CERN Accelerating science

Baudot, J (Strasbourg, IReS ) ; Coffin, J P (Strasbourg, IReS ) ; Guillaume, G (Strasbourg, IReS ) ; Higueret, S (Strasbourg, IReS ) ; Fintz, P (Strasbourg, IReS ) ; Jundt, F (Strasbourg, IReS ) ; Kuhn, C (Strasbourg, IReS ) ; Lutz, Jean Robert (Strasbourg, IReS ) ; Pagès, P (Strasbourg, IReS ) ; Pozdniakov, S (Strasbourg, IReS ) ; Rami, F (Strasbourg, IReS ) ; Bouvier, S (SUBATECH, Nantes) ; Erazmus, B (SUBATECH, Nantes) ; Giliberto, S (SUBATECH, Nantes) ; Martin, L (SUBATECH, Nantes) ; Le Moal, C (SUBATECH, Nantes) ; Roy, C (SUBATECH, Nantes) ; Colledani, C (Strasbourg, IPHC) ; Dulinski, W (Strasbourg, IPHC) ; Turchetta, R (Strasbourg, IPHC) ; Arnold, L (Strasbourg, IReS )

List of Figures

• Figure 1:The detector telescope used in the pion beam tests.
• Figure 2:Distribution of the cluster pulseheights measured on the p-side versus the ones on the n-side for the same transversing particles.
• Figure 3:Noise distributions for clusteres of (a)p-side and (b)n-side of the tested double-side silicon strip detector.
• Figure 4:Distribution of deviations of the pulseheight values from the line.
• Figure 5:Residual distribution of the reference detector 4X.
• Figure 6:Cluster pulseheight of p-side of the tested DS silicon strip detector for tracks with normal incidence.
• Figure 7:Correlation between the mean cluster pulseheight (points and squares) and the track length in the silicon which is proportional to 1/cosØ.
• Figure 8:Residual distributions of p-side of the tested DS silicon strip detector for (a)normal (0°) and (b)45° inclined tracks.
• Figure 9:Simulated distribution of a 3 GeV pion beam divergence in the used test setup.