| Article | |
| Report number | arXiv:1909.08392 |
| Title | Measurement of the relative response of small-electrode CMOS sensors at Diamond Light Source |
| Related title | Measurement of the relative response of small-electrode CMOS sensors at Diamond Light Source |
| Author(s) | Mironova, Maria (Oxford U.) ; Metodiev, Kaloyan (Oxford U.) ; Allport, Phil (Birmingham U.) ; Berdalovic, Ivan (CERN ; Zagreb U.) ; Bortoletto, Daniela (Oxford U.) ; Buttar, Craig (Glasgow U.) ; Cardella, Roberto (CERN ; Oslo U.) ; Dao, Valerio (CERN) ; Dyndal, Mateusz (CERN) ; Freeman, Patrick (Birmingham U.) ; de Acedo, Leyre Flores Sanz (CERN ; Glasgow U.) ; Gonella, Laura (Birmingham U.) ; Kugathasan, Thanushan (CERN) ; Pernegger, Heinz (CERN) ; Piro, Francesco (CERN) ; Plackett, Richard (Oxford U.) ; Riedler, Petra (CERN) ; Sharma, Abhishek (Oxford U. ; CERN) ; Schioppa, Enrico, Junior. (Oxford U.) ; Shipsey, Ian (Oxford U.) ; Solans Sanchez, Carlos (CERN) ; Snoeys, Walter (CERN) ; Wennloef, Hakan (Birmingham U.) ; Weatherill, Daniel (Oxford U.) ; Wood, Daniel (Oxford U.) ; Worm, Steven (Birmingham U.) |
| Publication | 2020-03-11 |
| Imprint | 2019-09-18 |
| Number of pages | 13 p, 13 |
| In: | Nucl. Instrum. Methods Phys. Res., A 956 (2020) 163381 |
| DOI | 10.1016/j.nima.2019.163381 |
| Subject category | Particle Physics - Experiment |
| Abstract | This paper outlines the results of investigations into the effects of radiation damage in the mini-MALTA prototype. Measurements were carried out at Diamond Light Source using a micro-focus X-ray beam, which scanned across the surface of the device in 2 $\mathrm{\mu m}$ steps. This allowed the in-pixel photon response to be measured directly with high statistics. Three pixel design variations were considered: one with the standard continuous $\mathrm{n^-}$ layer layout and front-end, and extra deep p-well and $\mathrm{n^-}$ gap designs with a modified front-end. Five chips were measured: one unirradiated, one neutron irradiated, and three proton irradiated. |
| Copyright/License | preprint: (License: arXiv nonexclusive-distrib 1.0) Elsevier B.V. |
Corresponding record in: Inspire ; Inspire
Record created 2020-01-18, last modified 2024-09-21
