| Hlavná stránka > XRD analysis on ZnO and Au film crystal orientation in ZnO/Au/SiO2 structure |
| Article | |
| Title | XRD analysis on ZnO and Au film crystal orientation in ZnO/Au/SiO2 structure |
| Author(s) | Qin, H ; Chen, Y ; Yu, H |
| Publication | 2000 |
| In: | International Conference on Sensors and Control Techniques, Wuhan, China, 19 - 21 Jun 2000, pp.561-564 |