A novel BIST technique for LDMOS drivers. - Kim, Bruce C.; Mondal, Saikat; Taenzler, Friedrich; Moushegian, Kenneth (2014)

Development and empirical verification of an accuracy model for the power down leakage tests. - Jeong, Jae Woong; Ozev, Sule; Taenzler, Friedrich; Chao, Hui-Chuan (2014)

Physics-Based Low-Cost Test Technique for High Voltage LDMOS. - Kannan, Sukeshwar; Kannan, Kaushal; Kim, Bruce C.; Taenzler, Friedrich; Antley, Richard; Moushegian, Ken; Butler, Kenneth M.; Mirizzi, Doug (J. Electron. Test., 2013)

Physics Based Fault Models for Testing High-Voltage LDMOS. - Kannan, Sukeshwar; Kim, Bruce C.; Gupta, Anurag; Taenzler, Friedrich; Antley, Richard; Moushegian, Ken (2013)

Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones. - Natarajan, Vishwanath; Choi, Hyun Woo; Banerjee, Aritra; Sen, Shreyas; Chatterjee, Abhijit; Srinivasan, Ganesh; Taenzler, Friedrich; Bhattacharya, Soumendu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme. - Kannan, Sukeshwar; Kim, Bruce C.; Srinivasan, Ganesh; Taenzler, Friedrich; Antley, Richard; Force, Craig (J. Electron. Test., 2011)

Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems. - Natarajan, Vishwanath; Sen, Shreyas; Banerjee, Aritra; Chatterjee, Abhijit; Srinivasan, Ganesh; Taenzler, Friedrich (IEEE Des. Test Comput., 2010)

RADPro: Automatic RF analyzer and diagnostic program generation tool. - Kannan, Sukeshwar; Kim, Bruce C.; Srinivasan, Ganesh; Taenzlar, Friedrich; Antley, Richard; Force, Craig; Mohammed, Falah (2010)

Low cost test and tuning of RF circuits and systems. - Chatterjee, Abhijit; Taenzler, Friedrich (2010)

Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers. - Srinivasan, Ganesh; Taenzler, Friedrich; Chatterjee, Abhijit (IEEE Des. Test Comput., 2008)

Optimized EVM Testing for IEEE 802.11a/n RF ICs. - Acar, Erkan; Ozev, Sule; Srinivasan, Ganesh; Taenzler, Friedrich (2008)

Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms. - Srinivasan, Ganesh; Chao, Hui-Chuan; Taenzler, Friedrich (2008)

Production Test of High Volume Commercial RFIC. - Taenzler, Friedrich (2007)

Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms. - Srinivasan, Ganesh; Taenzler, Friedrich; Chatterjee, Abhijit (2006)

Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures. - Srinivasan, Ganesh; Chatterjee, Abhijit; Taenzler, Friedrich (2006)

Contactless characterization of microwave integrated circuits by device internal indirect electro-optic probing. - Taenzler, Friedrich; Novak, Thomas; Kubalek, Erich (1993)