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ORCIDBibTeX records: Peter C. Maxwell
@article{DBLP:journals/tcad/HapkeHMBVDGFR21,
author = {Friedrich Hapke and
Will Howell and
Peter C. Maxwell and
Edward Brazil and
Srikanth Venkataraman and
Rudrajit Dutta and
Andreas Glowatz and
Anja Fast and
Janusz Rajski},
title = {Defect-Oriented Test: Effectiveness in High Volume Manufacturing},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {40},
number = {3},
pages = {584--597},
year = {2021},
url = {https://doi.org/10.1109/TCAD.2020.3001259},
doi = {10.1109/TCAD.2020.3001259},
timestamp = {Thu, 27 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/HapkeHMBVDGFR21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HapkeM18,
author = {Friedrich Hapke and
Peter C. Maxwell},
title = {Total Critical Area Based Testing},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624825},
doi = {10.1109/TEST.2018.8624825},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/HapkeM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/MaxwellHRW17,
author = {Peter C. Maxwell and
Friedrich Hapke and
Maija Ryynaenen and
Peter Weseloh},
title = {Bridge over troubled waters: Critical area based pattern generation},
booktitle = {22nd {IEEE} European Test Symposium, {ETS} 2017, Limassol, Cyprus,
May 22-26, 2017},
pages = {1--6},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ETS.2017.7968227},
doi = {10.1109/ETS.2017.7968227},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/ets/MaxwellHRW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/MaxwellHT16,
author = {Peter C. Maxwell and
Friedrich Hapke and
Huaxing Tang},
title = {Cell-aware diagnosis: Defective inmates exposed in their cells},
booktitle = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
May 23-27, 2016},
pages = {1--6},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/ETS.2016.7519313},
doi = {10.1109/ETS.2016.7519313},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/ets/MaxwellHT16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/WunderlichM16,
author = {Hans{-}Joachim Wunderlich and
Peter C. Maxwell},
title = {{ETS} 2015 best paper},
booktitle = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
May 23-27, 2016},
pages = {1},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/ETS.2016.7519278},
doi = {10.1109/ETS.2016.7519278},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/WunderlichM16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/YilmazOSM12,
author = {Ender Yilmaz and
Sule Ozev and
Ozgur Sinanoglu and
Peter C. Maxwell},
title = {Adaptive testing: Conquering process variations},
booktitle = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
28 - June 1 2012},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ETS.2012.6233045},
doi = {10.1109/ETS.2012.6233045},
timestamp = {Tue, 29 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/YilmazOSM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Maxwell11,
author = {Peter C. Maxwell},
title = {Adaptive Testing: Dealing with Process Variability},
journal = {{IEEE} Des. Test Comput.},
volume = {28},
number = {6},
pages = {41--49},
year = {2011},
url = {https://doi.org/10.1109/MDT.2011.118},
doi = {10.1109/MDT.2011.118},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/Maxwell11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/PolianBHWM11,
author = {Ilia Polian and
Bernd Becker and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich and
Peter C. Maxwell},
title = {Towards Variation-Aware Test Methods},
booktitle = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
2011},
pages = {219--225},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ETS.2011.51},
doi = {10.1109/ETS.2011.51},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/PolianBHWM11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/Maxwell10,
author = {Peter C. Maxwell},
title = {Adaptive test directions},
booktitle = {15th European Test Symposium, {ETS} 2010, Prague, Czech Republic,
May 24-28, 2010},
pages = {12--16},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ETSYM.2010.5512789},
doi = {10.1109/ETSYM.2010.5512789},
timestamp = {Tue, 28 Apr 2020 11:43:44 +0200},
biburl = {https://dblp.org/rec/conf/ets/Maxwell10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/Maxwell07,
author = {Peter C. Maxwell},
title = {Wafer Level Reliability Screens},
booktitle = {12th European Test Symposium, {ETS} 2007, Freiburg, Germany, May 20,
2007},
pages = {201},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/ETS.2007.45},
doi = {10.1109/ETS.2007.45},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/Maxwell07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Maxwell07,
author = {Peter C. Maxwell},
editor = {Jill Sibert and
Janusz Rajski},
title = {Principles and results of some test cost reduction methods for ASICs},
booktitle = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
California, USA, October 21-26, 2007},
pages = {1--5},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/TEST.2007.4437702},
doi = {10.1109/TEST.2007.4437702},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Maxwell07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Maxwell06,
author = {Peter C. Maxwell},
editor = {Scott Davidson and
Anne Gattiker},
title = {The Design, Implementation and Analysis of Test Experiments},
booktitle = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
CA, USA, October 22-27, 2006},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/TEST.2006.297735},
doi = {10.1109/TEST.2006.297735},
timestamp = {Tue, 12 Dec 2023 09:46:27 +0100},
biburl = {https://dblp.org/rec/conf/itc/Maxwell06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Maxwell03,
author = {Peter C. Maxwell},
title = {Wafer-Package Test Mix for Optimal Defect Detection and Test Time
Savings},
journal = {{IEEE} Des. Test Comput.},
volume = {20},
number = {5},
pages = {84--89},
year = {2003},
url = {https://doi.org/10.1109/MDT.2003.1232260},
doi = {10.1109/MDT.2003.1232260},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/Maxwell03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/SeguraM02,
author = {Jaume Segura and
Peter C. Maxwell},
title = {Guest Editors' Introduction: Defect-Oriented Testing in the Deep-Submicron
Era},
journal = {{IEEE} Des. Test Comput.},
volume = {19},
number = {5},
pages = {5--7},
year = {2002},
url = {https://doi.org/10.1109/MDT.2002.1033786},
doi = {10.1109/MDT.2002.1033786},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/SeguraM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Maxwell02,
author = {Peter C. Maxwell},
title = {The Heisenberg Uncertainty of Test},
booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
MD, USA, October 7-10, 2002},
pages = {13},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.ieeecomputersociety.org/10.1109/ITC.2002.10002},
doi = {10.1109/ITC.2002.10002},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Maxwell02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Maxwell02a,
author = {Peter C. Maxwell},
title = {Wafer/Package Test Mix for Optimal Defect Detection},
booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
MD, USA, October 7-10, 2002},
pages = {1050--1055},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/TEST.2002.1041861},
doi = {10.1109/TEST.2002.1041861},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Maxwell02a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/McCluskeMMMNR02,
author = {Edward J. McCluskey and
Subhasish Mitra and
Bob Madge and
Peter C. Maxwell and
Phil Nigh and
Mike Rodgers},
title = {Debating the Future of Burn-In},
booktitle = {20th {IEEE} {VLSI} Test Symposium {(VTS} 2002), Without Testing It's
a Gamble, 28 April - 2 May 2002, Monterey, CA, {USA}},
pages = {311--314},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.ieeecomputersociety.org/10.1109/VTS.2002.10015},
doi = {10.1109/VTS.2002.10015},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/McCluskeMMMNR02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaxwellHB00,
author = {Peter C. Maxwell and
Ismed Hartanto and
Lee Bentz},
title = {Comparing functional and structural tests},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {400--407},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894231},
doi = {10.1109/TEST.2000.894231},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaxwellHB00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaxwellR00,
author = {Peter C. Maxwell and
Jeff Rearick},
title = {Deception by design: fooling ourselves with gate-level models},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {921--929},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894303},
doi = {10.1109/TEST.2000.894303},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaxwellR00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaxwellOADJQW00,
author = {Peter C. Maxwell and
Pete O'Neill and
Robert C. Aitken and
Ronald Dudley and
Neal Jaarsma and
Minh Quach and
Don Wiseman},
title = {Current ratios: a self-scaling technique for production {IDDQ} testing},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {1148--1156},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894324},
doi = {10.1109/TEST.2000.894324},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaxwellOADJQW00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaxwellOADJQW99,
author = {Peter C. Maxwell and
Pete O'Neill and
Robert C. Aitken and
Ronald Dudley and
Neal Jaarsma and
Minh Quach and
Don Wiseman},
title = {Current ratios: a self-scaling technique for production I{\_}DDQ testing},
booktitle = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
NJ, USA, 27-30 September 1999},
pages = {738--746},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/TEST.1999.805803},
doi = {10.1109/TEST.1999.805803},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaxwellOADJQW99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RighterHSM98,
author = {Alan W. Righter and
Charles F. Hawkins and
Jerry M. Soden and
Peter C. Maxwell},
title = {{CMOS} {IC} reliability indicators and burn-in economics},
booktitle = {Proceedings {IEEE} International Test Conference 1998, Washington,
DC, USA, October 18-22, 1998},
pages = {194--203},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/TEST.1998.743152},
doi = {10.1109/TEST.1998.743152},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RighterHSM98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaxwellR98,
author = {Peter C. Maxwell and
Jeff Rearick},
title = {Estimation of defect-free {IDDQ} in submicron circuits using switch
level simulation},
booktitle = {Proceedings {IEEE} International Test Conference 1998, Washington,
DC, USA, October 18-22, 1998},
pages = {882--889},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/TEST.1998.743278},
doi = {10.1109/TEST.1998.743278},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaxwellR98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MaxwellBNCN98,
author = {Peter C. Maxwell and
Steve Baird and
Wayne M. Needham and
Al Crouch and
Phil Nigh},
title = {Best Methods for At-Speed Testing?},
booktitle = {16th {IEEE} {VLSI} Test Symposium {(VTS} '98), 28 April - 1 May 1998,
Princeton, NJ, {USA}},
pages = {460--461},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.ieeecomputersociety.org/10.1109/VTS.1998.10015},
doi = {10.1109/VTS.1998.10015},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MaxwellBNCN98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NighNBMAM97,
author = {Phil Nigh and
Wayne M. Needham and
Kenneth M. Butler and
Peter C. Maxwell and
Robert C. Aitken and
Wojciech Maly},
title = {So What Is an Optimal Test Mix? {A} Discussion of the {SEMATECH} Methods
Experiment},
booktitle = {Proceedings {IEEE} International Test Conference 1997, Washington,
DC, USA, November 3-5, 1997},
pages = {1037--1038},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/TEST.1997.639727},
doi = {10.1109/TEST.1997.639727},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NighNBMAM97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AitkenBGMN97,
author = {Phil Nigh and
Wayne M. Needham and
Kenneth M. Butler and
Peter C. Maxwell and
Robert C. Aitken},
title = {An experimental study comparing the relative effectiveness of functional,
scan, IDDq and delay-fault testing},
booktitle = {15th {IEEE} {VLSI} Test Symposium (VTS'97), April 27-May 1, 1997,
Monterey, California, {USA}},
pages = {459},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/VTEST.1997.600334},
doi = {10.1109/VTEST.1997.600334},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AitkenBGMN97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaxwellAKB96,
author = {Peter C. Maxwell and
Robert C. Aitken and
Kathleen R. Kollitz and
Allen C. Brown},
title = {I\({}_{\mbox{DDQ}}\) and {AC} Scan: The War Against Unmodelled Defects},
booktitle = {Proceedings {IEEE} International Test Conference 1996, Test and Design
Validity, Washington, DC, USA, October 20-25, 1996},
pages = {250--258},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/TEST.1996.556969},
doi = {10.1109/TEST.1996.556969},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaxwellAKB96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/Maxwell95,
author = {Peter C. Maxwell},
title = {Reductions in quality caused by uneven fault coverage of different
areas of an integrated circuit},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {14},
number = {5},
pages = {603--607},
year = {1995},
url = {https://doi.org/10.1109/43.384423},
doi = {10.1109/43.384423},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/Maxwell95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Maxwell95,
author = {Peter C. Maxwell},
title = {The Many Faces of Test Synthesis},
booktitle = {Proceedings {IEEE} International Test Conference 1995, Driving Down
the Cost of Test, Washington, DC, USA, October 21-25, 1995},
pages = {295},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/TEST.1995.529847},
doi = {10.1109/TEST.1995.529847},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Maxwell95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Maxwell95,
author = {Peter C. Maxwell},
title = {The use of {IDDQ} testing in low stuck-at coverage situations},
booktitle = {13th {IEEE} {VLSI} Test Symposium (VTS'95), April 30 - May 3, 1995,
Princeton, New Jersey, {USA}},
pages = {84--88},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/VTEST.1995.512621},
doi = {10.1109/VTEST.1995.512621},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Maxwell95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaxwellAH94,
author = {Peter C. Maxwell and
Robert C. Aitken and
Leendert M. Huisman},
title = {The Effect on Quality of Non-Uniform Fault Coverage and Fault Probability},
booktitle = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
Next 25 Years, Washington, DC, USA, October 2-6, 1994},
pages = {739--746},
publisher = {{IEEE} Computer Society},
year = {1994},
url = {https://doi.org/10.1109/TEST.1994.528020},
doi = {10.1109/TEST.1994.528020},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaxwellAH94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Maxwell94,
author = {Peter C. Maxwell},
title = {Quality impacts of non-uniform fault coverage},
booktitle = {12th {IEEE} {VLSI} Test Symposium (VTS'94), April 25-28, 1994, Cherry
Hill, New Jersey, {USA}},
pages = {197--200},
publisher = {{IEEE} Computer Society},
year = {1994},
url = {https://doi.org/10.1109/VTEST.1994.292313},
doi = {10.1109/VTEST.1994.292313},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Maxwell94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/MaxwellA93,
author = {Peter C. Maxwell and
Robert C. Aitken},
title = {Test Sets and Reject Rates: All Fault Coverages are Not Created Equal},
journal = {{IEEE} Des. Test Comput.},
volume = {10},
number = {1},
pages = {42--51},
year = {1993},
url = {https://doi.org/10.1109/54.199804},
doi = {10.1109/54.199804},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/MaxwellA93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaxwellA93,
author = {Peter C. Maxwell and
Robert C. Aitken},
title = {Biased Voting: {A} Method for Simulating {CMOS} Bridging Faults in
the Presence of Variable Gate Logic},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {63--72},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470717},
doi = {10.1109/TEST.1993.470717},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaxwellA93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Maxwell93,
author = {Peter C. Maxwell},
title = {Let's Grade {ALL} the Faults},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {595},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470647},
doi = {10.1109/TEST.1993.470647},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Maxwell93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MaxwellA92,
author = {Peter C. Maxwell and
Robert C. Aitken},
title = {{IDDQ} testing as a component of a test suite: The need for several
fault coverage metrics},
journal = {J. Electron. Test.},
volume = {3},
number = {4},
pages = {305--316},
year = {1992},
url = {https://doi.org/10.1007/BF00135334},
doi = {10.1007/BF00135334},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MaxwellA92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaxwellAJC92,
author = {Peter C. Maxwell and
Robert C. Aitken and
Vic Johansen and
Inshen Chiang},
title = {The Effectiveness of I\({}_{\mbox{DDQ}}\), Functional and Scan Tests:
How Many Fault Coverages Do We Need?},
booktitle = {Proceedings {IEEE} International Test Conference 1992, Discover the
New World of Test and Design, Baltimore, Maryland, USA, September
20-24, 1992},
pages = {168--177},
publisher = {{IEEE} Computer Society},
year = {1992},
url = {https://doi.org/10.1109/TEST.1992.527817},
doi = {10.1109/TEST.1992.527817},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaxwellAJC92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaxwellAJC91,
author = {Peter C. Maxwell and
Robert C. Aitken and
Vic Johansen and
Inshen Chiang},
title = {The Effect of Different Test Sets on Quality Level Prediction: When
is 80{\%} better than 90{\%}?},
booktitle = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
pages = {358--364},
publisher = {{IEEE} Computer Society},
year = {1991},
url = {https://doi.org/10.1109/TEST.1991.519695},
doi = {10.1109/TEST.1991.519695},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/MaxwellAJC91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Maxwell91,
author = {Peter C. Maxwell},
title = {The Interaction of Test and Quality},
booktitle = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
pages = {1120},
publisher = {{IEEE} Computer Society},
year = {1991},
url = {https://doi.org/10.1109/TEST.1991.519794},
doi = {10.1109/TEST.1991.519794},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Maxwell91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/eurodac/MaxwellW90,
author = {Peter C. Maxwell and
Hans{-}Joachim Wunderlich},
editor = {Gordon Adshead and
Jochen A. G. Jess},
title = {The effectiveness of different test sets for PLAs},
booktitle = {European Design Automation Conference, {EURO-DAC} 1990, Glasgow, Scotland,
UK, March 12-15, 1990},
pages = {628--632},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/EDAC.1990.136722},
doi = {10.1109/EDAC.1990.136722},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
biburl = {https://dblp.org/rec/conf/eurodac/MaxwellW90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/Maxwell88,
author = {Peter C. Maxwell},
title = {Comparative Analysis of Different Implementations of Multiple-Input
Signature Analyzers},
journal = {{IEEE} Trans. Computers},
volume = {37},
number = {11},
pages = {1411--1414},
year = {1988},
url = {https://doi.org/10.1109/12.8706},
doi = {10.1109/12.8706},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/Maxwell88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/McCreaMB78,
author = {Philip G. McCrea and
Peter C. Maxwell and
Paul W. Baker},
title = {Comments on "A Floating Point Multiplexed {DDA} System"},
journal = {{IEEE} Trans. Computers},
volume = {27},
number = {12},
pages = {1226},
year = {1978},
url = {https://doi.org/10.1109/TC.1978.1675033},
doi = {10.1109/TC.1978.1675033},
timestamp = {Mon, 25 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/McCreaMB78.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/Maxwell77,
author = {Peter C. Maxwell},
title = {Correct {DDA} Register Transfers for Trapezoidal Integration When
Solving Nonlinear Equations of the Form \emph{y = {A} y\({}^{\mbox{n}}\)}},
journal = {{IEEE} Trans. Computers},
volume = {26},
number = {11},
pages = {1151--1153},
year = {1977},
url = {https://doi.org/10.1109/TC.1977.1674764},
doi = {10.1109/TC.1977.1674764},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/Maxwell77.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/acj/MaxwellBM76,
author = {Peter C. Maxwell and
Paul W. Baker and
Philip G. McCrea},
title = {Incremental Computer Systems},
journal = {Aust. Comput. J.},
volume = {8},
number = {3},
pages = {97--102},
year = {1976},
timestamp = {Mon, 25 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/acj/MaxwellBM76.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ai/Maxwell74,
author = {Peter C. Maxwell},
title = {Alternative Descriptions in Line Drawing Analysis},
journal = {Artif. Intell.},
volume = {5},
number = {4},
pages = {325--348},
year = {1974},
url = {https://doi.org/10.1016/0004-3702(74)90001-0},
doi = {10.1016/0004-3702(74)90001-0},
timestamp = {Thu, 28 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ai/Maxwell74.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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