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ORCID1. GREC 1995: University Park, PA, USA
- Rangachar Kasturi, Karl Tombre:
Graphics Recognition, Methods and Applications, First International Workshop, University Park, PA, USA, August 10-11, 1995, Selected Papers. Lecture Notes in Computer Science 1072, Springer 1996, ISBN 3-540-61226-2
Low-level processing, vectorization and segmentation
- Lawrence O'Gorman:
Basic Techniques and Symbol-Level Recognition - An Overview. 1-12 - Luigi P. Cordella, Angelo Marcelli:
An Alternative Approach to the Performance Evaluation of Thinning Algorithms for Document Processing Applications. 13-22 - Tokuhisa Kadonaga, Keiichi Abe:
Comparison of Methods for Detecting Corner Points from Digital Curves. 23-34 - Atul K. Chhabra, Vishal Misra, Juan F. Arias:
Detection of Horizontal Lines in Noisy Run Length Encoded Images: The FAST Method. 35-48 - Markus Röösli, Gladys Monagan:
Adding Geometric Constraints to the Vectorization of Line Drawings. 49-56 - Osamu Hori, David S. Doermann:
Quantitative Measurement of the Performance of Raster-to-Vector Conversion Algorithms. 57-68 - E. Turolla, Yolande Belaïd, Abdel Belaïd:
Form Item Extraction Based on Line Searching. 69-79 - Edward A. Green, Mukkai S. Krishnamoorthy:
Model-Based Analysis of Printed Tables. 80-91 - Gady Agam, Huizhu Luo, Its'hak Dinstein:
Morphological Approach for Dashed Lines Detection. 92-105
Symbol and diagram recognition
- Dorothea Blostein:
General Diagram-Recognition Methodologies. 106-122 - Bruno T. Messmer, Horst Bunke:
Automatic Learning and Recognition of Graphical Symbols in Engineering Drawings. 123-134 - Francesca Cesarini, Marco Gori, Simone Marinai, Giovanni Soda:
A Hybrid System for Locating and Recognizing Low Level Graphic Items. 135-147 - Joe R. McDaniel, Jason R. Balmuth:
Automatic Interpretation of Chemical Structure Diagrams. 148-158
Map processing
- Jurgen den Hartog, Ton K. ten Kate, Jan J. Gerbrands:
Knowledge-Based Segmentation for Automatic Map Interpretation. 159-178 - Min-Ki Kim, Mun-Kyu Park, Oh-Sung Kwon, Young-Bin Kwon:
Automatic Region Labeling of the Layered Map. 179-189 - Gregory K. Myers, Prasanna G. Mulgaonkar, Chien-Huei Chen, Jeff L. DeCurtins, Edward Chen:
Verification-Based Approach for Automated Text and Feature Extraction from Raster-Scanned Maps. 190-203 - Arnold W. M. Smeulders, Ton K. ten Kate:
Software System Design for Paper Map Conversion. 204-211
Engineering drawings
- Dov Dori
, Yelena Velkovitch, Liu Wenyin:
Object-Process Based Segmentation and Recognition of ANSI and ISO Standard Dimensioning Texts. 212-232 - Peter D. Thomas, Janet F. Poliakoff, Sabah M. Razzaq, Robert J. Whitrow:
A Combined High and Low Level Approach to Interpreting Scanned Engineering Drawings. 233-245 - María A. Capellades, Octavia I. Camps:
Functional Parts Detection in Engineering Drawings: Looking for the Screws. 246-259 - Ken Tomiyama, Ken'ichi Nakaniwa:
Reconstruction of 3D Solid Model from Three Orthographic Views - Top-Down Approach. 260-269
Dashed-line detection contest
- Bin Kong, Ihsin T. Phillips, Robert M. Haralick, Arathi Prasad, Rangachar Kasturi:
A Benchmark: Performance Evaluation of Dashed-Line Detection Algorithms. 270-285 - Dov Dori, Liu Wenyin, Mor Peleg:
How to Win a Dashed Line Detection Contest. 286-300 - Rangachar Kasturi, Karl Tombre:
Summary and Recommendations. 301-308
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