Furano, Gianluca - 检索结果 - CERN Document Server

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Radiaton tolerant ATTM-WRTU wireless infrastructure for radiation harsh terrestrial applications / Bernhard, Aljaž (SkyLabs, Maribor) ; Selčan, David (SkyLabs, Maribor) ; Rotovnik, Tomaž (SkyLabs, Maribor) ; Gačnik, Dejan (SkyLabs, Maribor) ; Kramberger, Iztok (Maribor U.) ; Danzeca, Salvatore (CERN) ; Furano, Gianluca (ESTEC, Noordwijk)
This paper provides an overview of the challenges and solutions for wireless communications for terrestrial applications applied in radiation harsh environments, by utilising the proven designs used in space applications where radiation tolerance is a must. The specific application of using wireless communication in a particle accelerator environment is discussed. [...]
2021 - 4 p. - Published in : 10.1109/RADECS53308.2021.9954581
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2021), Vienna, Austria, 13 - 17 Sep 2021, pp.1-4

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Configuration Memory Scrubbing of SRAM-Based FPGAs Using a Mixed 2-D Coding Technique / Vlagkoulis, Vasileios (Piraeus, TEI) ; Sari, Aitzan (Piraeus, TEI) ; Antonopoulos, Georgios (Piraeus, TEI) ; Psarakis, Mihalis (Piraeus, TEI) ; Tavoularis, Antonios (ESTEC, Noordwijk) ; Furano, Gianluca (ESTEC, Noordwijk) ; Boatella-Polo, Cesar (ESTEC, Noordwijk) ; Poivey, Christian (ESTEC, Noordwijk) ; Ferlet-Cavrois, Véronique (ESTEC, Noordwijk) ; Kastriotou, Maria (CERN ; Rutherford) et al.
SRAM-based field-programmable gate array (FPGA) vendors typically integrate error correction codes (ECCs) into the configuration memory to assist designers in implementing scrubbing mechanisms. In most cases, these ECC schemes guarantee the correction of single- and double-bit errors per configuration frame but fail to correct upsets with higher multiplicity in a single frame caused by a single event. [...]
2022 - 12 p. - Published in : IEEE Trans. Nucl. Sci. 69 (2022) 871-882

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Single Event Effects Characterization of the Programmable Logic of Xilinx Zynq-7000 FPGA Using Very/Ultra High-Energy Heavy Ions / Vlagkoulis, Vasileios (Piraeus, TEI) ; Sari, Aitzan (Piraeus, TEI) ; Vrachnis, John (Piraeus, TEI) ; Antonopoulos, Georgios (Piraeus, TEI) ; Segkos, Nikolaos (Piraeus, TEI) ; Psarakis, Mihalis (Piraeus, TEI) ; Tavoularis, Antonios (ESTEC, Noordwijk) ; Furano, Gianluca (ESTEC, Noordwijk) ; Polo, Cesar Boatella (ESTEC, Noordwijk) ; Poivey, Christian (ESTEC, Noordwijk) et al.
This article studies the impact of radiation-induced single-event effects (SEEs) in the Zynq-7000 field programmable gate array (FPGA) and presents an in-depth analysis of the SEE susceptibility of all the memories of the programmable logic. The radiation experiments were performed in the CERN North Area facility and in the GSI Helmholtz Centre for Heavy Ion Research using very/ultra high-energy heavy ions. [...]
2021 - 10 p. - Published in : IEEE Trans. Nucl. Sci. 68 (2021) 36-45

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FPGA SEE Test with Ultra-High Energy Heavy Ions / Furano, Gianluca (ESTEC, Noordwijk) ; Tavoularis, Antonis (ESTEC, Noordwijk) ; Santos, Lucana (ESTEC, Noordwijk) ; Ferlet-Cavrois, Veronique (ESTEC, Noordwijk) ; Boatella, Cesar (ESTEC, Noordwijk) ; Alia, Ruben Garcia (CERN) ; Martinez, Pablo Fernandez (CERN) ; Kastriotou, Maria (CERN) ; Wyrwoll, Vanessa (CERN) ; Danzeca, Salvatore (CERN) et al.
The use of System-on-Chip (SoC) solutions in the design of space-borne data handling systems is an important step towards further miniaturization in space. In cubesats and in many aggressive commercial missions, use of Commercial-Off-The-Shelf (COTS) components is becoming the rule, rather than the exception and many of those are complex SoC, multiprocessor system-on-chip (MPSoC), SiP (System in package) or AMS-SoC (Analog/Mixed Signal SoC). [...]
2019 - 4 p. - Published in : 10.1109/DFT.2018.8602958
In : 31st IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT2018), Chicago, USA, 08 - 10 Oct 2018

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Ultraenergetic Heavy-Ion Beams in the CERN Accelerator Complex for Radiation Effects Testing / Alía, Rubén García (CERN) ; Fernández Martínez, Pablo (CERN) ; Kastriotou, Maria (CERN) ; Brugger, Markus (CERN) ; Bernhard, Johannes (CERN) ; Cecchetto, Matteo (CERN) ; Cerutti, Francesco (CERN) ; Charitonidis, Nikolaos (CERN) ; Danzeca, Salvatore (CERN) ; Gatignon, Lau (CERN) et al.
Traditional heavy-ion testing for single-event effects is carried out in cyclotron facilities with energies around 10 MeV/n. Despite their capability of providing a broad range of linear energy transfer (LET) values, the main limitations are related to the need of testing in a vacuum and with the sensitive region of the components accessible to the low range ions. [...]
2019 - 8 p. - Published in : IEEE Trans. Nucl. Sci. 66 (2019) 458-465 Fulltext: PDF;

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