"Nanoscale Analysis of Breakdown Induced Crack Propagation in DTSCR Devices."

Xinqian Chen et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764452

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-10

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Xinqian Chen, Fei Hou, Zuoyuan Dong, Yuxin Zhang, Chaolun Wang, Fang Liang, Feibo Du, Zhiwei Liu, Xing Wu:
Nanoscale Analysis of Breakdown Induced Crack Propagation in DTSCR Devices. IRPS 2022: 48-1

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