A novel BIST technique for LDMOS drivers - Bruce C. Kim; Saikat Mondal; Friedrich Taenzler; Kenneth Moushegian (IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014, College Station, TX, USA, August 3-6, 2014, 2014)

Development and empirical verification of an accuracy model for the power down leakage tests - Jae Woong Jeong; Sule Ozev; Friedrich Taenzler; Hui-Chuan Chao (32nd IEEE VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014, 2014)

Physics-Based Low-Cost Test Technique for High Voltage LDMOS - Sukeshwar Kannan; Kaushal Kannan; Bruce C. Kim; Friedrich Taenzler; Richard Antley; Ken Moushegian; Kenneth M. Butler; Doug Mirizzi (J. Electron. Test., 2013)

Physics Based Fault Models for Testing High-Voltage LDMOS - Sukeshwar Kannan; Bruce C. Kim; Anurag Gupta; Friedrich Taenzler; Richard Antley; Ken Moushegian (26th International Conference on VLSI Design and 12th International Conference on Embedded Systems, Pune, India, January 5-10, 2013, 2013)

Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones - Vishwanath Natarajan; Hyun Woo Choi; Aritra Banerjee; Shreyas Sen; Abhijit Chatterjee; Ganesh Srinivasan; Friedrich Taenzler; Soumendu Bhattacharya (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme - Sukeshwar Kannan; Bruce C. Kim; Ganesh Srinivasan; Friedrich Taenzler; Richard Antley; Craig Force (J. Electron. Test., 2011)

Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems - Vishwanath Natarajan; Shreyas Sen; Aritra Banerjee; Abhijit Chatterjee; Ganesh Srinivasan; Friedrich Taenzler (IEEE Des. Test Comput., 2010)

RADPro: Automatic RF analyzer and diagnostic program generation tool - Sukeshwar Kannan; Bruce C. Kim; Ganesh Srinivasan; Friedrich Taenzlar; Richard Antley; Craig Force; Falah Mohammed (2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010, 2010)

Low cost test and tuning of RF circuits and systems - Abhijit Chatterjee; Friedrich Taenzler (28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA, 2010)

Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers - Ganesh Srinivasan; Friedrich Taenzler; Abhijit Chatterjee (IEEE Des. Test Comput., 2008)

Optimized EVM Testing for IEEE 802.11a/n RF ICs - Erkan Acar; Sule Ozev; Ganesh Srinivasan; Friedrich Taenzler (2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008, 2008)

Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms - Ganesh Srinivasan; Hui-Chuan Chao; Friedrich Taenzler (2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008, 2008)

Production Test of High Volume Commercial RFIC - Friedrich Taenzler (16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007, 2007)

Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms - Ganesh Srinivasan; Friedrich Taenzler; Abhijit Chatterjee (Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006, 2006)

Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures - Ganesh Srinivasan; Abhijit Chatterjee; Friedrich Taenzler (24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA, 2006)

Contactless characterization of microwave integrated circuits by device internal indirect electro-optic probing - Friedrich Taenzler; Thomas Novak; Erich Kubalek (11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA, 1993)