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Energy Deposition and Characterization of Single-Event Upset and Latch-Up Cross Sections With 14 MeV and Thermal Neutrons
/ Cecchetto, Matteo (CERN) ; Alía, Rubén García (CERN) ; Lerner, Giuseppe (CERN) ; Bilko, Kacper (CERN) ; Pujol, Francesc Salvat (CERN) ; Vlachoudis, Vasilis (CERN) ; Cerutti, Francesco (CERN)
Single-event latch-up (SEL) cross sections of static random access memory (SRAM) at high energy (100–200 MeV)
are generally not reproducible with 14-MeV neutrons, differently to single-event upset (SEU) cross sections. We explain
this phenomenon through Monte Carlo simulations, analyzing neutron–silicon interactions and the indirect energy deposition
in sensitive volumes (SVs) resembling the two mechanisms, showing that the former approach is not sufficient to explain
how the energy is deposited [...]
2025 - 10 p.
- Published in : IEEE Trans. Nucl. Sci. 72 (2025) 2847-2856
Fulltext: PDF; External link: Fulltext
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2.
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Beam delivery of high-energy ion beams for irradiation experiments at the CERN Proton Synchrotron
/ Johnson, Eliott (CERN) ; Waets, Andreas (CERN) ; Imesch, Gil (CERN) ; Bilko, Kacper (CERN) ; Delrieux, Marc (CERN) ; Fraser, Matthew (CERN) ; Emriskova, Natalia (CERN) ; Arrutia Sota, Pablo Andreas (CERN) ; Garcia Alia, Ruben (CERN) ; Bass, Thomas (CERN)
Heavy-ion single event effect (SEE) test facilities are critical in the development of microelectronic components that will be exposed to the ionizing particles present in the hostile environment of space. CHARM High-energy Ions for Micro Electronics Reliability Assurance (CHIMERA) and HEARTS have developed a high-energy ion beam capable of scanning a wide range of Linear Energy Transfer (LET) at low intensities to study ionization effects on space-bound technology using CERN's Proton Synchrotron (PS). [...]
2023 - 4 p.
- Published in : JACoW IPAC 2023 (2023) MOPA115
Fulltext: PDF;
In : 14th International Particle Accelerator Conference (IPAC 2023), Venice, Italy, 7 - 12 May 2023, pp.MOPA115
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3.
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SRAM-based heavy ion beam flux and LET dosimetry
/ Coronetti, Andrea (CERN ; IES, Montpellier) ; García-Alía, Rubén (CERN) ; Dilillo, Luigi (LIRMM, Montpellier) ; Imianosky, Carolina (IES, Montpellier) ; Dos Santos, Douglas Almeida (IES, Montpellier) ; Luza, Lucas Matana (LIRMM, Montpellier ; SENAI/CETIQT, Rio de Janeiro) ; Bosser, Alexandre (LIRMM, Montpellier ; Unlisted, FR) ; Bilko, Kacper (CERN) ; Waers, Andreas (CERN) ; Klimek, Karolina (CERN) et al.
This paper explores the possibility of enhancing the capability of static random access memories (SRAMs) as heavy ion beam detectors starting from the multiple-cell upsets (MCUs) measured in some well characterized beams. In particular, the two main enablers brought by the MCU analysis are (1) the determination of the beam flux even when the LET of the beam is not known [whenever the LET is > 10 MeV/(mg/cm2)] and (2) the estimation of the LET of the heavy ion beam without reliance on any other instrument [...]
2024 - 8 p.
- Published in : 10.1109/tns.2024.3487647
Fulltext: PDF;
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4.
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Characterization of Fully Fragmented High-Energy Heavy-Ion Beams for SEE Testing Through Measurements and Simulations
/ Waets, Andreas (CERN ; U. Zurich (main)) ; García Alía, Rubén (CERN) ; Bilko, Kacper (CERN) ; Emriskova, Natalia (CERN) ; Salvatore Esposito, Luigi (CERN) ; Schuy, Christoph (Darmstadt, GSI) ; Wagner, Tim (Darmstadt, GSI) ; Nieminen, Petteri (ESA) ; Schneider, Uwe (U. Zurich (main))
Fully fragmented, very-high-energy (VHE) heavy-ion beams offer interesting possibilities for radiation hardness assurance testing of electronic components exposed to the Galactic Cosmic Ray (GCR) space environment. In this article, we perform the dosimetry of these fully fragmented ion beams through a combination of silicon solid-state detector measurements and detailed Monte Carlo (MC) simulations in FLUKA focusing on the interaction between the beam and the device under test. [...]
2025 - 7 p.
- Published in : IEEE Trans. Nucl. Sci. 72 (2025) 1123-1129
Fulltext: PDF;
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5.
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The HEARTS EU Project and Its Initial Results on Fragmented High-Energy Heavy-Ion Single-Event Effects Testing
/ García Alía, Rubén (CERN) ; Waets, Andreas (CERN ; Zurich U.) ; Coronetti, Andrea (CERN ; IES, Montpellier) ; Bilko, Kacper (CERN ; Jean Monnet U.) ; Delrieux, Marc (CERN) ; Emriskova, Natalia (CERN) ; Esposito, Luigi (CERN) ; Fraser, Matthew (CERN) ; Johnson, Eliott (CERN) ; Klimek, Karolina (CERN) et al.
We perform single-event effect (SEE) tests with well-characterized fully fragmented (i.e., beyond Bragg peak) high-energy heavy-ion beams and compare the results with those expected from conventional, mono-linear energy transfer (mono-LET) measurements, showing a satisfactory level of agreement between the two. This compliance paves the way for the exploitation of simulation tools for accurately quantifying the ion fragmentation impact on SEE rates for both ground-level testing conditions and space galactic cosmic-ray (GCR) environments, with electronics operating behind significant thicknesses of shielding. [...]
2025 - 10 p.
- Published in : IEEE Trans. Nucl. Sci. 72 (2025) 1040-1049
Fulltext: PDF;
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6.
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10.5281/zenodo.11032252
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7.
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Results of Single Event Effect Testing at the New HEARTS@CERN High-Energy Heavy Ion Facility at CERN
/ Coronetti, Andrea (CERN ; Montpellier U.) ; Barbero, Mario Sacristan (CERN ; Montpellier U.) ; Bilko, Kacper (CERN) ; Emriskova, Natalia (CERN) ; Johnson, Eliott (CERN) ; Klimek, Karolina Maria (CERN) ; Waets, Andreas (CERN) ; Alia, Ruben Garcia (CERN)
We present results for SEU, SEL and SEB testing of several electronic devices under high-energy heavy ion irradiation at the new HEARTS@CERN facility at CERN..
2024 - 9 p.
- Published in : 10.1109/REDW61286.2024.10759246
In : 2024 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2024 NSREC), Ottawa, ON, Canada, 22 - 27 Jul 2024
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8.
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CHARM High-Energy Ions for Microelectronics Reliability Assurance (CHIMERA)
/ Bilko, Kacper (CERN ; Lab. Hubert Curien, St. Etienne) ; García Alía, Rubén (CERN) ; Costantino, Alessandra (ESTEC, Noordwijk) ; Coronetti, Andrea (CERN) ; Danzeca, Salvatore (CERN) ; Delrieux, Marc (CERN) ; Emriskova, Natalia (CERN) ; Fraser, Matthew Alexander (CERN) ; Girard, Sylvain (Lab. Hubert Curien, St. Etienne ; IUF, Paris) ; Johnson, Eliott Philippe (CERN) et al.
We present the progress related to CERN’s capacity of delivering highly penetrating, high-linear energy transfer (LET) heavy ions for radiation effect testing of electronic components within the CHARM High-energy Ions for Micro Electronics Reliability Assurance (CHIMERA) project. Profiting from the existing accelerator infrastructure, Monte Carlo simulations, and a 300- $\mu $ m-thick silicon diode, we highlight the beam characterization capabilities and a summary of the beam properties. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1549-1556
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9.
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Very-High-Energy Heavy Ion Beam Dosimetry Using Solid State Detectors for Electronics Testing
/ Waets, Andreas (CERN ; Zurich U.) ; Bilko, Kacper (CERN) ; Coronetti, Andrea (CERN) ; Emriskova, Natalia (CERN) ; Sacristan Barbero, Mario (CERN) ; García Alía, Rubén (CERN) ; Durante, Marco (Darmstadt, GSI) ; Schuy, Christoph (Darmstadt, GSI) ; Wagner, Tim (Darmstadt, GSI) ; Esposito, Luigi Salvatore (CERN) et al.
Very-high-energy (VHE), heavy ions are of particular interest for single event effects (SEEs) testing due to their combination of high linear energy transfer (LET) and high penetration within electronics components. The dosimetry of such beams poses an important challenge for facilities aiming to provide VHE ions for radiation effects testing. [...]
2024 - 9 p.
- Published in : IEEE Trans. Nucl. Sci. 71 (2024) 1837-1845
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1837-1845
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10.
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Characterization of Fragmented Ultrahigh-Energy Heavy Ion Beam and Its Effects on Electronics Single-Event Effect Testing
/ Barbero, Mario Sacristán (CERN ; IES, Montpellier) ; Slipukhin, Ivan (CERN ; IES, Montpellier) ; Cecchetto, Matteo (CERN) ; Prelipcean, Daniel (CERN) ; Aguiar, Ygor (CERN) ; Bilko, Kacper (CERN) ; Emriskova, Natalia (CERN) ; Waets, Andreas (CERN) ; Coronetti, Andrea (CERN) ; Kastriotou, Maria (Rutherford Appleton Laboratory) et al.
Ultrahigh-energy (UHE) (>5 GeV/n) heavy ion beams exhibit different properties when compared to standard and high-energy ion beams. Most notably, fragmentation is a fundamental feature of the beam that may have important implications for electronics testing given the ultrahigh energies and, hence, ranges, preserved by the fragments. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1557-1564
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