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Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models / Bañón-Caballero, David (CERN) ; Socuellamos, Juan M (Lancaster U. (main)) ; Mata, Rafael (Val Space Consortium, Valencia) ; Mercadé, Laura (U. Valencia (main)) ; Gimeno, Benito (U. Valencia (main)) ; Boria, Vicente E (Valencia, Polytechnic U.) ; Raboso, David (ESTEC, Noordwijk) ; Semenov, Vladimir E (Nizhnii Novgorod, IAP) ; Rakova, Elena I (Nizhnii Novgorod, IAP) ; Sanchez-Royo, Juan F (U. Valencia (main)) et al.
Secondary electron emission has an important role on the triggering of the multipactor effect; therefore, its study and characterization are essential in radio-frequency waveguide applications. In this paper, we propose a theoretical model, based on equivalent circuit models, to properly understand charging and discharging processes that occur in dielectric samples under electron irradiation for secondary electron emission characterization. [...]
2018 - 9 p. - Published in : IEEE Trans. Plasma Sci. 46 (2018) 859-867

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