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"A New Test Generation Model for Broadside Transition Testing of Partial ..."
Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara (2006)
- Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara:
A New Test Generation Model for Broadside Transition Testing of Partial Scan Circuits. VLSI-SoC 2006: 308-313
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