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1.
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SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below
/ Coronetti, Andrea (CERN ; Jyvaskyla U.) ; Cecchetto, Matteo (CERN) ; Wang, Jialei (Leuven U.) ; Tali, Maris (CERN) ; Martinez, Pablo Fernandez (CERN) ; Kastriotou, Maria (CERN) ; Papadopoulou, Athina (CERN) ; Bilko, Kacper (CERN) ; Castellani, Florent (ENSAE, Toulouse) ; Sacristan, Mario (CERN) et al.
The R2E project at CERN has tested a few commercial SRAMs and a custom-designed SRAM, whose data are complementary to various scientific publications. The experimental data include low- and high-energy protons, heavy ions, thermal, intermediate- and high-energy neutrons, high-energy electrons and high-energy pions..
2020 - 8 p.
- Published in : 10.1109/redw51883.2020.9325822
In : 2020 IEEE Radiation Effects Data Workshop, Online, US, 7 Dec 2020, pp.1-8
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2.
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Assessment of Proton Direct Ionization for the Radiation Hardness Assurance of Deep Submicron SRAMs Used in Space Applications
/ Coronetti, Andrea (CERN ; Jyvaskyla U.) ; Alia, Ruben Garcia (CERN) ; Wang, Jialei (Leuven U.) ; Tali, Maris (CERN) ; Cecchetto, Matteo (CERN) ; Cazzaniga, Carlo (Rutherford) ; Javanainen, Arto (Jyvaskyla U. ; Vanderbilt U.) ; Saigne, Frederic (IES, Montpellier) ; Leroux, Paul (Leuven U.)
2021 - 12 p.
- Published in : IEEE Trans. Nucl. Sci. 68 (2021) 937-948
fulltext from publisher: PDF;
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3.
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Single Event Effect Testing With Ultrahigh Energy Heavy Ion Beams
/ Kastriotou, Maria (CERN) ; Fernandez-Martinez, Pablo (CERN) ; García Alía, Rubén (CERN) ; Cazzaniga, Carlo (Rutherford) ; Cecchetto, Matteo (CERN) ; Coronetti, Andrea (CERN) ; Lerner, Giuseppe (CERN) ; Tali, Maris (CERN) ; Kerboub, Nourdine (CERN) ; Wyrwoll, Vanessa (CERN) et al.
Single event effect (SEE) testing with ultrahigh energy (UHE) heavy ions, such as the beams provided at CERN, presents advantages related to their long ranges with a constant linear energy transfer value. In the present work, the possibility to test components in parallel is being examined, and results from the CERN 2018 UHE Pb test campaigns are studied. [...]
2019 - 8 p.
- Published in : IEEE Trans. Nucl. Sci. 67 (2019) 63-70
Fulltext: PDF;
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4.
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SEE Tests With Ultra Energetic Xe Ion Beam in the CHARM Facility at CERN
/ Fernández-Martínez, Pablo (CERN) ; García Alía, Rubén (CERN) ; Cecchetto, Matteo (CERN) ; Kastriotou, Maria (CERN) ; Kerboub, Nourdine (CERN) ; Tali, Maris (CERN) ; Wyrwoll, Vanessa (CERN) ; Brugger, Markus (CERN) ; Cangialosi, Chiara (CERN) ; Cerutti, Francesco (CERN) et al.
Taking advantage of the heavy ion acceleration program, tests on radiation effects with Ultrahigh Energy (UHE) xenon ion beams (with Energy > 5 GeV/nucleon) have been performed in several experimental areas of the CERN accelerator complex. Specifically, the outcomes of the first UHE heavy ion test campaign carried out at the CHARM facility are presented and discussed in this contribution. [...]
2019 - 9 p.
- Published in : IEEE Trans. Nucl. Sci. 66 (2019) 1523-1531
In : Conference on Radiation and its Effects on Components and Systems, Gothenburg, Sweden, 16 - 21 Sep 2018, pp.1523-1531
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5.
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6.
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Heavy Ion Nuclear Reaction Impact on SEE Testing: From Standard to Ultra-high Energies
/ Wyrwoll, Vanessa (CERN) ; García Alía, Rubén (CERN) ; Røed, Ketil (Oslo U.) ; Fernández-Martínez, Pablo (CERN) ; Kastriotou, Maria (CERN) ; Cecchetto, Matteo (CERN) ; Kerboub, Nourdine (CERN) ; Tali, Maris (CERN) ; Cerutti, Francesco (CERN)
We perform Monte Carlo (MC) simulations to describe heavy ion (HI) nuclear interactions in a broad energy range (4 MeV/n–150 GeV/n), focusing on the single event effect (SEE) sub-linear energy transfer (LET) impact. Previously retrieved single event latch-up (SEL) experimental data have indicated that standard energy ions (~10 MeV/n) can produce high-LET secondaries through fusion reactions which are expected to strongly influence the SEE cross section in the sub-LET region. [...]
2020 - 9 p.
- Published in : IEEE Trans. Nucl. Sci. 67 (2020) 1590-1598
Fulltext from publisher: PDF;
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7.
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Thermal Neutron-Induced SEUs in the LHC Accelerator Environment
/ Cecchetto, Matteo (CERN) ; García Alía, Rubén (CERN) ; Wrobel, Frédéric (IES, Montpellier) ; Tali, Maris (CERN) ; Stein, Oliver (CERN) ; Lerner, Giuseppe (CERN) ; Biłko, Kacper (CERN) ; Esposito, Luigi (CERN) ; Bahamonde Castro, Cristina (CERN) ; Kadi, Yacine (CERN) et al.
In addition to high-energy hadrons, which include neutrons, protons, and pions above 20 MeV, thermal neutrons (ThNs) are a major concern in terms of soft error rate (SER) for electronics operating in the large hadron collider (LHC) accelerator at the European Organization for Nuclear Research (CERN). Most of the electronic devices still contain Boron-10 inside their structure, which makes them sensitive to ThNs. [...]
2020 - 9 p.
- Published in : IEEE Trans. Nucl. Sci. 67 (2020) 1412-1420
Fulltext from publisher: PDF;
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8.
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Direct Ionization Impact on Accelerator Mixed-Field Soft-Error Rate
/ García Alía, Rubén (CERN) ; Tali, Maris (CERN) ; Brugger, Markus (CERN) ; Cecchetto, Matteo (CERN) ; Cerutti, Francesco (CERN) ; Cononetti, Andrea (CERN) ; Danzeca, Salvatore (CERN) ; Esposito, Luigi (CERN) ; Fernández-Martínez, Pablo (CERN) ; Gilardoni, Simone (CERN) et al.
We investigate, through measurements and simulations, the possible direct ionization impact on the accelerator soft-error rate (SER), not considered in standard qualification approaches. Results show that, for a broad variety of state-of-the-art commercial components considered in the 65–16-nm technological range, indirect ionization is still expected to dominate the overall SER in the accelerator mixed-field. [...]
2019 - 8 p.
- Published in : IEEE Trans. Nucl. Sci. 67 (2019) 345-352
Fulltext: PDF;
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9.
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FPGA SEE Test with Ultra-High Energy Heavy Ions
/ Furano, Gianluca (ESTEC, Noordwijk) ; Tavoularis, Antonis (ESTEC, Noordwijk) ; Santos, Lucana (ESTEC, Noordwijk) ; Ferlet-Cavrois, Veronique (ESTEC, Noordwijk) ; Boatella, Cesar (ESTEC, Noordwijk) ; Alia, Ruben Garcia (CERN) ; Martinez, Pablo Fernandez (CERN) ; Kastriotou, Maria (CERN) ; Wyrwoll, Vanessa (CERN) ; Danzeca, Salvatore (CERN) et al.
The use of System-on-Chip (SoC) solutions in the design of space-borne data handling systems is an important step towards further miniaturization in space. In cubesats and in many aggressive commercial missions, use of Commercial-Off-The-Shelf (COTS) components is becoming the rule, rather than the exception and many of those are complex SoC, multiprocessor system-on-chip (MPSoC), SiP (System in package) or AMS-SoC (Analog/Mixed Signal SoC). [...]
2019 - 4 p.
- Published in : 10.1109/DFT.2018.8602958
In : 31st IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT2018), Chicago, USA, 08 - 10 Oct 2018
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10.
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Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation
/ Glorieux, Maximilien (Unlisted) ; Evans, Adrian (Unlisted) ; Lange, Thomas (Unlisted) ; In, A-Duong (Unlisted) ; Alexandrescu, Dan (Unlisted) ; Boatella-Polo, Cesar (ESTEC, Noordwijk) ; Garcia Alía, Rubén (CERN) ; Tali, Maris (CERN) ; Urbina Ortega, Carlos (ESTEC, Noordwijk) ; Kastriotou, Maria (CERN) et al.
Heavy-Ion irradiation of a Xilinx Ultrascale+ MPSOC was performed to measure Single-Event-Latch-up and Single-Event-Upset Cross-Sections. Additionally, irradiation with a ultra high energy xenon beam shows similar upset sensitivity..
2018 - 5 p.
- Published in : 10.1109/NSREC.2018.8584296
In : 2018 IEEE Radiation Effects Data Workshop, Waikoloa Village, HI, USA, 16 - 20 Jul 2018, pp.8584296
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