"Testable design of BiCMOS circuits for stuck-open fault detection using ..."

Sankaran M. Menon et al. (1995)

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DOI: 10.1109/4.400427

access: closed

type: Journal Article

metadata version: 2023-05-03

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Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Rochit Rajsuman:
Testable design of BiCMOS circuits for stuck-open fault detection using single patterns. IEEE J. Solid State Circuits 30(8): 855-863 (1995)

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