"Test pattern generation in presence of unknown values based on restricted ..."

Dominik Erb et al. (2014)

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DOI: 10.1109/TEST.2014.7035350

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Dominik Erb, Karsten Scheibler, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker:
Test pattern generation in presence of unknown values based on restricted symbolic logic. ITC 2014: 1-10

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