"True random number generation exploiting SET voltage variability in ..."

Jérémy Postel-Pellerin et al. (2019)

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DOI: 10.1109/NVMTS47818.2019.9043369

access: closed

type: Conference or Workshop Paper

metadata version: 2020-06-15

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Jérémy Postel-Pellerin, Hussein Bazzi, Hassen Aziza, Pierre Canet, Mathieu Moreau, Vincenzo Della Marca, Adnan Harb:
True random number generation exploiting SET voltage variability in resistive RAM memory arrays. NVMTS 2019: 1-5

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