CERN Accelerating science

CERN Document Server Sök i 2 journaler efter:  Sökningen tog 0.61 sekunder. 
1.
A High-Resolution PET Demonstrator using a Silicon “Magnifying Glass” / Clinthorne, Neal ; Cochran, Eric ; Chesi, Enrico (CERN) ; Grkovski, Milan ; Grošičar, Borut ; Honscheid, Klaus ; Huh, Sam S ; Kagan, Harris ; Lacasta, Carlos ; Brzezinski, Karol et al.
To assist ongoing investigations of the limits of the tradeoff between spatial resolution and noise in PET imaging, several PET instruments based on silicon-pad detectors have been developed. The latest is a segment of a dual-ring device to demonstrate that excellent reconstructed image resolution can be achieved with a scanner that uses highresolution detectors placed close to the object of interest or surrounding a small field-of-view in combination with detectors having modest resolution at larger radius. [...]
2012 - 9 p. - Published in : Phys. Procedia 37 (2012) 1488-1496 Elsevier Open Access article: PDF;
In : 2nd International Conference on Technology and Instrumentation in Particle Physics, Chicago, IL, USA, 9 - 14 Jun 2011, pp.1488-1496
2.
Silicon as an unconventional detector in positron emission tomography / Clinthorne, Neal (Michigan U.) ; Brzezinski, Karol (Valencia U., IFIC) ; Chesi, Enrico (CERN) ; Cochran, Eric (Ohio State U.) ; Grkovski, Milan (Stefan Inst., Ljubljana) ; Grosicar, Borut (Stefan Inst., Ljubljana) ; Honscheid, Klaus (Ohio State U.) ; Huh, Sam (Michigan U.) ; Kagan, Harris (Ohio State U.) ; Lacasta, Carlos (Valencia U., IFIC) et al.
Positron emission tomography (PET) is a widely used technique in medical imaging and in studying small animal models of human disease. In the conventional approach, the 511keV annihilation photons emitted from a patient or small animal are detected by a ring of scintillators such as LYSO read out by arrays of photodetectors. [...]
2013 - 5 p. - Published in : Nucl. Instrum. Methods Phys. Res., A 699 (2013) 216-220

In : The 8th international "Hiroshima" Symposium on the Development and Application of Semiconductor Tracking Detectors, Taipei, Taiwan, 5 - 8 Dec 2011, pp.216-220

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