| Página principal > Conference on Optical Metrology : Optical Measurement Systems for Industrial Inspection III |
| Conference | |
| Conference title | Conference on Optical Metrology : Optical Measurement Systems for Industrial Inspection III |
| Related conference title(s) | Optical Metrology 2003 |
| Date(s), location | 23 - 26 Jun 2003, Munich, Germany |
| Imprint | 2003 |
| Series | (Proceedings of SPIE ; 5144) |
| Subject category | Other Fields of Physics |
Contributions to this conference in CDS
| Calibration and production of praxial sensors for the ATLAS muon spectrometer (p. 360) |
| by Schune, P |