Physical Insights into High Current Collapse under ON-state Stress in RF GaN HEMTs - Amratansh Gupta; Hao Yu; Sachin Yadav; AliReza Alian; Uthavasankaran Peralagu; E.-San Jang; Ying-Chun Kuo; Nadine Collaert; Bertrand Parvais (IEEE International Reliability Physics Symposium, IRPS 2025, Monterey, CA, USA, March 30 - April 3, 2025, 2025)

Perspectives on GaN MISHEMT Power Amplifier Versus Positive Gate Bias Instability - Hao Yu; R. ElKashlan; Meng-Che Tsai; Yi Yang; Mamoun Guenach; Ying-Chun Kuo; Sachin Yadav; Barry J. O'Sullivan; Aarti Rathi; Amratansh Gupta; D. Xiao; Claude Desset; et al. (IEEE International Reliability Physics Symposium, IRPS 2025, Monterey, CA, USA, March 30 - April 3, 2025, 2025)

Evolution of GaN HEMT Small-Signal Parameters During Semi-on State for RF/MM-Wave Applications - Aarti Rathi; Barry J. O'Sullivan; R. ElKashlan; B. Kazemi Esfeh; Arturo Sibaja Hernandez; Hao Yu; AliReza Alian; Sachin Yadav; Uthayasankaran Peralagu; Adrian Vaisman Chasin; Bertrand Parvais; Nadine Collaert (IEEE International Reliability Physics Symposium, IRPS 2025, Monterey, CA, USA, March 30 - April 3, 2025, 2025)

Toward Understanding Stability of RF MIS-HEMTs Under ON/SEMI-ON/OFF-State Pulses with Scaling in-situ SiN Thicknesses - Yi Yang; Hao Yu; Meng-Che Tsai; Wei-Tung Lin; Ying-Chun Kuo; Barry J. O'Sullivan; Aarti Rathi; Amratansh Gupta; Sachin Yadav; AliReza Alian; Uthayasankaran Peralagu; Bertrand Parvais; et al. (IEEE International Reliability Physics Symposium, IRPS 2025, Monterey, CA, USA, March 30 - April 3, 2025, 2025)

DC Reliability Study of \text{high}-\kappa GaN-on-Si MOS-HEMT's for mm-Wave Power Amplifiers - Barry J. O'Sullivan; AliReza Alian; Arturo Sibaja Hernandez; Jacopo Franco; Sachin Yadav; Hao Yu; Aarti Rathi; Uthayasankaran Peralagu; Adrian Vaisman Chasin; Bertrand Parvais; Nadine Collaert (IEEE International Reliability Physics Symposium, IRPS 2024, Grapevine, TX, USA, April 14-18, 2024, 2024)

A Composite AlGaN/cGaN Back Barrier for mm-Wave GaN-on-Si HEMTs - Rana Y. El Kashlan; Hao Yu; Ahmad Khaled; Sachin Yadav; Uthayasankaran Peralagu; AliReza Alian; Nadine Collaert; Piet Wambacq; Bertrand Parvais (53rd IEEE European Solid-State Device Research Conference, ESSDERC 2023, Lisbon, Portugal, September 11-14, 2023, 2023)

A 28nm 6.5-8.1GHz 1.16mW/qubit Cryo-CMOS System-an-Chip for Superconducting Qubit Readout - Steven Van Winckel; Alican Çaglar; Benjamin Gys; Steven Brebels; Anton Potocnik; Bertrand Parvais; Piet Wambacq; Jan Craninckx (48th IEEE European Solid State Circuits Conference, ESSCIRC 2022, Milan, Italy, September 19-22, 2022, 2022)

III-V HBTs on 300 mm Si substrates using merged nano-ridges and its application in the study of impact of defects on DC and RF performance - Abhitosh Vais; Sachin Yadav; Yves Mols; Bjorn Vermeersch; Komal Vondkar Kodandarama; Marina Baryshnikova; G. Mannaert; R. Alcotte; Geert Boccardi; Piet Wambacq; Bertrand Parvais; R. Langer; et al. (52nd IEEE European Solid-State Device Research Conference, ESSDERC 2022, Milan, Italy, September 19-22, 2022, 2022)

Impact of channel thickness scaling on the performance of GaN-on-Si RF HEMTs on highly C-doped GaN buffer - AliReza Alian; Raúl Rodríguez; Sachin Yadav; Uthayasankaran Peralagu; Arturo Sibaja Hernandez; Vamsi Putcha; Ming Zhao; Rana Y. El Kashlan; Bjorn Vermeersch; Hao Yu; Erik Bury; Ahmad Khaled; et al. (52nd IEEE European Solid-State Device Research Conference, ESSDERC 2022, Milan, Italy, September 19-22, 2022, 2022)

Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors - Alexander Grill; V. John; Jakob Michl; A. Beckers; Erik Bury; Stanislav Tyaginov; Bertrand Parvais; Adrian Vaisman Chasin; Tibor Grasser; Michael Waltl; Ben Kaczer; Bogdan Govoreanu (IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022, 2022)

Interpretation and modelling of dynamic-RON kinetics in GaN-on-Si HEMTs for mm-wave applications - Vamsi Putcha; Hao Yu; Jacopo Franco; Sachin Yadav; AliReza Alian; Uthayasankaran Peralagu; Bertrand Parvais; Nadine Collaert (IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022, 2022)

Impact of III-N buffer layers on RF losses and harmonic distortion of GaN-on-Si Substrates - Pieter Cardinael; Sachin Yadav; Ming Zhao; Martin Rack; Dimitri Lederer; Nadine Collaert; Bertrand Parvais; Jean-Pierre Raskin (51st IEEE European Solid-State Device Research Conference, ESSDERC 2021, Grenoble, France, September 13-22, 2021, 2021)

CMOS compatible GaN-on-Si HEMT technology for RF applications: analysis of substrate losses and non-linearities - Sachin Yadav; Pieter Cardinael; Ming Zhao; Komal Vondkar; Uthayasankaran Peralagu; AliReza Alian; Ahmad Khaled; Sergej Makovejev; Enrique Ekoga; Dimitri Lederer; Jean-Pierre Raskin; Bertrand Parvais; et al. (International Conference on IC Design and Technology, ICICDT 2021, Dresden, Germany, September 15-17, 2021, 2021)

Understanding the memory window in 1T-FeFET memories: a depolarization field perspective - K. Kaczmarek; Marie Garcia Bardon; Y. Xiang; Laurent Breuil; Nicolo Ronchi; Bertrand Parvais; Guido Groeseneken; Jan Van Houdt (IEEE International Memory Workshop, IMW 2021, Dresden, Germany, May 16-19, 2021, 2021)

On the impact of buffer and GaN-channel thickness on current dispersion for GaN-on-Si RF/mmWave devices - Vamsi Putcha; Liang Cheng; AliReza Alian; Ming Zhao; Hai Lu; Bertrand Parvais; Niamh Waldron; Dimitri Linten; Nadine Collaert (IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021, 2021)

Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies - Gerhard Rzepa; Markus Karner; Oskar Baumgartner; Georg Strof; Franz Schanovsky; Ferdinand Mitterbauer; Christian Kernstock; Hui-Wen Karner; Pieter Weckx; Geert Hellings; Dieter Claes; Zhicheng Wu; et al. (IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021, 2021)

A BSIM-Based Predictive Hot-Carrier Aging Compact Model - Yang Xiang; Stanislav Tyaginov; Michiel Vandemaele; Zhicheng Wu; Jacopo Franco; Erik Bury; Brecht Truijen; Bertrand Parvais; Dimitri Linten; Ben Kaczer (IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021, 2021)

Solid state qubits: how learning from CMOS fabrication can speed-up progress in Quantum Computing - Iuliana P. Radu; Roy Li; Anton Potocnik; Tsvetan Ivanov; Danny Wan; Stefan Kubicek; Nard I. Dumoulin Stuyck; Jeroen Verjauw; Julien Jussot; Yann Canvel; Clement Godfrin; Massimo Mongillo; et al. (2021 Symposium on VLSI Circuits, Kyoto, Japan, June 13-19, 2021, 2021)

Device Scaling roadmap and its implications for Logic and Analog platform - Alessio Spessot; Bertrand Parvais; Amita Rawat; Kenichi Miyaguchi; Pieter Weckx; Doyoung Jang; Julien Ryckaert (IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2020, Monterey, CA, USA, November 16-19, 2020, 2020)

Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures - Alexander Grill; Erik Bury; Jakob Michl; Stanislav Tyaginov; Dimitri Linten; Tibor Grasser; Bertrand Parvais; Ben Kaczer; Michael Waltl; Iuliana P. Radu (2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, 2020)

Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applications - Vamsi Putcha; Erik Bury; Jacopo Franco; Amey Walke; Simeng Zhao; Uthayasankaran Peralagu; Ming Zhao; AliReza Alian; Ben Kaczer; Niamh Waldron; Dimitri Linten; Bertrand Parvais; et al. (2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, 2020)

Understanding the Impact of Time-Dependent Random Variability on Analog ICs: From Single Transistor Measurements to Circuit Simulations - Marko Simicic; Pieter Weckx; Bertrand Parvais; Philippe Roussel; Ben Kaczer; Georges G. E. Gielen (IEEE Trans. Very Large Scale Integr. Syst., 2019)

Design of a 28 GHz differential GaAs power amplifier with capacitive neutralization for 5G mmwave applications - Dongyang Yan; Mark Ingels; Giovanni Mangraviti; Yao Liu; Bertrand Parvais; Niamh Waldron; Nadine Collaert; Piet Wambacq (17th IEEE International New Circuits and Systems Conference, NEWCAS 2019, Munich, Germany, June 23-26, 2019, 2019)

A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability - Ben Kaczer; Jacopo Franco; Pieter Weckx; Philippe Roussel; Vamsi Putcha; Erik Bury; Marko Simicic; Adrian Vaisman Chasin; Dimitri Linten; Bertrand Parvais; Francky Catthoor; Gerhard Rzepa; et al. (Microelectron. Reliab., 2018)

Scaling CMOS beyond Si FinFET: an analog/RF perspective - Bertrand Parvais; Geert Hellings; Marko Simicic; Pieter Weckx; Jérôme Mitard; Doyoung Jang; V. Deshpande; B. van Liempc; Anabela Veloso; A. Vandooren; Niamh Waldron; Piet Wambacq; et al. (48th European Solid-State Device Research Conference, ESSDERC 2018, Dresden, Germany, September 3-6, 2018, 2018)

Sequential 3D: Key integration challenges and opportunities for advanced semiconductor scaling - A. Vandooren; Liesbeth Witters; Jacopo Franco; Arindam Mallik; Bertrand Parvais; Z. Wu; Amey Walke; V. Deshpande; E. Rosseel; Andriy Hikavyy; W. Li; L. Peng; et al. (2018 International Conference on IC Design & Technology, ICICDT 2018, Otranto, Italy, June 4-6, 2018, 2018)

Back-gate bias effect on UTBB-FDSOI non-linearity performance - B. Kazemi Esfeh; Valeria Kilchytska; Bertrand Parvais; Nicolas Planes; M. Haond; Denis Flandre; Jean-Pierre Raskin (47th European Solid-State Device Research Conference, ESSDERC 2017, Leuven, Belgium, September 11-14, 2017, 2017)

A 42 mW 200 fs-Jitter 60 GHz Sub-Sampling PLL in 40 nm CMOS - Viki Szortyka; Qixian Shi; Kuba Raczkowski; Bertrand Parvais; Maarten Kuijk; Piet Wambacq (IEEE J. Solid State Circuits, 2015)

A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS - Bertrand Parvais; Piet Wambacq; Abdelkarim Mercha; Diederik Verkest; Aaron Thean; Ken Sawada; Kazuki Nomoto; Tetsuya Oishi; Hiroaki Ammo (IEEE Asian Solid-State Circuits Conference, A-SSCC 2015, Xia'men, China, November 9-11, 2015, 2015)

Modeling FinFET metal gate stack resistance for 14nm node and beyond - Kenichi Miyaguchi; Bertrand Parvais; Lars-Åke Ragnarsson; Piet Wambacq; Praveen Raghavan; Abdelkarim Mercha; Anda Mocuta; Diederik Verkest; Aaron Thean (2015 International Conference on IC Design & Technology, ICICDT 2015, Leuven, Belgium, June 1-3, 2015, 2015)

Design Technology co-optimization for N10 - Julien Ryckaert; Praveen Raghavan; Rogier Baert; Marie Garcia Bardon; Mircea Dusa; Arindam Mallik; Sushil Sakhare; Boris Vandewalle; Piet Wambacq; Bharani Chava; Kris Croes; Morin Dehan; et al. (Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014, San Jose, CA, USA, September 15-17, 2014, 2014)

14.2 A 79GHz phase-modulated 4GHz-BW CW radar TX in 28nm CMOS - Vito Giannini; Davide Guermandi; Qixian Shi; Kristof Vaesen; Bertrand Parvais; Wim Van Thillo; André Bourdoux; Charlotte Soens; Jan Craninckx; Piet Wambacq (2014 IEEE International Conference on Solid-State Circuits Conference, ISSCC 2014, Digest of Technical Papers, San Francisco, CA, USA, February 9-13, 2014, 2014)

21.4 A 42mW 230fs-jitter sub-sampling 60GHz PLL in 40nm CMOS - Viki Szortyka; Qixian Shi; Kuba Raczkowski; Bertrand Parvais; Maarten Kuijk; Piet Wambacq (2014 IEEE International Conference on Solid-State Circuits Conference, ISSCC 2014, Digest of Technical Papers, San Francisco, CA, USA, February 9-13, 2014, 2014)

CMOS low-power transceivers for 60GHz multi Gbit/s communications - Vojkan Vidojkovic; Viki Szortyka; Khaled Khalaf; Giovanni Mangraviti; Bertrand Parvais; Kristof Vaesen; Steven Brebels; Annachiara Spagnolo; Michael Libois; John R. Long; Kuba Raczkowski; Praveen Raghavan; et al. (Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, CICC 2013, San Jose, CA, USA, September 22-25, 2013, 2013)

A low-power radio chipset in 40nm LP CMOS with beamforming for 60GHz high-data-rate wireless communication - Vojkan Vidojkovic; Viki Szortyka; Khaled Khalaf; Giovanni Mangraviti; Steven Brebels; Wim Van Thillo; Kristof Vaesen; Bertrand Parvais; Vadim Issakov; Mike Libois; Michiaki Matsuo; John R. Long; et al. (2013 IEEE International Solid-State Circuits Conference - Digest of Technical Papers, ISSCC 2013, San Francisco, CA, USA, February 17-21, 2013, 2013)

A low-power 57-to-66GHz transceiver in 40nm LP CMOS with -17dB EVM at 7Gb/s - Vojkan Vidojkovic; Giovanni Mangraviti; Khaled Khalaf; Viki Szortyka; Kristof Vaesen; Wim Van Thillo; Bertrand Parvais; Mike Libois; Steven Thijs; John R. Long; Charlotte Soens; Piet Wambacq (2012 IEEE International Solid-State Circuits Conference, ISSCC 2012, San Francisco, CA, USA, February 19-23, 2012, 2012)

A 40 nm LP CMOS PLL for high-speed mm-wave communication - Bertrand Parvais; Karen Scheir; Vojkan Vidojkovic; R. Vandebriel; Gerd Vandersteen; Charlotte Soens; Piet Wambacq (36th European Solid-State Circuits Conference, ESSCIRC 2010, Sevilla, Spain, September 13-17, 2010, 2010)

Identifying the Bottlenecks to the RF Performance of FinFETs - Vaidyanathan Subramanian; Abdelkarim Mercha; Bertrand Parvais; Morin Dehan; Guido Groeseneken; Willy M. C. Sansen; Stefaan Decoutere (VLSI Design 2010: 23rd International Conference on VLSI Design, 9th International Conference on Embedded Systems, Bangalore, India, 3-7 January 2010, 2010)

Design of Ultra-Wideband Low-Noise Amplifiers in 45-nm CMOS Technology: Comparison Between Planar Bulk and SOI FinFET Devices - Davide Ponton; Pierpaolo Palestri; David Esseni; Luca Selmi; Marc Tiebout; Bertrand Parvais; Domagoj Siprak; Gerhard Knoblinger (IEEE Trans. Circuits Syst. I Regul. Pap., 2009)

Migrating from planar to FinFET for further CMOS scaling: SOI or bulk? - Thomas Chiarella; Liesbeth Witters; Abdelkarim Mercha; Christoph Kerner; Rok Dittrich; Michal Rakowski; Claude Ortolland; Lars-Åke Ragnarsson; Bertrand Parvais; An De Keersgieter; Stefan Kubicek; Augusto Redolfi; et al. (35th European Solid-State Circuits Conference, ESSCIRC 2009, Athens, Greece, 14-18 September 2009, 2009)

FinFET RF receiver building blocks operating above 10 GHz - Domagoj Siprak; Piet Wambacq; Bertrand Parvais; Abdelkarim Mercha; Michael Fulde; Jesenka Veledar Kruger; Morin Dehan; Stefaan Decoutere (35th European Solid-State Circuits Conference, ESSCIRC 2009, Athens, Greece, 14-18 September 2009, 2009)

Design of UWB LNA in 45nm CMOS technology: Planar bulk vs. FinFET - Davide Ponton; Pierpaolo Palestri; David Esseni; Luca Selmi; Marc Tiebout; Bertrand Parvais; Gerhard Knoblinger (International Symposium on Circuits and Systems (ISCAS 2008), 18-21 May 2008, Sheraton Seattle Hotel, Seattle, Washington, USA, 2008)

Advanced Planar Bulk and Multigate CMOS Technology: Analog-Circuit Benchmarking up to mm-Wave Frequencies - Piet Wambacq; Abdelkarim Mercha; Karen Scheir; Bob Verbruggen; Jonathan Borremans; Vincent De Heyn; Steven Thijs; Dimitri Linten; Geert Van der Plas; Bertrand Parvais; Morin Dehan; Stefaan Decoutere; et al. (2008 IEEE International Solid-State Circuits Conference, ISSCC 2008, Digest of Technical Papers, San Francisco, CA, USA, February 3-7, 2008, 2008)

The Potential of FinFETs for Analog and RF Circuit Applications - Piet Wambacq; Bob Verbruggen; Karen Scheir; Jonathan Borremans; Morin Dehan; Dimitri Linten; Vincent De Heyn; Geert Van der Plas; Abdelkarim Mercha; Bertrand Parvais; Cedric Gustin; Vaidyanathan Subramanian; et al. (IEEE Trans. Circuits Syst. I Regul. Pap., 2007)

An Accurate Scalable Compact Model for the Substrate Resistance of RF MOSFETs - Bertrand Parvais; S. Hu; Morin Dehan; Abdelkarim Mercha; Stefaan Decoutere (Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, CICC 2007, DoubleTree Hotel, San Jose, California, USA, September 16-19, 2007, 2007)

Analog design challenges and trade-offs using emerging materials and devices - Michael Fulde; Abdelkarim Mercha; Cedric Gustin; Bertrand Parvais; Vaidyanathan Subramanian; Klaus von Arnim; Florian Bauer; Klaus Schruefer; Doris Schmitt-Landsiedel; Gerhard Knoblinger (33rd European Solid-State Circuits Conference, ESSCIRC 2007, Munich, Germany, 11-13 September 2007, 2007)

FinFET technology for analog and RF circuits - Bertrand Parvais; Vaidyanathan Subramanian; Abdelkarim Mercha; Morin Dehan; Piet Wambacq; Willy Sansen; Guido Groeseneken; Stefaan Decoutere (14th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2007, Marrakech, Morocco, December 11-14, 2007, 2007)