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ORCIDHassan A. Farhat
Person information
- affiliation: University of Nebraska, Omaha, Nebraska, USA
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2010 – 2019
- 2015
[j6]A. Yagub, Hassan Farhat, S. Kondaraju, T. Singh:
A lattice Boltzmann model for substrates with regularly structured surface roughness. J. Comput. Phys. 301: 402-414 (2015)
2000 – 2009
- 2009
- [c16]Hassan Farhat:
Transformations and Basis in the Computer Graphics Viewing Pipeline. FECS 2009: 267-271 - [c15]Hassan Farhat:
An Efficient Algorithm for Determining Polygon Points Ordering. FECS 2009: 278-281 - 2008
- [c14]Hassan Farhat:
An Interactive Computer Design in Multisim. CATA 2008: 281-286 - [c13]Hassan Farhat:
Integrating electronics in computer science under curricula constraints, a comparative study. EIT 2008: 140-144 - [c12]Hassan Farhat:
A Simple Computer Design with Monitor Interface: Integrating Hardware and Software in Early Research in Computer Science. ICSNC 2008: 218-222 - 2005
- [c11]Hassan Farhat:
Graph Partitioning for Circuit Testability. CAINE 2005: 280-284 - [c10]Hassan Farhat:
Integrating Hardware and Software in Early Research in Computer Science. CAINE 2005: 390-394 - 2001
- [c9]Hassan Farhat:
Combining the Hardware Track in a Single Migration Course. IS 2001: 134-139 - [c8]Hassan Farhat:
A Mathematical Foundation Course for Undergraduate Degree in Information Technology. IS 2001: 140-143 - [c7]Hassan Farhat:
Test Generation for VLSI Circuits from Testability Profile Distribution. CAINE 2001: 201-204 - [c6]Hassan Farhat:
A Polygon Scan Algorithm Independent of the Use of an Active Edge List. CAINE 2001: 283-286
1990 – 1999
- 1994
- [j5]Hassan Farhat, Steven G. From:
A Quadratic Programming Approach to Estimating the Testability and Random or Deterministic Coverage of a VLSl Circuit. VLSI Design 2(3): 223-231 (1994) - 1993
- [j4]Hassan A. Farhat, Steven G. From:
A beta model for estimating the testability and coverage distributions of a VLSI circuit. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(4): 550-554 (1993) - 1992
- [j3]Hassan A. Farhat, Steven G. From, Antonio Lioy
:
A quadratic programming approach to estimating the testability and coverage distributions of a VLSI circuit. Microprocess. Microprogramming 35(1-5): 479-483 (1992) - [j2]Hassan Farhat, Steven G. From:
Bounds on population coverage using test generation by fault sampling. Microprocess. Microsystems 16(5): 269-275 (1992) - [c5]Mansour Kazerooni-Zand, Hassan Farhat, Hossein Saiedian:
Persistent structures to store moving images. SAC 1992: 21-27 - [c4]Hassan Farhat, Mansour Zand, Hossein Saiedian:
Estimating testability and coverage distributions of a VLSI circuit from a mixture of discrete and continuous functions. SAC 1992: 433-437 - 1991
- [c3]Hassan A. Farhat, H. Saidian:
Testability profile estimation of VLSI circuits from fault coverage. Great Lakes Symposium on VLSI 1991: 238-242 - [c2]Hossein Saiedian, Hassan Farhat:
A team-oriented, project-intensive database course. SIGCSE 1991: 192-198 - 1990
- [j1]Sharad C. Seth, Vishwani D. Agrawal, Hassan Farhat:
A Statistical Theory of Digital Circuit Testability. IEEE Trans. Computers 39(4): 582-586 (1990)
1980 – 1989
- 1988
- [c1]Vishwani D. Agrawal, Hassan Farhat, Sharad Seth:
Test generation by fault sampling. ICCD 1988: 58-61
Coauthor Index
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