主页 > Etude des transistors MOS avancés sur Silicium sur isolant (SOI) |
Thesis | |
Title | Etude des transistors MOS avancés sur Silicium sur isolant (SOI) : bruit, dégradation et environnement radiatif et applications |
Translation of title | Study of advanced MOS transistors on silicon on insulator (SOI) : noise, degradation and radiative environment and applications |
Author(s) | Faccio, F (Joseph Fourier U., ENSEIG/INPG) |
Publication | Geneva : CERN, 1997 - 169. |
Thesis note | PhD : Grenoble, INP : 1997 |
Thesis supervisor(s) | Cristoloveanu, Sorin ; Anghinolfi, Francis |
Note | Presented on 5 Nov 1997 |
Subject category | Detectors and Experimental Techniques |
Accelerator/Facility, Experiment | RD-9 |