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2020 – today
- 2023
[j16]Hyunjin You, Doochan Ko
, Daniel Kim, Richard Wong, Inwhee Joe:
Dynamic access control method for SDP-based network environments. EURASIP J. Wirel. Commun. Netw. 2023(1): 94 (2023)- 2020
- [j15]Mohammad Kazem Chamran, Kok-Lim Alvin Yau, Rafidah Md. Noor, Richard Wong:
A Distributed Testbed for 5G Scenarios: An Experimental Study. Sensors 20(1): 18 (2020)
2010 – 2019
- 2019
- [j14]Somnath Kundu, Muqing Liu, Shi-Jie Wen, Richard Wong, Chris H. Kim:
A Fully Integrated Digital LDO With Built-In Adaptive Sampling and Active Voltage Positioning Using a Beat-Frequency Quantizer. IEEE J. Solid State Circuits 54(1): 109-120 (2019) - [c22]Jingchen Cao, Lyuan Xu, Bharat L. Bhuva, Shi-Jie Wen, Richard Wong, Balaji Narasimham, Lloyd W. Massengill:
Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies. IRPS 2019: 1-5 - [c21]Lyuan Xu, Jingchen Cao, Bharat L. Bhuva, Indranil Chatterjee, Shi-Jie Wen, Richard Wong, Lloyd W. Massengill:
Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology. IRPS 2019: 1-5 - 2018
- [j13]Chul Seung Lim, Kyungbae Park, GeunYong Bak, Donghyuk Yun, Myungsang Park, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong:
Study of proton radiation effect to row hammer fault in DDR4 SDRAMs. Microelectron. Reliab. 80: 85-90 (2018) - [j12]Yuanqing Li, Li Chen, Issam Nofal, Mo Chen, Haibin Wang, Rui Liu, Qingyu Chen, Milos Krstic, Shuting Shi, Gang Guo, Sang H. Baeg, Shi-Jie Wen, Richard Wong:
Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree. Microelectron. Reliab. 87: 24-32 (2018) - [c20]Kurt J. Lezon, Shi-Jie Wen, Y.-F. Dan, Richard Wong, Bharat L. Bhuva:
Single-event effects on optical transceiver. IRPS 2018: 6-1 - [c19]Somnath Kundu, Muqing Liu, Richard Wong, Shi-Jie Wen, Chris H. Kim:
A fully integrated 40pF output capacitor beat-frequency-quantizer-based digital LDO with built-in adaptive sampling and active voltage positioning. ISSCC 2018: 308-310 - 2017
- [c18]Yi Luo, Adrian Evans, Shi-Jie Wen, Rick Wong, GengSheng Chen:
IZIP: In-place zero overhead interconnect protection via PIP redundancy. ASICON 2017: 565-568 - [c17]Issam Nofal, Adrian Evans, Anlin He, Gang Guo, Yuanqing Li, Li Chen, Rui Liu, Haibin Wang, Mo Chen, Sang H. Baeg, Shi-Jie Wen, Richard Wong:
BPPT - Bulk potential protection technique for hardened sequentials. IOLTS 2017: 28-32 - 2016
- [c16]Shengyu Duan, Basel Halak, Rick Wong, Mark Zwolinski:
NBTI Lifetime Evaluation and Extension in Instruction Caches. ERMAVSS@DATE 2016: 9-12 - [c15]Pierre-Yves Laffont, Tobias Martin, Markus H. Gross, Wei De Tan, C. T. Lim, Affa Au, Rick Wong:
Rectifeye: a vision-correcting system for virtual reality. SIGGRAPH Asia Posters 2016: 8 - [c14]Pierre-Yves Laffont, Tobias Martin, Markus H. Gross, Wei De Tan, C. T. Lim, Affa Au, Rick Wong:
Rectifeye: a vision-correcting system for virtual reality. SIGGRAPH ASIA VR Showcase 2016: 13:1-13:2 - 2015
- [j11]Sheng Wang, Adrian Evans, Shi-Jie Wen, Rick Wong, GengSheng Chen:
New insights into the impact of SEUs in FPGA CRAMs. IEICE Electron. Express 12(6): 20150110 (2015) - [c13]GeunYong Bak, Soonyoung Lee, Hosung Lee, Kyungbae Park, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Charlie Slayman:
Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams. IRPS 2015: 3 - [c12]Nihaar N. Mahatme, Bharat L. Bhuva, Nelson J. Gaspard, T. Assis, Y. Xu, P. Marcoux, M. Vilchis, Balaji Narasimham, A. Shih, Shi-Jie Wen, Rick Wong, N. Tam, M. Shroff, S. Koyoma, A. Oates:
Terrestrial SER characterization for nanoscale technologies: A comparative study. IRPS 2015: 4 - [c11]Rui Liu, Adrian Evans, Qiong Wu, Yuanqing Li, Li Chen, Shi-Jie Wen, Rick Wong, Rita Fung:
Analysis of advanced circuits for SET measurement. IRPS 2015: 7 - 2014
- [j10]Yi Ren, Anlin He, Shuting Shi, Gang Guo, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Bharat L. Bhuva:
Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser. J. Electron. Test. 30(1): 149-154 (2014) - [j9]Haibin Wang, Mulong Li, Li Chen, Rui Liu, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Rita Fung, Jinshun Bi:
Single Event Resilient Dynamic Logic Designs. J. Electron. Test. 30(6): 751-761 (2014) - [c10]Hao Xie, Li Chen, Rui Liu, Adrian Evans, Dan Alexandrescu, Shi-Jie Wen, Rick Wong:
New approaches for synthesis of redundant combinatorial logic for selective fault tolerance. IOLTS 2014: 62-68 - 2013
- [j8]Yi Ren, Shuting Shi, Li Chen, Haibin Wang, L.-J. Gao, Gang Guo, Shi-Jie Wen, Richard Wong, N. W. van Vonno:
Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller. J. Electron. Test. 29(4): 609-616 (2013) - [j7]Juan Antonio Maestro, Pedro Reviriego, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong:
Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplication. Microprocess. Microsystems 37(8-D): 1103-1107 (2013) - [c9]Richard Wong, Rita Fung, Shi-Jie Wen:
Networking industry trends in ESD protection for high speed IOs. ASICON 2013: 1-4 - [c8]Michael J. Wirthlin, Joshua E. Jensen, Alex Wilson, William Howes, Shi-Jie Wen, Rick Wong:
Placement of repair circuits for in-field FPGA repair. FPGA 2013: 115-124 - [c7]Hao Xie, Li Chen, Adrian Evans, Shi-Jie Wen, Rick Wong:
Synthesis of Redundant Combinatorial Logic for Selective Fault Tolerance. PRDC 2013: 128-129 - 2012
- [j6]Yi Ren, L. Fan, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Arthur F. Witulski, Bharat L. Bhuva:
Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter. J. Electron. Test. 28(6): 877-883 (2012) - [j5]David Rennie, David Li, Manoj Sachdev, Bharat L. Bhuva, Srikanth Jagannathan, Shi-Jie Wen, Richard Wong:
Performance, Metastability, and Soft-Error Robustness Trade-offs for Flip-Flops in 40 nm CMOS. IEEE Trans. Circuits Syst. I Regul. Pap. 59-I(8): 1626-1634 (2012) - [c6]Ju-Yueh Lee, Cheng-Ru Chang, Naifeng Jing, Juexiao Su, Shi-Jie Wen, Rick Wong, Lei He:
Heterogeneous configuration memory scrubbing for soft error mitigation in FPGAs. FPT 2012: 23-28 - 2011
- [j4]Jian Liu, Xin Wang, Hui Zhao, Qiang Fang, Albert Z. Wang, Lin Lin, He Tang, Siqiang Fan, Bin Zhao, Shi-Jie Wen, Richard Wong:
Design and Analysis of Low-Voltage Low-Parasitic ESD Protection for RF ICs in CMOS. IEEE J. Solid State Circuits 46(5): 1100-1110 (2011) - [j3]Juan Antonio Maestro, Pedro Reviriego, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong:
Mitigating the effects of large multiple cell upsets (MCUs) in memories. ACM Trans. Design Autom. Electr. Syst. 16(4): 45:1-45:10 (2011) - [c5]David Rennie, David Li, Manoj Sachdev, Bharat L. Bhuva, Srikanth Jagannathan, Shi-Jie Wen, Rick Wong:
Performance, metastability and soft-error robustness tradeoffs for flip-flops in 40nm CMOS. CICC 2011: 1-4 - [c4]Massoud Mokhtarpour Ghahroodi, Mark Zwolinski, Rick Wong, Shi-Jie Wen:
Timing Vulnerability Factors of Ultra Deep-sub-micron CMOS. ETS 2011: 202 - [c3]Naifeng Jing, Ju-Yueh Lee, Zhe Feng, Weifeng He, Zhigang Mao, Shi-Jie Wen, Rick Wong, Lei He:
Quantitative SEU Fault Evaluation for SRAM-Based FPGA Architectures and Synthesis Algorithms. FPL 2011: 282-285 - [c2]Changmin Jung, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong:
Design method of NOR-type comparison circuit in CAM with ground bounce noise considerations. ISQED 2011: 390-397 - 2010
- [j2]Sanghyeon Baeg, Shi-Jie Wen, Richard Wong:
Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals. IEEE Trans. Circuits Syst. I Regul. Pap. 57-I(4): 814-822 (2010)
2000 – 2009
- 2008
- [c1]Damien Leroy, Rémi Gaillard, Erwin Schäfer, Cyrille Beltrando, Shi-Jie Wen, Richard Wong:
Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node. IOLTS 2008: 253-257
1990 – 1999
- 1998
- [j1]Richard Wong, Rodney W. Topor, Hong Shen:
A parallel sort-balance mutual range-join algorithm on hypercube computers. Microprocess. Microsystems 22(3-4): 209-215 (1998)
Coauthor Index
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