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ORCIDDominik Erb
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2010 – 2019
- 2018
[j4]Jan Burchard, Dominik Erb, Sudhakar M. Reddy, Adit D. Singh, Bernd Becker
:
On the Generation of Waveform-Accurate Hazard and Charge-Sharing Aware Tests for Transistor Stuck-Off Faults in CMOS Logic Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(10): 2152-2165 (2018)- [c15]Jan Burchard, Dominik Erb, Bernd Becker:
Characterization of possibly detected faults by accurately computing their detection probability. DATE 2018: 385-390 - 2017
- [j3]Pascal Raiola, Jan Burchard, Felix Neubauer, Dominik Erb, Bernd Becker:
Evaluating the Effectiveness of D-chains in SAT-based ATPG and Diagnostic TPG. J. Electron. Test. 33(6): 751-767 (2017) - [c14]Jan Burchard, Dominik Erb, Adit D. Singh, Sudhakar M. Reddy, Bernd Becker:
Fast and waveform-accurate hazard-aware SAT-based TSOF ATPG. DATE 2017: 422-427 - [c13]Jan Burchard, Felix Neubauer, Pascal Raiola, Dominik Erb, Bernd Becker:
Evaluating the effectiveness of D-chains in SAT-based ATPG. LATS 2017: 1-6 - [c12]Pascal Raiola, Dominik Erb, Sudhakar M. Reddy, Bernd Becker:
Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model. VLSID 2017: 135-140 - [c11]Jan Burchard, Dominik Erb, Sudhakar M. Reddy, Adit D. Singh, Bernd Becker:
Efficient SAT-based generation of hazard-activated TSOF tests. VTS 2017: 1-6 - 2016
- [b1]Dominik Erb:
On the handling of uncertainty in test pattern generation. University of Freiburg, Germany, Der Andere Verlag 2016, ISBN 978-3-86247-571-1, pp. 1-159 - [c10]Dominik Erb, Karsten Scheibler, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker:
Mixed 01X-RSL-Encoding for fast and accurate ATPG with unknowns. ASP-DAC 2016: 749-754 - [c9]Karsten Scheibler, Dominik Erb, Bernd Becker:
Accurate CEGAR-based ATPG in presence of unknown values for large industrial designs. DATE 2016: 972-977 - [c8]Karsten Scheibler, Dominik Erb, Bernd Becker:
Applying Tailored Formal Methods to X-ATPG. MBMV 2016: 138 - 2015
- [j2]Dominik Erb, Michael A. Kochte, Sven Reimer, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker:
Accurate QBF-Based Test Pattern Generation in Presence of Unknown Values. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(12): 2025-2038 (2015) - [c7]Karsten Scheibler, Dominik Erb, Bernd Becker:
Improving test pattern generation in presence of unknown values beyond restricted symbolic logic. ETS 2015: 1-6 - [c6]Dominik Erb, Karsten Scheibler, Matthias Sauer, Sudhakar M. Reddy, Bernd Becker:
Multi-cycle Circuit Parameter Independent ATPG for interconnect open defects. VTS 2015: 1-6 - 2014
- [j1]Dominik Erb, Michael A. Kochte, Matthias Sauer, Stefan Hillebrecht, Tobias Schubert, Hans-Joachim Wunderlich, Bernd Becker:
Exact Logic and Fault Simulation in Presence of Unknowns. ACM Trans. Design Autom. Electr. Syst. 19(3): 28:1-28:17 (2014) - [c5]Dominik Erb, Karsten Scheibler, Matthias Sauer, Sudhakar M. Reddy, Bernd Becker:
Circuit Parameter Independent Test Pattern Generation for Interconnect Open Defects. ATS 2014: 131-136 - [c4]Dominik Erb, Karsten Scheibler, Matthias Sauer, Bernd Becker:
Efficient SMT-based ATPG for interconnect open defects. DATE 2014: 1-6 - [c3]Dominik Erb, Karsten Scheibler, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker:
Test pattern generation in presence of unknown values based on restricted symbolic logic. ITC 2014: 1-10 - 2013
- [c2]Dominik Erb, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker:
Accurate Multi-cycle ATPG in Presence of X-Values. Asian Test Symposium 2013: 245-250 - [c1]Stefan Hillebrecht, Michael A. Kochte, Dominik Erb, Hans-Joachim Wunderlich, Bernd Becker:
Accurate QBF-based test pattern generation in presence of unknown values. DATE 2013: 436-441
Coauthor Index
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