IEEE Design & Test of Computers, Volume 15

Volume 15, Number 1, January-March 1998

EIC Message

• 
  Yervant Zorian:
  D&T: 15th Year in Service. IEEE Des. Test Comput. 15(1): 1- (1998)

News

• 
  News. IEEE Des. Test Comput. 15(1): 4-5 (1998)

Conference Reports

• 
  Teruhiko Yamada:
  1997 Asian Test Symposium. IEEE Des. Test Comput. 15(1): 6- (1998)

Panel Summaries

• 
  Dilip K. Bhavsar, Yervant Zorian:
  ITC 97 Panel Sessions. IEEE Des. Test Comput. 15(1): 7, 91 (1998)

Guest Editor's Introduction

• 
  Fabrizio Lombardi:
  Field-Programmable Gate Arrays. IEEE Des. Test Comput. 15(1): 8-9 (1998)

Feature

• 
  Vaughn Betz, Jonathan Rose:
  How Much Logic Should Go in an FPGA Logic Block? 10-15
• 
  Miriam Leeser, Waleed Meleis, Mankuan Michael Vai, Silviu M. S. A. Chiricescu, Weidong Xu, Paul M. Zavracky:
  Rothko: A Three-Dimensional FPGA. 16-23
• 
  Shanzhen Xing, William W. H. Yu:
  FPGA Adders: Performance Evaluation and Optimal Design. 24-29
• 
  Roger F. Woods, David W. Trainor, Jean-Paul Heron:
  Applying an XC6200 to Real-Time Image Processing. 30-38
• 
  Tomoo Inoue, Satoshi Miyazaki, Hideo Fujiwara:
  Universal Fault Diagnosis for Lookup Table FPGAs. 39-44
• 
  Michel Renovell, Jean-Michel Portal, Joan Figueras, Yervant Zorian:
  Testing the Interconnect of RAM-Based FPGAs. 45-50

Special Feature

• 
  Kenneth L. Shepard, Vinod Narayanan:
  Conquering Noise in Deep-Submicron Digital ICs. 51-62
• 
  Stefano Barbagallo, Davide Medina, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda:
  Integrating Online and Offline Testing of a Switching Memory. 63-70
• 
  Felice Balarin, Luciano Lavagno, Praveen K. Murthy, Alberto L. Sangiovanni-Vincentelli:
  Scheduling for Embedded Real-Time Systems. 71-82
• 
  A D&T Roundtable: Relative Effectiveness of Tests. IEEE Des. Test Comput. 15(1): 83-90 (1998)

Test Technology TC Newsletter

• 
  Test Technology TC Newsletter. IEEE Des. Test Comput. 15(1): 92-94 (1998)

Design Automation TC Newsletter

• 
  Design Automation TC Newsletter. IEEE Des. Test Comput. 15(1): 95- (1998)

The Last Byte

• 
  Hideo Fujiwara:
  Needed: Third-generation ATPG Benchmarks. IEEE Des. Test Comput. 15(1): 96- (1998)

Volume 15, Number 2, April-June 1998

EIC Message

• 
  Our new world. IEEE Des. Test Comput. 15(2): 1- (1998)

Letters

• 
  Letters. IEEE Des. Test Comput. 15(2): 3- (1998)

Conference Reports

• 
  Patrick M. Dewilde:
  Date 98. IEEE Des. Test Comput. 15(2): 4- (1998)

Panel Summaries

• 
  Panel Summaries. IEEE Des. Test Comput. 15(2): 5-7 (1998)

Feature

• 
  Colin M. Maunder:
  The Future: Plug and Pray? 8-13
• 
  Vladimír Székely, Márta Rencz, Bernard Courtois:
  Tracing the Thermal Behavior of ICs. 14-21
• 
  Kayhan Küçükçakar, Chih-Tung Chen, Jie Gong, Wim Philipsen, Thomas E. Tkacik:
  Matisse: An Architectural Design Tool for Commodity ICs. 22-33
• 
  Peter J. Ashenden, Philip A. Wilsey, Dale E. Martin:
  SUAVE: Extending VHDL to Improve Data Modeling Support. 34-44
• 
  Rolf Ernst:
  Codesign of Embedded Systems: Status and Trends. 45-54
• 
  Yeong-Ruey Shieh, Cheng-Wen Wu:
  Control and Observation Structures for Analog Circuits. 56-64
• 
  Wen-Jong Fang, Allen C.-H. Wu:
  Integrating HDL Synthesis and Partitioning for Multi-FPGA Designs. 65-72
• 
  Samvel K. Shoukourian:
  A Unified Design Methodology for Offline and Online Testing. 73-79
• 
  Yuri V. Malyshenko:
  Functional Fault Models for Analog Circuits. 80-85
• 
  Meh-Ron Amerian, William D. Atwell Jr., Ian Burgess, Gary D. Fleeman, David Y. Lepejian, T. W. Williams, Farzad Zarrinfar, Yervant Zorian:
  A D&T Roundtable: Testing Mixed Logic and DRAM Chips. IEEE Des. Test Comput. 15(2): 86-92 (1998)

DATC Newsletter

• 
  DATC Newsletter. IEEE Des. Test Comput. 15(2): 93- (1998)

Test Technology TC Newsletter

• 
  Test Technology TC Newsletter. IEEE Des. Test Comput. 15(2): 94-95 (1998)

The Last Byte

• 
  Scott Davidson:
  The Newer Colossus. IEEE Des. Test Comput. 15(2): 96- (1998)

Volume 15, Number 3, July-September 1998

Department

• 
  Conference Reports. IEEE Des. Test Comput. 15(3): 2- (1998)

From the Editor-in-Chief

• 
  Yervant Zorian:
  Once Again, a Super Issue. IEEE Des. Test Comput. 15(3): 3- (1998)

Keynote

• 
  Wilfred Corrigan:
  ASIC Challenges: Emerging from a Primordial Soup. 4-7

Feature

• 
  David E. Schimmel, Chryssa Dislis:
  Guest Editors' Introduction: Early Modeling and Analysis of Packaged Systems. IEEE Des. Test Comput. 15(3): 8-9 (1998)
• 
  Peter Sandborn, Mike Vertal:
  Analyzing Packaging Trade-Offs During System Design. 10-19
• 
  Michael Scheffler, Daniel Ammann, Andreas Thiel, Claus M. Habiger, Gerhard Tröster:
  Modeling and Optimizing the Costs of Electronic Systems. 20-26
• 
  Earl E. Swartzlander Jr.:
  VLSI, MCM, and WSI: A Design Comparison. 28-34
• 
  Claudio Truzzi:
  The Role of the Good-Die Project in Miniaturized-System Design. 35-43
• 
  Koppolu Sasidhar, Leon Alkalai, Abhijit Chatterjee:
  Testing NASA's 3D-Stack MCM Space Flight Computer. 44-55

Microprocessor Testing

• 
  Wayne M. Needham:
  Guest Editor's Introduction: Microprocessor Testing Today. IEEE Des. Test Comput. 15(3): 56-57 (1998)
• 
  Jeff Brauch, Jay Fleischman:
  Design of Cache Test Hardware on the HP PA8500. 58-63
• 
  R. Scott Fetherston, Imtiaz P. Shaik, Siyad C. Ma:
  Testability Features of the AMD-K6 Microprocessor. 64-69
• 
  Dale Amason, Alfred L. Crouch, Renny Eisele, Grady Giles, Michael Mateja:
  Test Development for Second-Generation ColdFire Microprocessors. 70-76
• 
  Adrian Carbine, Derek Feltham:
  Pentium Pro Processor Design for Test and Debug. 77-82
• 
  Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Mary P. Kusko, Bryan J. Robbins:
  Testing the 500-MHz IBM S/390 Microprocessor. 83-89
• 
  Carol Pyron, Javier Prado, James Golab:
  Test Strategy for the PowerPC 750 Microprocessor. 90-97
• 
  Carol Stolicny, Richard Davies, Pamela McKernan, Tuyen Truong:
  Alpha 21164 Manufacturing Test Development and Coverage Analysis. 98-104

Special Feature

• 
  Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian:
  Effective Built-In Self-Test for Booth Multipliers. 105-111
• 
  Michel Dubois, Jaeheon Jeong, Yong Ho Song, Adrian Moga:
  Rapid Hardware Prototyping on RPM-2. 112-118
• 
  A D&T Roundtable: Challenges for Low-Power and High-Performance Chips. IEEE Des. Test Comput. 15(3): 119-124 (1998)

Department

• 
  Test Technology TC Newsletter. IEEE Des. Test Comput. 15(3): 125-126 (1998)
• 
  Design Automation Technical Committee Newsletter. IEEE Des. Test Comput. 15(3): 126-127 (1998)

The Last Byte

• 
  Scott Davidson:
  Minutes Found on a Cave Wall. IEEE Des. Test Comput. 15(3): 128- (1998)

Volume 15, Number 4, October-December 1998

EIC Message

• 
  Yervant Zorian:
  Challenges and Options. IEEE Des. Test Comput. 15(4): 3- (1998)

Standards

• 
  Mukund Modi:
  IEEE Standards Coordinating Committee 20. IEEE Des. Test Comput. 15(4): 4-6 (1998)

Keynote

• 
  Bill Bottoms:
  The Third Millennium's Test Dilemma. 7-11

Feature

• 
  Ramesh Karri, Michael Nicolaidis:
  Guest Editors' Introduction: Online VLSI Testing. IEEE Des. Test Comput. 15(4): 12-16 (1998)
• 
  Hussain Al-Asaad, Brian T. Murray, John P. Hayes:
  Online BIST for Embedded Systems. 17-24
• 
  Samuel Norman Hamilton, Alex Orailoglu:
  Efficient Self-Recovering ASIC Design. 25-35
• 
  Sybille Hellebrand, Hans-Joachim Wunderlich, Andre Hertwig:
  Synthesizing Fast, Online-Testable Control Units. 36-41
• 
  Cecilia Metra, Michele Favalli, Bruno Riccò:
  Concurrent Checking of Clock Signal Correctness. 42-48
• 
  Jien-Chung Lo:
  Online Current Testing. 49-56
• 
  Eberhard Böhl, Thomas Lindenkreuz, Matthias Meerwein:
  On-Chip IDDQ Testing in the AE11 Fail-Stop Controller. 57-65
• 
  Cristiana Bolchini, Fabio Salice, Donatella Sciuto:
  Fault Analysis for Networks with Concurrent Error Detection. 66-74

Special Feature

• 
  Glenn H. Chapman, Benoit Dufort:
  Using Laser Defect Avoidance to Build Large-Area FPGAs. 75-81

A D&T Roundtable

• 
  Deep-Submicron Noise. IEEE Des. Test Comput. 15(4): 82-88 (1998)

IEEE Design & Test of Computers 1998 Annual Index, Volume 15

• 
  IEEE Design & Test of Computers, 1998 Annual Index, Volume 15. IEEE Des. Test Comput. 15(4): 89-92 (1998)

Test Technology TC Newsletter

• 
  TTTC Newsletter. IEEE Des. Test Comput. 15(4): 93-94 (1998)

Design Automation TC Newsletter

• 
  Design Automation Technical Committee Newsletter. IEEE Des. Test Comput. 15(4): 95- (1998)

The Last Byte

• 
  Scott Davidson:
  The Last Byte. IEEE Des. Test Comput. 15(4): 96- (1998)