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Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation / Glorieux, Maximilien (Unlisted) ; Evans, Adrian (Unlisted) ; Lange, Thomas (Unlisted) ; In, A-Duong (Unlisted) ; Alexandrescu, Dan (Unlisted) ; Boatella-Polo, Cesar (ESTEC, Noordwijk) ; Garcia Alía, Rubén (CERN) ; Tali, Maris (CERN) ; Urbina Ortega, Carlos (ESTEC, Noordwijk) ; Kastriotou, Maria (CERN) et al.
Heavy-Ion irradiation of a Xilinx Ultrascale+ MPSOC was performed to measure Single-Event-Latch-up and Single-Event-Upset Cross-Sections. Additionally, irradiation with a ultra high energy xenon beam shows similar upset sensitivity..
2018 - 5 p. - Published in : 10.1109/NSREC.2018.8584296
In : 2018 IEEE Radiation Effects Data Workshop, Waikoloa Village, HI, USA, 16 - 20 Jul 2018, pp.8584296

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