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CERN Document Server 找到 7 笔记录  检索需时 0.60 秒. 
1.
Configuration Memory Scrubbing of SRAM-Based FPGAs Using a Mixed 2-D Coding Technique / Vlagkoulis, Vasileios (Piraeus, TEI) ; Sari, Aitzan (Piraeus, TEI) ; Antonopoulos, Georgios (Piraeus, TEI) ; Psarakis, Mihalis (Piraeus, TEI) ; Tavoularis, Antonios (ESTEC, Noordwijk) ; Furano, Gianluca (ESTEC, Noordwijk) ; Boatella-Polo, Cesar (ESTEC, Noordwijk) ; Poivey, Christian (ESTEC, Noordwijk) ; Ferlet-Cavrois, Véronique (ESTEC, Noordwijk) ; Kastriotou, Maria (CERN ; Rutherford) et al.
SRAM-based field-programmable gate array (FPGA) vendors typically integrate error correction codes (ECCs) into the configuration memory to assist designers in implementing scrubbing mechanisms. In most cases, these ECC schemes guarantee the correction of single- and double-bit errors per configuration frame but fail to correct upsets with higher multiplicity in a single frame caused by a single event. [...]
2022 - 12 p. - Published in : IEEE Trans. Nucl. Sci. 69 (2022) 871-882
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2.
Direct Ionization Impact on Accelerator Mixed-Field Soft-Error Rate / García Alía, Rubén (CERN) ; Tali, Maris (CERN) ; Brugger, Markus (CERN) ; Cecchetto, Matteo (CERN) ; Cerutti, Francesco (CERN) ; Cononetti, Andrea (CERN) ; Danzeca, Salvatore (CERN) ; Esposito, Luigi (CERN) ; Fernández-Martínez, Pablo (CERN) ; Gilardoni, Simone (CERN) et al.
We investigate, through measurements and simulations, the possible direct ionization impact on the accelerator soft-error rate (SER), not considered in standard qualification approaches. Results show that, for a broad variety of state-of-the-art commercial components considered in the 65–16-nm technological range, indirect ionization is still expected to dominate the overall SER in the accelerator mixed-field. [...]
2019 - 8 p. - Published in : IEEE Trans. Nucl. Sci. 67 (2019) 345-352 Fulltext: PDF;
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3.
FPGA SEE Test with Ultra-High Energy Heavy Ions / Furano, Gianluca (ESTEC, Noordwijk) ; Tavoularis, Antonis (ESTEC, Noordwijk) ; Santos, Lucana (ESTEC, Noordwijk) ; Ferlet-Cavrois, Veronique (ESTEC, Noordwijk) ; Boatella, Cesar (ESTEC, Noordwijk) ; Alia, Ruben Garcia (CERN) ; Martinez, Pablo Fernandez (CERN) ; Kastriotou, Maria (CERN) ; Wyrwoll, Vanessa (CERN) ; Danzeca, Salvatore (CERN) et al.
The use of System-on-Chip (SoC) solutions in the design of space-borne data handling systems is an important step towards further miniaturization in space. In cubesats and in many aggressive commercial missions, use of Commercial-Off-The-Shelf (COTS) components is becoming the rule, rather than the exception and many of those are complex SoC, multiprocessor system-on-chip (MPSoC), SiP (System in package) or AMS-SoC (Analog/Mixed Signal SoC). [...]
2019 - 4 p. - Published in : 10.1109/DFT.2018.8602958
In : 31st IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT2018), Chicago, USA, 08 - 10 Oct 2018
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4.
Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation / Glorieux, Maximilien (Unlisted) ; Evans, Adrian (Unlisted) ; Lange, Thomas (Unlisted) ; In, A-Duong (Unlisted) ; Alexandrescu, Dan (Unlisted) ; Boatella-Polo, Cesar (ESTEC, Noordwijk) ; Garcia Alía, Rubén (CERN) ; Tali, Maris (CERN) ; Urbina Ortega, Carlos (ESTEC, Noordwijk) ; Kastriotou, Maria (CERN) et al.
Heavy-Ion irradiation of a Xilinx Ultrascale+ MPSOC was performed to measure Single-Event-Latch-up and Single-Event-Upset Cross-Sections. Additionally, irradiation with a ultra high energy xenon beam shows similar upset sensitivity..
2018 - 5 p. - Published in : 10.1109/NSREC.2018.8584296
In : 2018 IEEE Radiation Effects Data Workshop, Waikoloa Village, HI, USA, 16 - 20 Jul 2018, pp.8584296
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5.
Ultraenergetic Heavy-Ion Beams in the CERN Accelerator Complex for Radiation Effects Testing / Alía, Rubén García (CERN) ; Fernández Martínez, Pablo (CERN) ; Kastriotou, Maria (CERN) ; Brugger, Markus (CERN) ; Bernhard, Johannes (CERN) ; Cecchetto, Matteo (CERN) ; Cerutti, Francesco (CERN) ; Charitonidis, Nikolaos (CERN) ; Danzeca, Salvatore (CERN) ; Gatignon, Lau (CERN) et al.
Traditional heavy-ion testing for single-event effects is carried out in cyclotron facilities with energies around 10 MeV/n. Despite their capability of providing a broad range of linear energy transfer (LET) values, the main limitations are related to the need of testing in a vacuum and with the sensitive region of the components accessible to the low range ions. [...]
2019 - 8 p. - Published in : IEEE Trans. Nucl. Sci. 66 (2019) 458-465 Fulltext: PDF;
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6.
Mechanisms of Electron-Induced Single-Event Latchup / Tali, Maris (Jyvaskyla U.) ; Alia, Ruben García (CERN) ; Brugger, Markus (CERN) ; Ferlet-Cavrois, Véronique (ESTEC, Noordwijk) ; Corsini, Roberto (CERN) ; Farabolini, Wilfrid (CERN) ; Javanainen, Arto (Jyvaskyla U.) ; Santin, Giovanni (ESTEC, Noordwijk) ; Boatella Polo, Cesar (ESTEC, Noordwijk) ; Virtanen, Ari (Jyvaskyla U.)
In this paper, possible mechanisms by which electrons can induce single-event latchups in electronics are discussed. The energy deposition and the nuclear fragments created by electrons in silicon are analyzed in this context. [...]
2018 - 7 p. - Published in : IEEE Trans. Nucl. Sci. 66 (2018) 437-443 Fulltext : PDF;
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7.
Mechanisms of Electron-Induced Single-Event Upsets in Medical and Experimental Linacs / Tali, Maris (CERN ; ESTEC, Noordwijk ; Jyvaskyla U.) ; Garcia Alia, Ruben (CERN) ; Brugger, Markus (CERN) ; Ferlet-Cavrois, Veronique (ESTEC, Noordwijk) ; Corsini, Roberto (CERN) ; Farabolini, Wilfrid (CERN) ; Javanainen, Arto (Jyvaskyla U.) ; Kastriotou, Maria (CERN) ; Kettunen, Heikki (Jyvaskyla U.) ; Santin, Giovanni (ESTEC, Noordwijk) et al.
In this paper, we perform an in-depth analysis of the single-event effects observed during testing at medical electron linacs and an experimental high-energy electron linac. For electron irradiations, the medical linacs are most commonly used due to their availability and flexibility. [...]
2018 - 9 p. - Published in : IEEE Trans. Nucl. Sci. 65 (2018) 1715-1723
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7 Boatella, C
2 Boatella, César
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