Home > A concept for spatially and time correlated single event effect detection in semiconductors using Timepix type pixel detectors |
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Title | A concept for spatially and time correlated single event effect detection in semiconductors using Timepix type pixel detectors |
Author(s) | Broulim, J (Pilsen U. ; Prague, Tech. U.) ; Broulim, P (Pilsen U.) ; Campbell, M (CERN) ; Georgiev, V (Pilsen U.) ; Holik, M (Pilsen U. ; Prague, Tech. U.) ; Kunstmuller, P (Pilsen U.) ; Pavlicek, V (Pilsen U.) ; Pospisil, S (Prague, Tech. U.) ; Vavroch, O (Pilsen U.) ; Vlasek, J (Dubna, JINR) ; Zich, J (Pilsen U.) |
Publication | 2020 |
Number of pages | 4 |
In: | Nucl. Instrum. Methods Phys. Res., A 980 (2020) 164397 |
In: | 12th international "Hiroshima" Symposium on the Development and Application of Semiconductor Tracking Detectors (HSTD), Hiroshima, Japan, 14 - 18 Dec 2019, pp.164397 |
DOI | 10.1016/j.nima.2020.164397 |
Subject category | Detectors and Experimental Techniques |
Abstract | Single Event Effects (SEE), caused generally by single energetic particles, pose an important issue when implementing electronics in a harsh radiation environment. In this work, we present an electronic system for measuring SEEs temporally and spatially correlated with Timepix3 detectors. The Timepix detector is a semiconductor pixel detector, which contains 256 x 256 pixels. It provides energy or time information for each hit pixel. Our experimental setup consists of FPGA based board synchronized Timepix readout and a Device Under Test (DUT). |
Copyright/License | © 2020 Published by Elsevier B.V. |