მთავარი > Minimization of the Long Term Noises of the 24-Bit ADC for the Precision Laser Inclinometer |
Article | |
Title | Minimization of the Long Term Noises of the 24-Bit ADC for the Precision Laser Inclinometer |
Author(s) | Azaryan, N (Dubna, JINR) ; Budagov, J (Dubna, JINR) ; Vernikovskya, V (Dubna, JINR ; Gomel State Tech. U.) ; Lyablin, M (Dubna, JINR) ; Pluzhnikov, A (Dubna, JINR) ; Smykovsky, O (Dubna, JINR ; Gomel State Tech. U.) ; Di Girolamo, B (CERN) ; Gayde, J Ch (CERN) ; Mergelkuhl, D (CERN) |
Publication | 2021 |
Number of pages | 13 |
In: | Phys. Part. Nucl. Lett. 18 (2021) 773-785 |
DOI | 10.1134/S1547477121070141 |
Subject category | Detectors and Experimental Techniques |
Abstract | The daylong noises of the 24 bits ADC DT9824 and DT9828 in the laboratory room conditions and in the thermo-stabilized and radio isolated laboratory and the noises dependence on the single measurement duration have been researched. Significantly, by factor 240× the ADC resolution in the temperature stabilized and radio isolated conditions was improved. The ADC’s relative resolutions have been measured for a daylong period: 3 × 10$^{–7}$ for DT9824 with 0.79 s for one measurement duration and 2 × 10$^{–7}$ for DT9828 with one measurement duration of 0.10 s. The innovative methodic for accounting of the ADC noise temperature variations was proposed and developed based on subtracting of one ADC channel data from remaining ones. This methodic application resulted in the improvement of the RMS values of an ADC relative resolution: by factor 13× for DT9824 and by factor 6× for DT9828. |
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