Diagnostic resolution improvement through learning-guided physical failure analysis - Carlston Lim; Yang Xue; Xin Li; Ronald D. Blanton; M. Enamul Amyeen (2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016, 2016)

Automated Debug of Speed Path Failures Using Functional Tests - Richard McLaughlin; Srikanth Venkataraman; Carlston Lim (27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA, 2009)