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ORCIDTaiki Uemura
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2020 – today
- 2024
[c23]Taiki Uemura, Byungjin Chung, Jaehee Choi, Seungbae Lee, Shin-Young Chung, Yuchul Hwang, Sangwoo Pae:
Soft-Error Sensitivity in SRAM Manufactured by Bulk Gate-All-Around (GAA) Technology. IRPS 2024: 1-6- [c22]Taiki Uemura, Byungjin Chung, Jaehee Choi, Seungbae Lee, Shin-Young Chung, Yuchul Hwang, Sangwoo Pae:
Comprehensive Study of SER in FDSOI-Planar: 28 nm to 18 nm Scaling Effect and Temperature Dependence. IRPS 2024: 1-5 - 2023
- [c21]SungMan Rhee, Hyunjin Kim, Sangku Park, Taiki Uemura, Yuchul Hwang, Seungjin Choo, Jinju Kim, Hwasung Rhee, Shin-Young Chung:
Machine Learning Based V-ramp VBD Predictive Model Using OCD-measured Fab Parameters for Early Detection of MOL Reliability Risk. IRPS 2023: 1-4 - [c20]Taiki Uemura, Byungjin Chung, Shin-Young Chung, Seungbae Lee, Yuchul Hwang, Sangwoo Pae:
Impact of Design and Process on Alpha-Induced SER in 4 nm Bulk-FinFET SRAM. IRPS 2023: 1-8 - 2022
- [c19]Taiki Uemura, Byungjin Chung, Jegon Kim, Hyewon Shim, Shin-Young Chung, Brandon Lee, Jaehee Choi, Shota Ohnishi, Ken Machida:
Thermal-Neutron SER Mitigation by Cobalt-Contact in 7 nm Bulk-FinFET Technology. IRPS 2022: 7 - [c18]Taiki Uemura, Byungjin Chung, Jegon Kim, Hyewon Shim, Shin-Young Chung, Brandon Lee, Jaehee Choi, Shota Ohnishi, Ken Machida:
Accelerator-Based Thermal-Neutron Beam by Compact and Low-Cost Moderator for Soft-Error Evaluation in Semiconductor Devices. IRPS 2022: 53-1 - 2021
- [c17]Taiki Uemura, Byungjin Chung, Jeongmin Jo, Mijoung Kim, Dalhee Lee, Gunrae Kim, Seungbae Lee, Taesjoong Song, Hwasung Rhee, Brandon Lee, Jaehee Choi:
Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology. IRPS 2021: 1-7 - 2020
- [c16]Tae-Young Jeong, Miji Lee, Yunkyung Jo, Jinwoo Kim, Min Kim, Myungsoo Yeo, Jinseok Kim, Hyunjun Choi, Joosung Kim, Yoojin Jo, Yongsung Ji, Taiki Uemura, Hai Jiang, Dongkyun Kwon, HwaSung Rhee, Sangwoo Pae, Brandon Lee:
Reliability on EUV Interconnect Technology for 7nm and beyond. IRPS 2020: 1-4 - [c15]Yongsung Ji, Hyunjae Goo, Jungman Lim, Tae-Young Jeong, Taiki Uemura, Gun Rae Kim, Boil Seo, Seungbae Lee, Goeun Park, Jeongmin Jo, Sang-Il Han, Kilho Lee, Junghyuk Lee, Sohee Hwang, Daesop Lee, Suksoo Pyo, Hyun Taek Jung, Shinhee Han, Seungmo Noh, Kiseok Suh, Sungyoung Yoon, Hyeonwoo Nam, Hyewon Hwang, Hai Jiang, J. W. Kim, D. Kwon, Yoonjong Song, K. H. Koh, Hwasung Rhee, Sangwoo Pae, E. Lee:
Reliability of Industrial grade Embedded-STT-MRAM. IRPS 2020: 1-3 - [c14]Hai Jiang
, Hyun-Chul Sagong, Jinju Kim, Hyewon Shim, Yoohwan Kim, Junekyun Park, Taiki Uemura, Yongsung Ji, Taeyoung Jeong, Dongkyun Kwon, Hwasung Rhee, Sangwoo Pae, Brandon Lee:
Advanced Self-heating Model and Methodology for Layout Proximity Effect in FinFET Technology. IRPS 2020: 1-5 - [c13]Heung-Kook Ko, Sena Park, Jihyun Ryu, Sung Ryul Kim, Giwon Lee, Dongjoon Lee, Sangwoo Pae, Euncheol Lee, Yongsun Ji, Hai Jiang, Taeyoung Jeong, Taiki Uemura, Dongkyun Kwon, Hyungrok Do, Hyungu Kahng, Yoon-Sang Cho, Jiyoon Lee, Seoung Bum Kim:
Early Diagnosis and Prediction of Wafer Quality Using Machine Learning on sub-10nm Logic Technology. IRPS 2020: 1-5 - [c12]Taiki Uemura, Byungjin Chung, Jeongmin Jo, Hai Jiang, Yongsung Ji, Tae-Young Jeong, Rakesh Ranjan, Seungbae Lee, Hwasung Rhee, Sangwoo Pae, Euncheol Lee, Jaehee Choi, Shota Ohnishi, Ken Machida:
Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM. IRPS 2020: 1-4 - [c11]Taiki Uemura, Byungjin Chung, Jeongmin Jo, Hai Jiang, Yongsung Ji, Tae-Young Jeong, Rakesh Ranjan, Youngin Park, Kiil Hong, Seungbae Lee, Hwasung Rhee, Sangwoo Pae, Euncheol Lee, Jaehee Choi, Shota Ohnishi, Ken Machida:
Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET. IRPS 2020: 1-5
2010 – 2019
- 2019
- [c10]Y. Ji, H. J. Goo, J. Lim, S. B. Lee, S. Lee, Taiki Uemura, J. C. Park, S. I. Han, S. C. Shin, J. H. Lee, Y. J. Song, K. M. Lee, H. M. Shin, S. H. Hwang, B. Y. Seo, Y. K. Lee, J. C. Kim, Gwanhyeob Koh, K. C. Park, Sangwoo Pae, Gi-Tae Jeong, J. S. Yoon, E. S. Jung:
Reliability of 8Mbit Embedded-STT-MRAM in 28nm FDSOI Technology. IRPS 2019: 1-3 - [c9]Taiki Uemura, Soonyoung Lee, Dahye Min, Ihlhwa Moon, Seungbae Lee, Sangwoo Pae:
SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET. IRPS 2019: 1-6 - 2018
- [c8]Taiki Uemura, Soonyoung Lee, Dahye Min, Ihlhwa Moon, Jungman Lim, Seungbae Lee, Hyun-Chul Sagong, Sangwoo Pae:
Investigation of alpha-induced single event transient (SET) in 10 nm FinFET logic circuit. IRPS 2018: 1 - 2015
- [c7]Taiki Uemura, Masanori Hashimoto:
Investigation of single event upset and total ionizing dose in FeRAM for medical electronic tag. IRPS 2015: 1 - [c6]Hiroko Mori, Taiki Uemura, Hideya Matsuyama, Shin-ichiro Abe, Yukinobu Watanabe:
Critical charge dependence of correlation of different neutron sources for soft error testing. IRPS 2015: 2 - [c5]Taiki Uemura, Takashi Kato, Hideya Matsuyama, Masanori Hashimoto:
Soft error immune latch design for 20 nm bulk CMOS. IRPS 2015: 4 - [c4]Taiki Uemura, Takashi Kato, Hideya Matsuyama, Masanori Hashimoto:
Impact of package on neutron induced single event upset in 20 nm SRAM. IRPS 2015: 9 - 2014
- [j1]Ryuji Kan, Tomohiro Tanaka, Go Sugizaki, Kinya Ishizaka, Ryuichi Nishiyama, Sota Sakabayashi, Yoichi Koyanagi, Ryuji Iwatsuki, Kazumi Hayasaka, Taiki Uemura, Gaku Ito, Yoshitomo Ozeki, Hiroyuki Adachi, Kazuhiro Furuya, Tsuyoshi Motokurumada:
The 10th Generation 16-Core SPARC64™ Processor for Mission Critical UNIX Server. IEEE J. Solid State Circuits 49(1): 32-40 (2014) - 2013
- [c3]Ryuji Kan, Tomohiro Tanaka, Go Sugizaki, Ryuichi Nishiyama, Sota Sakabayashi, Yoichi Koyanagi, Ryuji Iwatsuki, Kazumi Hayasaka, Taiki Uemura, Gaku Ito, Yoshitomo Ozeki, Hiroyuki Adachi, Kazuhiro Furuya, Tsuyoshi Motokurumada:
A 10th generation 16-core SPARC64 processor for mission-critical UNIX server. ISSCC 2013: 60-61 - 2011
- [c2]Taiki Uemura, Takashi Kato, Hideya Matsuyama, Keiji Takahisa, Mitsuhiro Fukuda, Kichiji Hatanaka:
Investigation of multi cell upset in sequential logic and validity of redundancy technique. IOLTS 2011: 7-12
2000 – 2009
- 2008
- [c1]Taiki Uemura, Ryo Tanabe, Yoshiharu Tosaka, Shigeo Satoh:
Using Low Pass Filters in Mitigation Techniques against Single-Event Transients in 45nm Technology LSIs. IOLTS 2008: 117-122
Coauthor Index
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