Investigation of the bipolar degradation of SiC MOSFET body diodes and the influence of current density - Shanmuganathan Palanisamy; Thomas Basler; Josef Lutz; Cesare Künzel; Larissa Wehrhahn-Kilian; Rudolf Elpelt (IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021, 2021)

Specific aspects regarding evaluation of power cycling tests with SiC devices - Martina Gerlach; Peter Seidel; Josef Lutz (2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, 2020)

Thermomechanical behaviour of inverse diode in SiC MOSFETs under surge current stress - Shanmuganathan Palanisamy; Josef Lutz; Roman Boldyrjew-Mast; Thomas Basler (2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, 2020)

Unified view on energy and electrical failure of the short-circuit operation of IGBTs - Roman Baburske; Franz-Josef Niedernostheide; Hans-Joachim Schulze; Riteshkumar Bhojani; J. Kowalsky; Josef Lutz (Microelectron. Reliab., 2018)

Reliability and reliability investigation of wide-bandgap power devices - Josef Lutz; Jörg Franke (Microelectron. Reliab., 2018)

Study on power cycling test with different control strategies - Guang Zeng; F. Wenisch-Kober; Josef Lutz (Microelectron. Reliab., 2018)

Requirements in power cycling for precise lifetime estimation - Christian Herold; Jörg Franke; Riteshkumar Bhojani; Andre Schleicher; Josef Lutz (Microelectron. Reliab., 2016)

Topologies for inverter like operation of power cycling tests - Christian Herold; Peter Seidel; Josef Lutz; Reinhold Bayerer (Microelectron. Reliab., 2016)

Internal processes in power semiconductors at virtual junction temperature measurement - Weinan Chen; Jörg Franke; Christian Herold; Riteshkumar Bhojani; Josef Lutz (Microelectron. Reliab., 2016)

Improving the short circuit ruggedness of IGBTs - Lukas Tinschert; Magnar Hernes; Josef Lutz (Microelectron. Reliab., 2016)

Possible failure modes in Press-Pack IGBTs - Lukas Tinschert; Atle Rygg Årdal; Tilo Poller; Marco Bohlländer; Magnar Hernes; Josef Lutz (Microelectron. Reliab., 2015)

Ruggedness of 1200 V SiC MPS diodes - Susanne Fichtner; Sophia Frankeser; Josef Lutz; Roland Rupp; Thomas Basler; Rolf Gerlach (Microelectron. Reliab., 2015)

Switching ruggedness and surge-current capability of diodes using the self-adjusting p emitter efficiency diode concept - Thomas Basler; M. Pfaffenlehner; Hans Peter Felsl; Franz-Josef Niedernostheide; F. Pfirsch; Hans-Joachim Schulze; Roman Baburske; Josef Lutz (IET Circuits Devices Syst., 2014)

Some aspects on ruggedness of SiC power devices - Josef Lutz; Roman Baburske (Microelectron. Reliab., 2014)

Approach of a physically based lifetime model for solder layers in power modules - P. Steinhorst; Tilo Poller; Josef Lutz (Microelectron. Reliab., 2013)

Influence of the clamping pressure on the electrical, thermal and mechanical behaviour of press-pack IGBTs - Tilo Poller; Salvatore D'Arco; Magnar Hernes; Atle Rygg Årdal; Josef Lutz (Microelectron. Reliab., 2013)

Dynamic avalanche in bipolar power devices - Josef Lutz; Roman Baburske (Microelectron. Reliab., 2012)

Mechanical analysis of press-pack IGBTs - Tilo Poller; Thomas Basler; Magnar Hernes; Salvatore D'Arco; Josef Lutz (Microelectron. Reliab., 2012)

Surge current capability of IGBTs - Thomas Basler; Josef Lutz; Roland Jakob; Thomas Bruckner (International Multi-Conference on Systems, Signals & Devices, SSD 2012, Chemnitz, Germany, March 20-23, 2012, 2012)

A simplified algorithm for predicting power cycling lifetime in Direct Drive wind power systems - Salvatore D'Arco; Tore Undeland; Marco Bohlländer; Josef Lutz (International Multi-Conference on Systems, Signals & Devices, SSD 2012, Chemnitz, Germany, March 20-23, 2012, 2012)

Thermal impedance spectroscopy of power modules - A. Hensler; D. Wingert; Christian Herold; Josef Lutz; Markus Thoben (Microelectron. Reliab., 2011)

Ruggedness analysis of 3.3 kV high voltage diodes considering various buffer structures and edge terminations - Birk Heinze; Josef Lutz; Hans Peter Felsl; Hans-Joachim Schulze (Microelectron. J., 2008)

Thyristors and IGBTs with integrated self-protection functions - Franz-Josef Niedernostheide; Hans-Joachim Schulze; Hans Peter Felsl; Thomas Laska; Ulrich Kellner-Werdehausen; Josef Lutz (IET Circuits Devices Syst., 2007)

Influence of parasitic inductances on transient current sharing in parallel connected synchronous rectifiers and Schottky-barrier diodes - D. Polenov; Josef Lutz; Hartmut Pröbstle; Andreas Brösse (IET Circuits Devices Syst., 2007)

Compensation and doping effects in heavily helium-radiated silicon for power device applications - Ralf Siemieniec; Hans-Joachim Schulze; Franz-Josef Niedernostheide; W. Südkamp; Josef Lutz (Microelectron. J., 2006)

Possibilities and limits of axial lifetime control by radiation induced centers in fast recovery diodes - Ralf Siemieniec; Josef Lutz (Microelectron. J., 2004)

Dynamic avalanche and reliability of high voltage diodes - Josef Lutz; Martin Domeij (Microelectron. Reliab., 2003)