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M. Stancic

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2000 – 2009

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2003
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M. Stancic, Hans G. Kerkhoff:
Testability-analysis driven test-generation of analogue cores. Microelectron. J. 34(10): 913-917 (2003)
2002
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M. Stancic, Liquan Fang, M. H. H. Weusthof, R. M. W. Tijink, Hans G. Kerkhoff:
A New Test Generation Approach for Embedded Analogue Cores in SoC. ITC 2002: 861-869

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