CERN Accelerating science

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1.
On $V_{ce}$ Method: In Situ Temperature Estimation and Aging Detection of High-Current IGBT Modules Used in Magnet Power Supplies for Particle Accelerators / Asimakopoulos, Panagiotis (CERN ; Chalmers U. Tech.) ; Papastergiou, Konstantinos (CERN) ; Thiringer, Torbjorn (Chalmers U. Tech.) ; Bongiorno, Massimo (Chalmers U. Tech.) ; Le Godec, Gilles (CERN)
Magnet power supplies used in particle accelerators are a specialized application of power electronics that require long lifetime operation with no unscheduled interruptions and high output current precision. In this paper, the $V_{ce}$ method with sensing current is considered for the estimation of the junction temperature and the aging detection of high-current insulated gate bipolar transistor (IGBT) modules used in this specialized application. [...]
2019 - 10 p. - Published in : IEEE Transactions on Industrial Electronics 66 (2019) 551-560
2.
IGBT Power Stack Integrity Assessment Method for High-Power Magnet Supplies / Asimakopoulos, Panagiotis (CERN) ; Papastergiou, Konstantinos (CERN) ; Thiringer, Torbjorn (Chalmers U. Tech.) ; Bongiorno, Massimo (Chalmers U. Tech.) ; Le Godec, Gilles (CERN)
This paper proposes a method for assessing the integrity of a series of insulated-gate bipolar transistor (IGBT) power stacks during factory-acceptance tests and service stops. The key challenge that is addressed in this paper is detecting common assembly issues that affect the power stack thermal path as well as distinguishing the acute aging effects of bond-wire lift-off and solder delamination. [...]
2019 - 13 p. - Published in : IEEE Trans. Power Electron. 34 (2019) 11228-11240 Fulltext: PDF;
3.
Thermal stressing mitigation possibility intended for a DC-current magnet supply based on high power IGBT modules / Asimakopoulos, P (Chalmers U. Tech. ; CERN) ; Papastergiou, K D (CERN) ; Thiringer, T (Chalmers U. Tech.) ; Bongiorno, M (Chalmers U. Tech.)
This work investigates the possibility to reduce the thermal stressing of high power IGBT modules in a DC-current application. Using four load current profiles as examples, two mitigation strategies are presented and their benefit to the power stack in terms of lifetime prolongation is evaluated. [...]
2017 - 9 p. - Published in : 10.23919/EPE17ECCEEurope.2017.8099201
In : 19th European Conference on Power Electronics and Applications, Warsaw, Poland, 11 - 14 Sep 2017, pp.8099201
4.
Current Sharing inside a High Power IGBT Module at the Negative Temperature Coefficient Operating Region / Asimakopoulos, Panagiotis (Chalmers University of Technology (SE)) ; Papastergiou, Konstantinos (CERN) ; Bongiorno, M (Chalmers University of Technology) ; Thiringer, T (Chalmers University of Technology)
This work investigates the current sharing effect of a high power Soft Punch Through IGBT module in the Negative Temperature Coefficient region. The unbalanced current sharing between two of the substrates is demonstrated for different current and temperature levels and its impact on the thermal stressing of the device is evaluated. [...]
CERN-ACC-2016-0326.- Geneva : CERN, 2016 - 10 p. Fulltext: PDF;
In : 18th European Conference on Power Electronics and Applications, Karlsruhe, Germany, 5 - 9 Sep 2016
5.
Heat sink design considerations in medium power electronic applications with long power cycles / Asimakopoulos, Panagiotis (CERN) ; Papastergiou, Konstantinos (CERN) ; Thiringer, Torbjörn (Chalmers U. Tech.) ; Bongiorno, Massimo (Chalmers U. Tech.)
The aim of this work is to investigate the impact of the heat sink thickness and material, as well as, of the convection coefficient of the water cooling system on the power-electronics module thermal stressing. The heat extraction capability of different thicknesses is tested. [...]
CERN-ACC-2015-0101.- Geneva : CERN, 2015 - 9 p. Fulltext: PDF;
In : 17th European Conference on Power Electronics and Applications, Geneva, Switzerland, 8-10 Sep 2015, pp.7309150

Vegeu també: autors amb noms similars
3 Thiringer, Torbjorn
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