"On the reuse of read and write assist circuits to improve test efficiency ..."

Leonardo Bonet Zordan et al. (2013)

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DOI: 10.1109/TEST.2013.6651927

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine:
On the reuse of read and write assist circuits to improve test efficiency in low-power SRAMs. ITC 2013: 1-10

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