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008, 2008)

Fourier Spectrum-Based Signature Test: A Genetic CAD Toolbox for Reliable RF Testing Using Low-Performance Test Resources - Ganesh Srinivasan; Abhijit Chatterjee; Vishwanath Natarajan (16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007, 2007)

Novel Cross-Loopback Based Test Approach for Specification Test of Multi-Band, Multi-Hardware Radios - Vishwanath Natarajan; Ganesh Srinivasan; Abhijit Chatterjee; Craig Force (25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA, 2007)

Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms - Ganesh Srinivasan; Friedrich Taenzler; Abhijit Chatterjee (Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006, 2006)

On-Line Error Detection in Wireless RF Transmitters Using Real-time Streaming Data - Vishwanath Natarajan; Ganesh Srinivasan; Abhijit Chatterjee (12th IEEE International On-Line Testing Symposium (IOLTS 2006), 10-12 July 2006, Como, Italy, 2006)

Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures - Ganesh Srinivasan; Abhijit Chatterjee; Friedrich Taenzler (24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA, 2006)

Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications - Soumendu Bhattacharya; Achintya Halder; Ganesh Srinivasan; Abhijit Chatterjee (J. Electron. Test., 2005)

Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers - Ganesh Srinivasan; Sasikumar Cherubal; Pramodchandran N. Variyam; Melese Teklu; C. P. Wang; David Guidry; Abhijit Chatterjee (10th European Test Symposium, ETS 2005, Tallinn, Estonia, May 22-25, 2005, 2005)

A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode - Achintya Halder; Soumendu Bhattacharya; Ganesh Srinivasan; Abhijit Chatterjee (18th International Conference on VLSI Design (VLSI Design 2005), with the 4th International Conference on Embedded Systems Design, 3-7 January 2005, Kolkata, India, 2005)

Reconfiguration for Enhanced ALternate Test (REALTest) of Analog Circuits - Ganesh Srinivasan; Shalabh Goyal; Abhijit Chatterjee (13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan, 2004)

Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit - Ganesh Srinivasan; Soumendu Bhattacharya; Sasikumar Cherubal; Abhijit Chatterjee (2004 Design, Automation and Test in Europe Conference and Exposition (DATE 2004), 16-20 February 2004, Paris, France, 2004)

Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences - Soumendu Bhattacharya; Ganesh Srinivasan; Sasikumar Cherubal; Abhijit Chatterjee (2nd IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2004), 28-30 January 2004, Perth, Australia, 2004)

System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams - Soumendu Bhattacharya; Ganesh Srinivasan; Sasikumar Cherubal; Achintya Halder; Abhijit Chatterjee (22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA, 2004)