Hlavná stránka > Design Study on 0.3-nm PAL-XFEL |
Article | |
Title | Design Study on 0.3-nm PAL-XFEL |
Author(s) | Oh, Jong Seok |
Affiliation | (PAL, Pohang DESY, HamburgPOSTECH, Pohang, Kyungbuk) |
Publication | 2004 |
In: | 26th International Free Electron Laser Conference and 11th FEL User Workshop 2004, Trieste, Italy, 29 Aug - 3 Sep 2004, pp.e-proc. MOPOS36 |
Subject category | Accelerators and Storage Rings |
Abstract | PAL is operating a 2.5-GeV electron linac as a full-energy injector to the PLS storage ring. The PAL linac can be converted to a SASE-XFEL facility (PAL-XFEL) that supplies coherent X-rays down to 0.3-nm wavelength. It requires a 3-GeV driver linac and a 60-m long in-vacuum undulator with a 3-mm gap and a 12.5-mm period to realize a hard X-ray SASE-FEL. The linac should supply highly bright beams with emittance of 1.5 mm-mrad, a peak current of 4 kA, and a low energy spread of 0.02%. FEL performance is very sensitive to electron beam parameters. The beam quality is degraded along the undulator trajectory due to the energy loss and the wake field. Also the FEL gain is reduced by errors in the undulator fields and beam trajectories. The preliminary design details for the 0.3-nm PAL-XFEL are presented with parametric analysis. |