BibTeX records: Robert J. Baseman

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@article{DBLP:journals/corr/abs-2409-05735,
  author       = {Achille Fokoue and
                  Srideepika Jayaraman and
                  Elham Khabiri and
                  Jeffrey O. Kephart and
                  Yingjie Li and
                  Dhruv Shah and
                  Youssef Drissi and
                  Fenno F. Terry Heath III and
                  Anuradha Bhamidipaty and
                  Fateh Tipu and
                  Robert J. Baseman},
  title        = {A System and Benchmark for LLM-based Q{\&}A on Heterogeneous Data},
  journal      = {CoRR},
  volume       = {abs/2409.05735},
  year         = {2024},
  url          = {https://doi.org/10.48550/arXiv.2409.05735},
  doi          = {10.48550/ARXIV.2409.05735},
  eprinttype    = {arXiv},
  eprint       = {2409.05735},
  timestamp    = {Wed, 09 Oct 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/corr/abs-2409-05735.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/jim/WeissDBWLWP16,
  author       = {Sholom M. Weiss and
                  Amit Dhurandhar and
                  Robert J. Baseman and
                  Brian F. White and
                  Ronald Logan and
                  Jonathan K. Winslow and
                  Daniel J. Poindexter},
  title        = {Continuous prediction of manufacturing performance throughout the
                  production lifecycle},
  journal      = {J. Intell. Manuf.},
  volume       = {27},
  number       = {4},
  pages        = {751--763},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10845-014-0911-x},
  doi          = {10.1007/S10845-014-0911-X},
  timestamp    = {Thu, 24 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jim/WeissDBWLWP16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/kdd/WeissDB13,
  author       = {Sholom M. Weiss and
                  Amit Dhurandhar and
                  Robert J. Baseman},
  editor       = {Inderjit S. Dhillon and
                  Yehuda Koren and
                  Rayid Ghani and
                  Ted E. Senator and
                  Paul Bradley and
                  Rajesh Parekh and
                  Jingrui He and
                  Robert L. Grossman and
                  Ramasamy Uthurusamy},
  title        = {Improving quality control by early prediction of manufacturing outcomes},
  booktitle    = {The 19th {ACM} {SIGKDD} International Conference on Knowledge Discovery
                  and Data Mining, {KDD} 2013, Chicago, IL, USA, August 11-14, 2013},
  pages        = {1258--1266},
  publisher    = {{ACM}},
  year         = {2013},
  url          = {https://doi.org/10.1145/2487575.2488192},
  doi          = {10.1145/2487575.2488192},
  timestamp    = {Sun, 19 Jan 2025 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/kdd/WeissDB13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/apin/WeissBTCDSH10,
  author       = {Sholom M. Weiss and
                  Robert J. Baseman and
                  Fateh Tipu and
                  Christopher N. Collins and
                  William A. Davies and
                  Raminderpal Singh and
                  John W. Hopkins},
  title        = {Rule-based data mining for yield improvement in semiconductor manufacturing},
  journal      = {Appl. Intell.},
  volume       = {33},
  number       = {3},
  pages        = {318--329},
  year         = {2010},
  url          = {https://doi.org/10.1007/s10489-009-0168-9},
  doi          = {10.1007/S10489-009-0168-9},
  timestamp    = {Wed, 17 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/apin/WeissBTCDSH10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}