CERN Accelerating science

CERN Document Server 3 záznamov nájdených  Hľadanie trvalo 0.57 sekúnd. 
1.
First GEM measurements at WEST and perspectives for fast electrons and heavy impurities transport studies in tokamaks / WEST Team Collaboration
Soft X-ray (SXR) radiation emitted from tokamak plasmas contains very useful information about plasma stability, shape and impurity content, all key parameters to improve plasma performance. In the deuterium-tritium phase of ITER, the high neutron fluxes, gamma and hard X-ray emission will constitute too harsh an environment to permit the use of classical semiconductor detectors. [...]
2022 - 9 p. - Published in : JINST

In : 4th European Conference on Plasma Diagnostics, Online, 7 - 11 Jun 2021, pp.C01073
2.
Multichannel gas electron multiplier based soft x-ray field-programmable gate array measurement system for W-Environment in Steady-state Tokamak (WEST): Hardware, installation, and first plasma acquisition / Wojenski, A (Warsaw U. of Tech.) ; Linczuk, P (Warsaw U. of Tech.) ; Kasprowicz, G (Warsaw U. of Tech.) ; Poźniak, K T (Warsaw U. of Tech.) ; Chernyshova, M (Inst. Plasma Phys., Warsaw) ; Mazon, D (BIAM, St Paul lez Durance) ; Czarski, T (Inst. Plasma Phys., Warsaw) ; Krawczyk, R D (Warsaw U. of Tech. ; CERN) ; Malard, P (BIAM, St Paul lez Durance) ; Malinowski, K (Inst. Plasma Phys., Warsaw) et al.
The work describes a novel approach to the design of a fast, multichannel measurement system for plasma diagnostics [A. Wojenski et al., Fusion Eng. [...]
2021 - Published in : Rev. Sci. Instrum. 92 (2021) 054704
3.
First exploitation results of recently developed SXR GEM-based diagnostics at the WEST project / WEST Collaboration
This contribution outlines the first preliminary acquisition data obtained by the GEM diagnostics on WEST. It was designed to monitor the radiation of impurities with a particular focus on the challenges of the elaborated plasma imaging technology in the area of SXR radiation. [...]
2020 - 8 p. - Published in : Nucl. Mater. Energy 25 (2020) 100850 Fulltext: PDF;

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