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Published Articles
Title Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation
Author(s) Glorieux, Maximilien (Unlisted) ; Evans, Adrian (Unlisted) ; Lange, Thomas (Unlisted) ; In, A-Duong (Unlisted) ; Alexandrescu, Dan (Unlisted) ; Boatella-Polo, Cesar (ESTEC, Noordwijk) ; Garcia Alía, Rubén (CERN) ; Tali, Maris (CERN) ; Urbina Ortega, Carlos (ESTEC, Noordwijk) ; Kastriotou, Maria (CERN) 显示全部 12 名作者
Publication 2018
Number of pages 5
In: 2018 IEEE Radiation Effects Data Workshop, Waikoloa Village, HI, USA, 16 - 20 Jul 2018, pp.8584296
DOI 10.1109/NSREC.2018.8584296
Abstract Heavy-Ion irradiation of a Xilinx Ultrascale+ MPSOC was performed to measure Single-Event-Latch-up and Single-Event-Upset Cross-Sections. Additionally, irradiation with a ultra high energy xenon beam shows similar upset sensitivity.
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Publication: © 2018-2025 IEEE

Corresponding record in: Inspire


 记录创建於2019-08-23,最後更新在2021-03-26



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