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Title The lpGBT production testing system
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Author(s) Guettouche, Nour El Houda (speaker) (Centre National de la Recherche Scientifique (FR))
Corporate author(s) CERN. Geneva
Imprint 2021-09-24. - 1278.
Series (Conferences)
(TWEPP 2021 Topical Workshop on Electronics for Particle Physics)
Lecture note on 2021-09-24T16:20:00
Subject category Conferences
Abstract The Low-Power Gigabit Transceiver (lpGBT) is a radiation-tolerant ASIC designed to implement multipurpose high-speed bidirectional serial links in HEP experiments. Having more than 320 programmable registers, the ASIC is highly configurable. Its test must cover a large variety of functionalities which will be validated at three different power-supply voltages, two temperatures and over more than 1000 parameters. As more than 175 000 chips will be produced, optimizing the test duration is also a strong requirement. In this talk, an overview of the lpGBT v1 production test system will be given, challenges will be presented, and performance will be discussed.
Copyright/License © 2021-2024 CERN
Submitted by [email protected]

 


 Registre creat el 2021-10-01, darrera modificació el 2024-06-26


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