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1.
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Enhancement of System Observability During System-Level Radiation Testing Through Total Current Consumption Monitoring
/ Slipukhin, Ivan (CERN) ; Coronetti, Andrea (CERN) ; Alía, Rubén García (CERN) ; Saigné, Frédéric (IES, Montpellier) ; Boch, Jérôme (IES, Montpellier) ; Dilillo, Luigi (IES, Montpellier) ; Aguiar, Ygor Q (CERN) ; Cazzaniga, Carlo ; Kastriotou, Maria ; Dodd, Torran
System-level testing of electronics is an affordable method of assessment of the performance of complete electronic systems designed for applications in the radiation environment. Compared to component-level testing, system-level test offers a much smaller degree of observability about the performance of particular system elements. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1948-1955
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2.
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Characterization of Fragmented Ultrahigh-Energy Heavy Ion Beam and Its Effects on Electronics Single-Event Effect Testing
/ Barbero, Mario Sacristán (CERN ; IES, Montpellier) ; Slipukhin, Ivan (CERN ; IES, Montpellier) ; Cecchetto, Matteo (CERN) ; Prelipcean, Daniel (CERN) ; Aguiar, Ygor (CERN) ; Bilko, Kacper (CERN) ; Emriskova, Natalia (CERN) ; Waets, Andreas (CERN) ; Coronetti, Andrea (CERN) ; Kastriotou, Maria (Rutherford Appleton Laboratory) et al.
Ultrahigh-energy (UHE) (>5 GeV/n) heavy ion beams exhibit different properties when compared to standard and high-energy ion beams. Most notably, fragmentation is a fundamental feature of the beam that may have important implications for electronics testing given the ultrahigh energies and, hence, ranges, preserved by the fragments. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1557-1564
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3.
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4.
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An Analysis of the Significance of the 14N(n, p) 14C Reaction for Single-Event Upsets Induced by Thermal Neutrons in SRAMs
/ Coronetti, Andrea (CERN ; Montpellier U.) ; García Alía, Rubén (CERN) ; Lucsanyi, David (CERN) ; Letiche, Manon (Laue-Langevin Inst.) ; Kastriotou, Maria ; Cazzaniga, Carlo ; Frost, Christopher D ; Saigné, Frédéric (Montpellier U.)
The thermal neutron threat to the reliability of electronic devices caused by $^{10}\text{B}$ capture is a recognized issue that prompted changes in the manufacturing process of electronic devices with the aim of limiting as much as possible the presence of this isotope nearby device sensitive volumes (SVs). $^{14}\text{N}$ can also capture thermal neutrons and release low-energy protons (LEPs; through the $^{14}\text{N}$ (n, p) $^{14}\text{C}$ reaction) that have high enough linear energy transfer (LET) to cause single-event upsets (SEUs). [...]
2023 - 9 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.1634-1642
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5.
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SEE Testing on commercial power MOSFETs
/ Fernández-Martínez, Pablo (CERN) ; Papadopoulou, Athina (CERN) ; Danzeca, Salvatore (CERN) ; Foucard, Gilles (CERN) ; Alía, Rubén García (CERN) ; Kastriotou, Maria (CERN ; Rutherford) ; Cazzaniga, Carlo (Rutherford) ; Tsiligiannis, Giorgos (CERN) ; Gaillard, Remi (Unlisted, FR)
This work compiles the outcome of several irradiation test campaigns, carried out with the aim of studying the susceptibility to hard Single Event Effects (SEE) of various commercial power MOSFET references. Proton, neutron and heavy ion irradiation were performed on the same set of MOSFET references, allowing for a comparison of their respective Single Event Burnout (SEB) and Single Event Gate Rupture (SEGR) sensitiveness under different energy and particle irradiation conditions..
2020 - 8 p.
- Published in : 10.1109/RADECS50773.2020.9857706
In : 20th European Conference on Radiation and its Effects on Components and Systems (RADECS 2020), Online, France, 19 - 23 Jun 2020
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6.
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7.
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Configuration Memory Scrubbing of SRAM-Based FPGAs Using a Mixed 2-D Coding Technique
/ Vlagkoulis, Vasileios (Piraeus, TEI) ; Sari, Aitzan (Piraeus, TEI) ; Antonopoulos, Georgios (Piraeus, TEI) ; Psarakis, Mihalis (Piraeus, TEI) ; Tavoularis, Antonios (ESTEC, Noordwijk) ; Furano, Gianluca (ESTEC, Noordwijk) ; Boatella-Polo, Cesar (ESTEC, Noordwijk) ; Poivey, Christian (ESTEC, Noordwijk) ; Ferlet-Cavrois, Véronique (ESTEC, Noordwijk) ; Kastriotou, Maria (CERN ; Rutherford) et al.
SRAM-based field-programmable gate array (FPGA) vendors typically integrate error correction codes (ECCs) into the configuration memory to assist designers in implementing scrubbing mechanisms. In most cases, these ECC schemes guarantee the correction of single- and double-bit errors per configuration frame but fail to correct upsets with higher multiplicity in a single frame caused by a single event. [...]
2022 - 12 p.
- Published in : IEEE Trans. Nucl. Sci. 69 (2022) 871-882
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8.
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Measurements of Low-Energy Protons Using a Silicon Detector for Application to SEE Testing
/ Cazzaniga, Carlo (Rutherford) ; Alía, Rubén García (CERN) ; Coronetti, Andrea (CERN ; Jyvaskyla U.) ; Bilko, Kacper (CERN) ; Morilla, Yolanda (CNA, Seville) ; Martin-Holgado, Pedro (CNA, Seville) ; Kastriotou, Maria (Rutherford) ; Frost, Christopher D (Rutherford)
A silicon detector with a fast electronics chain is used for the dosimetry of protons in the range 0.5–5 MeV at the Centro Nacional de Aceleradores (CNA) 3 MV Tandem laboratory in Seville, Spain. In this configuration, measurements can be performed in pulsed mode, using a digitizer to record event-by-event proton energy depositions. [...]
2021 - 6 p.
- Published in : IEEE Trans. Nucl. Sci. 69 (2021) 485-490
Fulltext: PDF;
In : 2021 IEEE Nuclear and Space Radiation Effects Conference, Online, 16 - 23 Jul 2021, pp.485-490
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9.
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Thermal-to-high-energy neutron SEU characterization of commercial SRAMs
/ Coronetti, Andrea (CERN ; Jyvaskyla U.) ; Garcia Alia, Ruben (CERN) ; Letiche, Manon (Laue-Langevin Inst.) ; Cazzaniga, Carlo (Unlisted, UK) ; Kastriotou, Maria (Unlisted, UK) ; Cecchetto, Matteo (CERN) ; Bilko, Kacper (CNA, Seville) ; Martin-Holgado, Pedro
Several commercial SRAMs have been tested by the CERN R2E project with neutrons of various energy. The test data are used to cross-compare facilities and to analyze variabilities within SRAMs from the same manufacturer. [...]
2021 - 5 p.
- Published in : 10.1109/nsrec45046.2021.9679344
Fulltext: PDF;
In : 2021 IEEE Radiation Effects Data Workshop (REDW 2021), Online, US, 17 - 23 Jul 2021
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10.
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Fast neutron measurements with solid state detectors at pulsed spallation sources
/ Cazzaniga, C (Rutherford) ; Rebai, M (IFP, Milan) ; García Alía, R (CERN) ; Fernandez-Martinez, P (CERN) ; Cecchetto, M (CERN) ; Kastriotou, M (Rutherford) ; Tardocchi, M (IFP, Milan) ; Frost, C D (Rutherford)
Fast neutron measurements have been performed with silicon and diamond detectors at nTOF, ChipIr, and CHARM facilities. The detectors have been used in pulse mode; the deposited energy and time stamp is measured event by event for each signal above threshold. [...]
2020 - 8 p.
- Published in : J. Neutron Res. 22 (2020) 345-352
In : 23rd meeting of the International Collaboration on Advanced Neutron Sources, Chattanooga, TN, United States, 13 - 18 Oct 2019, pp.345-352
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