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CHARM High-Energy Ions for Microelectronics Reliability Assurance (CHIMERA)
/ Bilko, Kacper (CERN ; Lab. Hubert Curien, St. Etienne) ; García Alía, Rubén (CERN) ; Costantino, Alessandra (ESTEC, Noordwijk) ; Coronetti, Andrea (CERN) ; Danzeca, Salvatore (CERN) ; Delrieux, Marc (CERN) ; Emriskova, Natalia (CERN) ; Fraser, Matthew Alexander (CERN) ; Girard, Sylvain (Lab. Hubert Curien, St. Etienne ; IUF, Paris) ; Johnson, Eliott Philippe (CERN) et al.
We present the progress related to CERN’s capacity of delivering highly penetrating, high-linear energy transfer (LET) heavy ions for radiation effect testing of electronic components within the CHARM High-energy Ions for Micro Electronics Reliability Assurance (CHIMERA) project. Profiting from the existing accelerator infrastructure, Monte Carlo simulations, and a 300- $\mu $ m-thick silicon diode, we highlight the beam characterization capabilities and a summary of the beam properties. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1549-1556
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Temperature Effect on the Radioluminescence of Differently Doped Silica-Based Optical Fibers
/ Kerboub, Nourdine (CERN ; CNES, Toulouse ; Lab. Hubert Curien, St. Etienne) ; Di Francesca, Diego (CERN) ; Morana, Adriana (Lab. Hubert Curien, St. Etienne) ; Hamzaoui, Hicham El (PhLAM, Villeneuve d'Ascq) ; Ouerdane, Youcef (Lab. Hubert Curien, St. Etienne) ; Bouwmans, Géraud (PhLAM, Villeneuve d'Ascq) ; Habert, Rémi (PhLAM, Villeneuve d'Ascq) ; Cassez, Andy (PhLAM, Villeneuve d'Ascq) ; Boukenter, Aziz (Lab. Hubert Curien, St. Etienne) ; Capoen, Bruno (PhLAM, Villeneuve d'Ascq) et al.
We evaluate the temperature effect on the X-ray radiation-induced luminescence (RIL) of differently doped silica fibers obtained via the sol-gel route. Previous investigations showed that these optical materials exhibit interesting dosimetry properties, such as very good detection capabilities and linear response over a large range of dose rate. [...]
2024 - 7 p.
- Published in : IEEE Trans. Nucl. Sci. 71 (2024) 2280-2286
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Very-High-Energy Heavy Ion Beam Dosimetry Using Solid State Detectors for Electronics Testing
/ Waets, Andreas (CERN ; Zurich U.) ; Bilko, Kacper (CERN) ; Coronetti, Andrea (CERN) ; Emriskova, Natalia (CERN) ; Sacristan Barbero, Mario (CERN) ; García Alía, Rubén (CERN) ; Durante, Marco (Darmstadt, GSI) ; Schuy, Christoph (Darmstadt, GSI) ; Wagner, Tim (Darmstadt, GSI) ; Esposito, Luigi Salvatore (CERN) et al.
Very-high-energy (VHE), heavy ions are of particular interest for single event effects (SEEs) testing due to their combination of high linear energy transfer (LET) and high penetration within electronics components. The dosimetry of such beams poses an important challenge for facilities aiming to provide VHE ions for radiation effects testing. [...]
2024 - 9 p.
- Published in : IEEE Trans. Nucl. Sci. 71 (2024) 1837-1845
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1837-1845
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Enhancement of System Observability During System-Level Radiation Testing Through Total Current Consumption Monitoring
/ Slipukhin, Ivan (CERN) ; Coronetti, Andrea (CERN) ; Alía, Rubén García (CERN) ; Saigné, Frédéric (IES, Montpellier) ; Boch, Jérôme (IES, Montpellier) ; Dilillo, Luigi (IES, Montpellier) ; Aguiar, Ygor Q (CERN) ; Cazzaniga, Carlo ; Kastriotou, Maria ; Dodd, Torran
System-level testing of electronics is an affordable method of assessment of the performance of complete electronic systems designed for applications in the radiation environment. Compared to component-level testing, system-level test offers a much smaller degree of observability about the performance of particular system elements. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1948-1955
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The CELESTA CubeSat In-Flight Radiation Measurements and Their Comparison With Ground Facilities Predictions
/ Coronetti, Andrea (CERN) ; Zimmaro, Alessandro (CERN) ; Alía, Rubén García (CERN) ; Danzeca, Salvatore (CERN) ; Masi, Alessandro (CERN) ; Slipukhin, Ivan (CERN) ; Amodio, Alessio (CERN) ; Dijks, Jasper (CERN) ; Peronnard, Paul (CERN) ; Secondo, Raffaello (CERN) et al.
The CELESTA CubeSat has employed radiation monitors developed by the Conseil Européen pour la Recherche Nucléaire (CERN) Centre, used for measuring the radiation environment at accelerators, to measure the space radiation field in a medium-Earth orbit (MEO). The technology is based on three static random-access memories (SRAMs) that are sensitive to single-event upsets (SEUs) and single-event latchups (SELs). [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1623-1630
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Fusion Neutron-Induced Soft Errors During Long Pulse D–D Plasma Discharges in the WEST Tokamak
/ Moindjie, S (IM2NP, Marseille) ; Munteanu, D (IM2NP, Marseille) ; Autran, J L (IM2NP, Marseille ; Rennes U.) ; Dentan, M (CEA Cadarache) ; Moreau, P (CEA Cadarache) ; Pellissier, F P (CEA Cadarache) ; Santraine, B (CEA Cadarache) ; Bucalossi, J (CEA Cadarache) ; Malherbe, V ; Thery, T et al.
We have performed real-time soft error rate (RT-SER) measurements on bulk 65-nm static random access memories (SRAMs) during deuterium-deuterium (D-D) plasma operation at W-tungsten–Environment in Steady-state Tokamak (WEST). The present measurement campaign was characterized by the production of several tens of long pulse discharges (~60 s) and by a total neutron fluence (at the level of the circuits under test) up to ~$10^9$ n$\cdot$cm$^2$ , improving the error statistics by a factor of more than 6 with respect to the first measurements obtained in 2020. [...]
2024 - 7 p.
- Published in : IEEE Trans. Nucl. Sci.
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1496-1502
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