| 主页 > The Use of High-Energy X-Ray Generators for TID Testing of Electronic Devices |
| Article | |
| Title | The Use of High-Energy X-Ray Generators for TID Testing of Electronic Devices |
| Author(s) | Girones, Vincent (CNRS, France ; Montpellier U.) ; Boch, Jérôme (CNRS, France ; Montpellier U.) ; Carapelle, Alain ; Chapon, Arnaud ; Maraine, Tadec (CNRS, France ; Montpellier U.) ; Labau, Timothee (CNRS, France ; Montpellier U.) ; Saigné, Frédéric (CNRS, France ; Montpellier U.) ; García Alía, Rubén (CERN) |
| Publication | 2023 |
| Number of pages | 8 |
| In: | IEEE Trans. Nucl. Sci. 70, 8 (2023) pp.1982-1989 |
| In: | Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1982-1989 |
| DOI | 10.1109/TNS.2023.3279626 |
| Subject category | Detectors and Experimental Techniques |
| Abstract | A high-energy X-ray generator is studied in order to perform dose tests on electronic components. The main idea is to reduce the photoelectric effect in order to get closer to the Compton scattering. For this, the spectrum of the X-ray generator is filtered in order to cut out the low-energy photons. Experimental results and simulations show that it is possible to filter the spectrum. From this result, the filtered X-ray generator is used to study the dose response of the electronic components, and the obtained data are compared to the cobalt 60 (60-Co) irradiation. The obtained results are analyzed and discussed. This work provides a first demonstration of the use of a filtered high-energy X-Ray generator for TID testing. |
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