"A high accuracy high throughput jitter test solution on ATE for 3GBPS and ..."

Yongquan Fan, Yi Cai, Zeljko Zilic (2007)

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DOI: 10.1109/TEST.2007.4437594

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Yongquan Fan, Yi Cai, Zeljko Zilic:
A high accuracy high throughput jitter test solution on ATE for 3GBPS and 6gbps serial-ata. ITC 2007: 1-10

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