Title
| Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation |
Author(s)
|
Glorieux, Maximilien (Unlisted) ; Evans, Adrian (Unlisted) ; Lange, Thomas (Unlisted) ; In, A-Duong (Unlisted) ; Alexandrescu, Dan (Unlisted) ; Boatella-Polo, Cesar (ESTEC, Noordwijk) ; Garcia Alía, Rubén (CERN) ; Tali, Maris (CERN) ; Urbina Ortega, Carlos (ESTEC, Noordwijk) ; Kastriotou, Maria (CERN) ; Fernández-Martínez, Pablo (CERN) ; Ferlet-Cavrois, Véronique (ESTEC, Noordwijk) 显示全部 12 名作者 |
Publication
| 2018 |
Number of pages
| 5 |
In:
| 2018 IEEE Radiation Effects Data Workshop, Waikoloa Village, HI, USA, 16 - 20 Jul 2018, pp.8584296 |
DOI
| 10.1109/NSREC.2018.8584296
|
Abstract
| Heavy-Ion irradiation of a Xilinx Ultrascale+ MPSOC was performed to measure Single-Event-Latch-up and Single-Event-Upset Cross-Sections. Additionally, irradiation with a ultra high energy xenon beam shows similar upset sensitivity. |
Copyright/License
| Publication: © 2018-2025 IEEE |